IP Library Granted Patent US 9,136,145
Granted Patent B2
US 9,136,145 · App. 13/846,584 · Granted Sep 15, 2015

Semiconductor integrated circuit device

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Quick Facts
Patent No.
US 9,136,145
App. No.
13/846,584
Granted
Sep 15, 2015
Kind
B2
Abstract

Provided is a semiconductor integrated circuit device having flexible pin arrangement. A semiconductor integrated circuit is bonded to a die pad with an insulating paste, and the potential of the die pad is fixed through a bonding wire from an Al pad provided on the surface of the semiconductor integrated circuit. In the case of a P-type semiconductor substrate, the die pad is set as a terminal other than a terminal having a minimum operating potential of the semiconductor integrated circuit.

Claims (18)

1. A semiconductor integrated circuit device, comprising:

a semiconductor integrated circuit including a P-type semiconductor substrate;

a die pad made of metal, on which the semiconductor integrated circuit is mounted; and

an insulating paste having a volume resistivity of 1×10 12 Ω·cm or more, for bonding the semiconductor integrated circuit and the die pad to each other,

wherein the die pad serves as a terminal other than a terminal having a minimum operating potential of the semiconductor integrated circuit, and

wherein the terminal other than the terminal having the minimum operating potential of the semiconductor integrated circuit serves as a terminal having a maximum operating potential of the semiconductor integrated circuit.

2. A semiconductor integrated circuit device according to claim 1 , wherein the semiconductor integrated circuit has a current consumption of 100 μA or less.

3. A semiconductor integrated circuit device, comprising:

a semiconductor integrated circuit including an N-type semiconductor substrate;

a die pad made of metal, on which the semiconductor integrated circuit is mounted; and

an insulating paste having a volume resistivity of 1×10 12 Ω·cm or more, for bonding the semiconductor integrated circuit and the die pad to each other,

wherein the die pad serves as a terminal other than a terminal having a maximum operating potential of the semiconductor integrated circuit.

4. A semiconductor integrated circuit device according to claim 3 , wherein the terminal other than the terminal having the maximum operating potential of the semiconductor integrated circuit serves as a terminal having a minimum operating potential of the semiconductor integrated circuit.

5. A semiconductor integrated circuit device according to claim 3 , wherein the semiconductor integrated circuit has a current consumption of 100 μA or less.

6. A semiconductor integrated circuit device according to claim 1 , wherein the semiconductor integrated circuit has a terminal arrangement that is pin-compatible with the terminal arrangement of another semiconductor integrated circuit whch is the same as the first-mentioned semiconductor integrated circuit except that it has an N-type substrate and is bonded to the die pad using a conductive paste.

7. A semiconductor integrated circuit device according to claim 1 , wherein the semiconductor integrated circuit has a terminal configuration the same as that of another semiconductor integrated circuit whch is the same as the first-mentioned semiconductor integrated circuit except that it has an N-type substrate and is bonded to the die pad using a conductive paste.

8. A semiconductor integrated circuit device according to claim 3 , wherein the semiconductor integrated circuit has a terminal arrangement that is pin-compatible with the terminal arrangement of another semiconductor integrated circuit whch is the same as the first-mentioned semiconductor integrated circuit except that it has a P-type substrate and is bonded to the die pad using a conductive paste.

9. A semiconductor integrated circuit device according to claim 3 , wherein the semiconductor integrated circuit has a terminal configuration the same as that of another semiconductor integrated circuit whch is the same as the first-mentioned semiconductor integrated circuit except that it has a P-type substrate and is bonded to the die pad using a conductive paste.

Assignments (3)
CHANGE OF NAME Recorded Mar 12, 2018
From: SII SEMICONDUCTOR CORPORATION
To: ABLIC INC.
Reel/Frame 045567/0927 →
ASSIGNMENT OF ASSIGNOR'S INTEREST Recorded Mar 10, 2016
From: SEIKO INSTRUMENTS INC.
To: SII SEMICONDUCTOR CORPORATION
Reel/Frame 038058/0892 →
ASSIGNMENT OF ASSIGNOR'S INTEREST Recorded Apr 30, 2013
From: HARADA, HIROFUMI
To: SEIKO INSTRUMENTS INC.
Reel/Frame 030345/0378 →