Light emitting diode matching by photovoltaic response

1. A method comprising:

directly exposing a plurality of light emitting diodes to incident uniform light from a light source that is external to the plurality of light emitting diodes;

measuring, at a respective light emitting diode of the plurality of light emitting diodes and while directly exposing the plurality of light emitting diodes to the incident uniform light, an electrical signal generated by the incident uniform light,

wherein the measured electrical signal is measured by a sensing circuit electrically coupled to the respective light emitting diode;

determining a calibration value for the respective light emitting diode based on the measured electrical signal; and

storing the calibration value in a memory device.

2. The method of claim 1 , further comprising:

applying an adjusted drive signal to the respective light emitting diode, wherein the adjusted drive signal is based on the calibration value.

3. The method of claim 1 , wherein the plurality of light emitting diodes is located on a chip.

4. The method of claim 3 , wherein the external and uniform light source is a uniform white light source.

5. The method of claim 1 , wherein the measured electrical signal is a voltage, a current or both.

6. The method of claim 1 , further comprising:

converting the measured electrical signal to a digital value.

7. The method of claim 1 , wherein the plurality of light emitting diodes are red-green-blue light emitting diodes consisting of individual red, green and blue light emitting diodes.

8. The method of claim 1 , wherein the light source is in an enclosure that prevents the entry of ambient light.

9. The method of claim 1 , wherein the memory device is remote from the respective light emitting diode.

10. The method of claim 1 , wherein the memory device is integrated into the respective light emitting diode.

11. The method of claim 1 , wherein the sensing circuit is an analog-to-digital converter.

12. The method of claim 1 , wherein the memory device is integrated with drive circuitry and coupled to the respective light emitting diode.

13. The method of claim 1 , further comprising:

receiving a standard drive signal at a drive circuit of the respective light emitting diode;

receiving a calibration signal from a calibration circuit; and

generating from the standard drive signal, an adjusted drive signal based on the calibration signal.

14. The method of claim 1 , wherein the memory device is located on a chip having the respective light emitting diode.

15. A method comprising:

directly exposing a plurality of light emitting diodes to incident uniform light from a light source that is external to the plurality of light emitting diodes;

measuring, at a respective light emitting diode of the plurality of light emitting diodes and while directly exposing the plurality of light emitting diodes to the incident uniform light, an electrical signal generated by the incident uniform light,

wherein the measured electrical signal is measured by a sensing circuit electrically coupled to the respective light emitting diode;

determining a calibration value for the respective light emitting diode based on the measured electrical signal;

responsive to a drive signal for driving the respective light emitting diode, generating an adjusted drive signal for the respective light emitting diode using the drive signal and the calibration value; and

applying the adjusted drive signal to a drive circuit coupled to the respective light emitting diode.

16. The method of claim 15 , wherein the measured electrical signal is a voltage, a current or both.

17. The method of claim 15 , further comprising:

converting the measured electrical signal to a digital value.

18. The method of claim 15 , wherein the plurality of light emitting diodes are red-green-blue light emitting diodes consisting of individual red, green and blue light emitting diodes.

19. The method of claim 15 , wherein the light source is in an enclosure that prevents an entry of ambient light.

20. The method of claim 15 , further comprising: storing the calibration value in a memory device.

21. The method of claim 20 , wherein the memory device is a remote memory device.

22. The method of claim 15 , wherein the light source is a uniform white light source.

23. A method comprising:

disconnecting a plurality of light emitting diodes housed in a device from a drive signal,

wherein disconnecting the drive signal causes the plurality of light emitting diodes to stop emitting light;

directly exposing the plurality of light emitting diodes to incident uniform light from a light source that is external to the device;

measuring, at a first light emitting diode of the plurality of light emitting diodes and while directly exposing the plurality of light emitting diodes to the incident uniform light, a first electrical signal generated by the incident uniform light,

wherein the first electrical signal is measured by a sensing circuit housed in the device and electrically coupled to the first light emitting diode;

determining a first calibration value for the first light emitting diode based on the first electrical signal; and

storing the first calibration value in a memory device.

24. The method of claim 23 , further comprising:

measuring, at a second light emitting diode of the plurality of light emitting diodes and while directly exposing the plurality of light emitting diodes to the incident uniform light, a second electrical signal generated by the incident uniform light,

wherein the second electrical signal is different from the first electrical signal;

determining a second calibration value for the second light emitting diode based on the second electrical signal,

wherein determining the second calibration value is based on a comparison of the second electrical signal to a reference value;

storing the second calibration value in the memory device;

connecting the plurality of light emitting diodes to the drive signal;

generating, by one or more correction circuits housed in the device, a first corrected drive signal based on the first calibration value and a second corrected drive signal based on the second calibration value; and

providing the first corrected drive signal to the first light emitting diode and the second corrected drive signal to the second light emitting diode.