IP Library Granted Patent US 8,901,681
Granted Patent B1
US 8,901,681 · App. 13/796,262 · Granted Dec 2, 2014

Method and apparatus for attachment of MEMS devices

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Quick Facts
Patent No.
US 8,901,681
App. No.
13/796,262
Granted
Dec 2, 2014
Kind
B1
Abstract

A pedestal projection having reduced cross-sectional area secures a MEMs device to a housing surface in a manner which reduces strain on the MEMS die due to differences in coefficients of thermal expansion while more evenly distributing to the MEMS sensor any external forces mechanically coupled through the housing structure. The pedestal projection may be integrally formed with a surface on either MEMS die or housing member and is axially aligned with the structure which anchors the MEMS sensor to the MEMS die.

Claims (45)

1. A microelectromechanical (MEMS) device comprising:

a MEMS die member having a handle layer with a first surface area;

a pedestal projection extending outward from the handle layer and defining an attachment end having a second surface area;

a sensor positioned symmetrically relative to an end of the anchor; and

wherein a mutually exclusive ratio of the first surface area to the second surface area is greater than 3 to 1.

2. The MEMS device of claim 1 further comprising:

a plurality of channels defined within the handle layer and at least partially separating the pedestal projection from other portions of the handle layer.

3. A microelectromechanical (MEMS) device comprising:

a MEMS die member having a handle layer surface;

a housing member having a base surface;

a pedestal projection disposed intermediate the handle layer surface and base surface and having an attachment end;

a bonding agent disposed at the attachment end of the pedestal projection;

a sensor positioned symmetrically relative to an end of the anchor; and

wherein the MEMS die member is attached to housing member only at the attachment end of the pedestal projection and wherein a ratio of surface area of the handle layer surface to surface area of the attachment end is greater than 2 to 1.

4. The MEMS device of claim 3 wherein the pedestal projection is integrally formed with the MEMS the member and extends outward from the handle layer surface.

5. The MEMS device of claim 3 wherein the pedestal projection is integrally formed with the housing member and extends outward from the base surface.

6. A microelectromechanical (MEMS) device comprising:

a MEMS die member defining an anchor extending along an axis;

a sensor positioned symmetrically relative to an end of the anchor;

a pedestal projection extending along the axis and disposed intermediate the sensor and a housing surface; and

wherein forces transmitted between the housing surface and the sensor are transmitted through the pedestal projection and anchor along the axis.

7. The MEMS device of claim 6 further comprising an adhesive securing the MEMS die member to the housing surface.

8. The MEMS device of claim 6 wherein the pedestal projection is integrally formed with the MEMS die member.

9. The MEMS device of claim 6 wherein the pedestal projection is integrally formed with the housing surface.

10. The MEMS device of claim 6 further comprising:

a plurality of secondary projections integrally formed with and extending outward from the MEMS the member.

11. The MEMS device of claim 6 further comprising:

a plurality of channels defined within the handle layer at least partially separating the pedestal projection from other portions of the handle layer.

12. The MEMS device of claim 6 further comprising:

a sensor symmetrically disposed relative to the axis.

13. The MEMS device of claim 12 wherein the sensor extends in a plane perpendicular to the axis.

14. The MEMS device of claim 6 in combination with a bonding agent disposed adjacent an end of the pedestal projection and the housing surface.

15. The MEMS device of claim 1 in combination with a bonding agent disposed adjacent the attachment end of the pedestal projection.

16. The MEMS device of claim 1 wherein the MEMS die member is attached to the housing surface only by the pedestal projection.

17. A method of manufacturing a microelectromechanical (MEMS) device comprising:

A) providing a MEMS the member having a handle layer surface; and

B) removing a portion of the MEMS the member proximate the handle layer surface to define a pedestal projection integrally formed therewith and extending outward from the handle layer surface, the pedestal projection having an attachment surface disposed at an end thereof, a sensor positioned symmetrically relative to the pedestal projection; and

wherein a ratio of surface area of the handle layer surface to surface area of the attachment surface is greater than 3 to 1.

18. The method of claim 17 further comprising:

C) removing a portion of the MEMS the member proximate the handle layer surface to define a plurality of secondary projections integrally formed therewith and extending outward from the handle layer surface;

wherein the plurality of secondary projections are at least partially separated from the pedestal projection along the handle layer surface.

19. The method of claim 17 further comprising:

C) securing the MEMS the member to the housing surface only at the attachment surface of the pedestal projection.

20. The method of claim 19 wherein C) comprises:

C1) disposing a bonding agent intermediate the housing surface and the attachment surface of the pedestal projection.

Assignments (2)
ASSIGNMENT OF ASSIGNOR'S INTEREST Recorded Dec 14, 2016
From: QUALTRE, INC.
To: PANASONIC CORPORATION
Reel/Frame 040728/0706 →
ASSIGNMENT OF ASSIGNOR'S INTEREST Recorded Mar 12, 2013
From: FOSTER, MICHAEL JOHN
To: QUALTRE, INC.
Reel/Frame 029974/0144 →