IP Library Patent Application 13808718
Patent Application
App. No. 13/808,718

PIEZOELECTRIC FILM ELEMENT AND PIEZOELECTRIC FILM DEVICE

Loading inventors, assignments & file history…
Monitor This Case
Get email alerts when status or documents change.
Order Certified Copies
Most orders are placed with the USPTO same day — all within 24 business hours.
Order via The Patent Place →
Pre-filled with this patent's details
Quick Facts
Patent No.
US None
App. No.
13/808,718
Abstract

To provide a piezoelectric film element, including: a substrate; and a piezoelectric film having an alkali niobium oxide-based perovskite structure represented by a composition formula (K 1-x Na x ) y NbO 3 (0<x<1) provided on the substrate, wherein the alkali niobium oxide-based composition falls within a range of 0.40≦x≦0.70 and 0.77≦y≦0.90, and further a ratio of an out-of-plane lattice constant (c) to an in-plane lattice constant (a) of the (K 1-x Na x ) y NbO 3 film is set in a range of 0.985≦c/a≦1.008.

Claims (13)

1 . A piezoelectric film element, comprising:

a substrate; and

a piezoelectric film having an alkali niobium oxide-based perovskite structure represented by a composition formula (K 1-x Na x ) y NbO 3 (0<x<1) provided on the substrate,

wherein the alkali niobium oxide-based composition falls within a range of 0.40≦x≦0.70 and 0.77≦y≦0.90, and further a ratio of an out-of-plane lattice constant (c) to an in-plane lattice constant (a) of the (K 1-x Na x ) y NbO 3 film is set in a range of 0.985≦c/a≦1.008.

2 . The piezoelectric film element according to claim 1 , wherein when there are multiple layers of the piezoelectric film, a layer with a thickest thickness out of the multiple layers satisfies the range of the aforementioned composition and c/a ratio.

3 . The piezoelectric film element according to claim 1 , wherein the piezoelectric film has a pseudo-cubic structure and is preferentially oriented in (001) plane direction.

4 . The piezoelectric film element according to claim 1 , wherein a base layer is provided between the substrate and the piezoelectric film

5 . The piezoelectric film element according to claim 4 , wherein the base layer is a Pt film or an alloy film mainly composed of Pt, or an electrode layer with a lamination structure including a lower electrode mainly composed of Pt.

6 . The piezoelectric film element according to claim 5 , wherein an upper electrode can be formed on the piezoelectric film.

7 . The piezoelectric film element according to claim 1 , wherein the substrate is a Si substrate, a surface oxide film-attached Si substrate, or an SOI substrate.

8 . A piezoelectric film device, comprising:

the piezoelectric film element according to claim 6 ; and

a function generator or a voltage detector connected between the lower electrode and the upper electrode.

Assignments (2)
MERGER Recorded Oct 8, 2014
From: HITACHI CABLE, LTD.
To: HITACHI METALS, LTD.
Reel/Frame 033908/0802 →
ASSIGNMENT OF ASSIGNOR'S INTEREST Recorded Jan 7, 2013
From: SHIBATA, KENJI; SUENAGA, KAZUFUMI; WATANABE, KAZUTOSHI; NOMOTO, AKIRA; HORIKIRI, FUMIMASA
To: HITACHI CABLE, LTD.
Reel/Frame 029579/0677 →