Dynamic control of radiation emission
View Patent ↗Among other things, one or more techniques and/or systems for selectively inhibiting radiation from being generated by a radiation source are provided. A radiation source comprises an electrically conductive gate situated between a cathode and an anode. When a voltage potential is created between the gate and the cathode, a flow of electrons between the cathode and the anode is mitigated, thus inhibiting radiation from being generated by the radiation source. When the voltage potential is removed or lessened, electrons may more freely flow between the cathode and the anode to generate radiation. In some embodiments, a calibration, such as a dark calibration, may be performed while the gate mitigates the flow of electrons. Moreover, in some embodiments, an accelerating voltage applied to the radiation source may be held substantially constant when radiation is generated as well as when radiation generation is inhibited.
1. A radiation system, comprising:
an x-ray radiation source comprising:
a cathode;
an anode, the radiation source configured to accelerate electrons between the cathode and the anode to generate radiation; and
an electrically conductive gate situated between the cathode and the anode, the electrically conductive gate configured to mitigate a flow of electrons between the cathode and the anode when a bias is applied to the electrically conductive gate, such that a gate voltage applied to the electrically conductive gate is different than a cathode voltage applied to the cathode, to inhibit the generation of radiation from the radiation source; and
a power source configured to gradually reduce a current supplied to the cathode,wherein the bias is applied to the electrically conductive gate responsive to the current supplied to the cathode being gradually reduced.
2. The radiation system of claim 1 , the bias comprising a negative bias.
3. The radiation system of claim 1 , comprising a second power source configured to apply the bias to the electrically conductive gate when an object is not being examined.
4. The radiation system of claim 3 , the second power source configured to not apply the bias to the electrically conductive gate when the object is being examined.
5. The radiation system of claim 3 , comprising a controller configured to identify when the object approaches an examination region of the radiation system to be examined.
6. The radiation system of claim 1 , comprising a second power source configured to maintain a substantially constant accelerating voltage while the bias is applied to the electrically conductive gate and while the bias is not applied to the electrically conductive gate.
7. The radiation system of claim 1 , comprising a calibration component configured to perform a first calibration on the radiation system while the bias is applied to the electrically conductive gate to acquire one or more offset measurements.
8. The radiation system of claim 7 , the calibration component configured to perform a second calibration on the radiation system while the bias is not applied to the electrically conductive gate to acquire one or more gain measurements.
9. The radiation system of claim 8 , comprising a controller configured to identify a window of time, between an examination of a first object and an examination of a second object, sufficient to perform at least one of the first calibration and the second calibration.
10. The radiation system of claim 1 , comprising a rotating gantry configured to rotate the radiation source about an axis of rotation.
11. The radiation system of claim 1 , the power source configured to gradually increase the current supplied to the cathode responsive to the bias being removed from the electrically conductive gate.
12. The radiation system of claim 1 , comprising a second power source configured to apply an accelerating voltage to the anode.
13. A method for inhibiting radiation from being generated between an examination of a first object and an examination of a second object, comprising:
identifying an instance where no objects are in an examination region of a radiation system;
applying a bias, during the instance, to an electrically conductive gate situated between a cathode and an anode of an x-ray radiation source of the radiation system to inhibit radiation from being generated by the radiation source; and
in preparation for examining the second object:
removing the bias applied to the electrically conductive gate; and
gradually increasing a current supplied to the cathode responsive to the bias being removed from the electrically conductive gate.
14. The method of claim 13 , comprising performing a calibration on the radiation system while the bias is applied to the electrically conductive gate to acquire one or more offset measurements.
15. The method of claim 13 , the applying comprising applying a gate voltage to the electrically conductive gate that is less than a cathode voltage applied to the cathode to yield a negative bias.
16. The method of claim 13 , comprising, prior to applying the bias, gradually reducing the current supplied to the cathode from a first current to a second current.
17. The method of claim 13 , the removing the bias applied to the electrically conductive gate comprising:
reducing the bias from a first voltage level to a second voltage level.