Optical imaging system

1. An optical imaging system comprising:

a light source configured to emit light;

a light reflector;

a light scanner mirror;

an optical multiplexer/demultiplexer,

wherein the optical multiplexer/demultiplexer is configured to demultiplex the light emitted from the light source into inspection light and reference light,

wherein the light reflector is configured to reflect the reference light,

wherein the light scanner mirror is configured to scan the inspection light on an object to be inspected, and

wherein the optical multiplexer/demultiplexer is configured to multiplex reflected inspection light obtained by the inspection light being reflected and scattered by the object to be inspected and reflected reference light obtained by the reference light being reflected by the light reflector, so as to generate interference light;

a photoelectric conversion circuit configured to photoelectrically convert the interference light into an analog output signal;

an analog-digital converter configured to convert the analog output signal to a digital signal; and

a processor comprising hardware, wherein the processor is configured to:

remove a signal resulting from the light reflected and scattered once by the object to be inspected from the digital signal, wherein the removed signal includes information on a surface portion of the object to be inspected, to thereby extract a signal resulting from multiply scattered light in the object to be inspected, wherein the extracted signal includes information on a deeper portion of the object to be inspected that is deeper than the surface portion;

integrate the extracted signal to thereby generate an integrated signal; and

generate an image of the object to be inspected on the basis of the integrated signal and positional information from the light scanner mirror.

2. The optical imaging system according to claim 1 ,

wherein the light source comprises a wavelength swept laser.

3. The optical imaging system according to claim 2 ,

wherein the processor is configured to:

perform Fourier transform of the digital signal to thereby generate a signal representative of a signal intensity distribution with respect to a position in the object to be inspected; and

extract the signal resulting from multiply scattered light in the object to be inspected from the signal representative of the signal intensity distribution with respect to the position in the object to be inspected as the extracted signal.

4. The optical imaging system according to claim 1 ,

wherein the light source comprises a super luminescent diode or pulse light source, and

wherein the light reflector is configured to be driven to sweep over relative delay time between the inspection light and the reference light.

5. The optical imaging system according to claim 4 ,

wherein the processor is configured to: detect an envelope of the digital signal to remove the signal resulting from the light reflected and scattered once by the object to be inspected from the digital signal.

6. The optical imaging system according to claim 1 ,

wherein the light source comprises a super luminescent diode or pulse light source, and

wherein the light reflector is configured such that delay time of the reference light coincides with delay time of the multiply scattered light.

7. The optical imaging system according to claim 6 ,

wherein the processor is configured to detect an envelope of the digital signal to remove the signal resulting from the light reflected and scattered once by the object to be inspected from the digital signal.

8. The optical imaging system according to claim 1 ,

wherein the photoelectric conversion circuit is configured to perform balanced detection.

9. An endoscope comprising:

the optical imaging system according to claim 1 ,

wherein the object to be inspected is the inside of a body cavity.

10. A microscope comprising:

the optical imaging system according to claim 1 .

11. An optical imaging method comprising:

emitting, with a light source, a light;

demultiplexing, with an optical multiplexer/demultiplexer, the light emitted from the light source into inspection light and reference light;

reflecting, with a light reflector, the reference light;

scanning, with a light scanner mirror, the inspection light on an object to be inspected;

multiplexing, with the optical multiplexer/demultiplexer, reflected inspection light obtained by the inspection light being reflected and scattered by the object to be inspected and reflected reference light obtained by the reference light being reflected by the light reflector so as to generate interference light;

photoelectrically converting, with the photoelectric conversion circuit, the interference light into an analog output signal;

converting, with an analog-digital converter, the analog output signal into a digital signal;

removing, with a processor comprising hardware, a signal resulting from the light reflected and scattered once by the object to be inspected from the digital signal, wherein the removed signal includes information on a surface portion of the object to be inspected, to thereby extract a signal resulting from multiply scattered light in the object to be inspected, wherein the extracted signal includes information on a deeper portion of the object to be inspected that is deeper than the surface portion;

integrating, with the processor, the extracted signal to thereby generate an integrated signal; and

generating, with the processor, an image of the object to be inspected on the basis of the integrated signal and positional information from the light scanner mirror.