IP Library Patent Application 13797504
Patent Application
App. No. 13/797,504

Titanium nickel niobium alloy barrier for low-emissivity coatings

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Quick Facts
Patent No.
US None
App. No.
13/797,504
Abstract

A method for making low emissivity panels, including control the composition of a barrier layer formed on a thin conductive silver layer. The barrier structure can include a ternary alloy of titanium, nickel and niobium, which showed improvements in overall performance than those from binary barrier results. The percentage of titanium can be between 5 and 15 wt %. The percentage of nickel can be between 30 and 50 wt %. The percentage of niobium can be between 40 and 60 wt %.

Claims (45)

1 . A method to form a low emissivity coating, comprising providing a transparent substrate;

forming a first layer on the transparent substrate, wherein the first layer comprises silver, wherein the first layer is operable as an infrared reflective layer;

forming a second layer on the first layer, wherein the second layer is operable as a barrier layer,

wherein the second layer comprises titanium, nickel and niobium,

wherein the percentage of titanium is between 5 and 15 wt %,

wherein the percentage of nickel is between 30 and 50 wt %,

wherein the percentage of niobium is between 40 and 60 wt %.

2 . A method as in claim 1 wherein the thickness of the second layer is between 0.3 and 7 nm.

3 . A method as in claim 1 wherein the percentage of titanium is 10 wt %.

4 . A method as in claim 1 wherein the percentage of nickel is between 35 and 45 wt %.

5 . A method as in claim 1 wherein the percentage of niobium is between 45 and 55 wt %.

6 . A method as in claim 1 wherein the second layer further comprises oxygen.

7 . A method to form a low emissivity coating, comprising

providing a transparent substrate;

forming a metal oxide layer on the transparent substrate;

forming a first layer on the metal oxide layer,

wherein the first layer comprises silver, wherein the first layer is operable as an infrared reflective layer;

forming a second layer on the first layer,

wherein the second layer is operable as a barrier layer for the first layer,

wherein the second layer comprises titanium, nickel and niobium,

wherein the percentage of titanium is between 5 and 15 wt %,

wherein the percentage of nickel is between 30 and 50 wt %,

wherein the percentage of niobium is between 40 and 60 wt %.

8 . A method as in claim 7 wherein the thickness of the first layer is between 8 and 15 nm.

9 . A method as in claim 7 wherein the thickness of the second layer is between 0.3 and 7 nm.

10 . A method as in claim 7 wherein the percentage of titanium is 10 wt %, wherein the percentage of nickel is between 35 and 45 wt %, and wherein the percentage of niobium is between 45 and 55 wt %.

11 . A method as in claim 7 wherein the second layer is deposited as a metal alloy or an oxide alloy layer.

12 . A method as in claim 7 further comprising

oxidizing the second layer.

13 . A method as in claim 7 wherein the metal oxide layer comprises zinc oxide, doped zinc oxide, tin oxide, or doped tin oxide.

14 . A method as in claim 7 wherein the metal oxide layer comprises a seed layer, wherein the seed layer comprises a crystal orientation that promotes a (111) crystal orientation of the first layer.

15 . A low emissivity panel, comprising

a transparent substrate;

a metal oxide layer disposed on the transparent substrate;

a first layer disposed on the metal layer, wherein the first layer comprises silver, wherein the first layer is operable as an infrared reflective layer;

a second layer disposed on the first layer, wherein the second layer is operable as a barrier layer,

wherein the second layer comprises titanium, nickel and niobium,

wherein the percentage of titanium is between 5 and 15 wt %,

wherein the percentage of nickel is between 30 and 50 wt %,

wherein the percentage of niobium is between 40 and 60 wt %.

16 . A panel as in claim 15 wherein the thickness of the first layer is less than 15 nm.

17 . A panel as in claim 15 wherein the thickness of the second layer is between 0.3 and 7 nm.

18 . A method as in claim 15 wherein the percentage of titanium is 10 wt %, wherein the percentage of nickel is between 35 and 45 wt %, and wherein the percentage of niobium is between 45 and 55 wt %.

19 . A panel as in claim 15 wherein the metal oxide layer comprises zinc oxide, doped zinc oxide, tin oxide, or doped tin oxide.

20 . A panel as in claim 15 wherein the second layer further comprises oxygen.

Assignments (1)
ASSIGNMENT OF ASSIGNOR'S INTEREST Recorded Sep 29, 2017
From: GUARDIAN INDUSTRIES CORP.
To: GUARDIAN GLASS, LLC.
Reel/Frame 044053/0318 →