IP Library Granted Patent US 9,337,713
Granted Patent B2
US 9,337,713 · App. 13/848,102 · Granted May 10, 2016

Sampling circuit for measuring the reflected voltage of transformer for power converter

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Quick Facts
Patent No.
US 9,337,713
App. No.
13/848,102
Granted
May 10, 2016
Kind
B2
Abstract

A sampling circuit of the power converter according to the present invention comprises an amplifier circuit receiving a reflected voltage for generating a first signal. A first switch and a first capacitor are utilized to generate a second signal in response to the reflected voltage. A sample-signal circuit generates a sample signal in response to a falling edge of a switching signal. The switching signal is generated in accordance with a feedback signal for regulating an output of the power converter. The feedback signal is generated in accordance with the second signal. The sample signal is utilized to control the first switch for sampling the reflected voltage. The sample signal is disabled once the first signal is lower than the second signal. The sampling circuit precisely samples the reflected voltage of the transformer of the power converter for regulating the output of the power converter.

Claims (25)

1. A sampling circuit for sampling a reflected voltage of a transformer for the power converter, comprising:

an amplifier circuit coupled to receive the reflected voltage for generating a first signal;

a first capacitor generating a second signal in response to the reflected voltage;

a first switch coupled between the reflected voltage and the first capacitor; and

a sample-signal circuit generating a sample signal in response to a falling edge of a switching signal, in which the switching signal is generated in accordance with a feedback signal for regulating an output of the power converter;

wherein the feedback signal is generated in accordance with the second signal; the sample signal is utilized to control the first switch for sampling the reflected voltage; the sample signal is disabled once the first signal is lower than the second signal; the second signal comparing with the first signal has a propagation delay.

2. The sampling circuit as claimed in claim 1 , further comprising a resistive device coupled to the first switch; in which the resistive device and the first capacitor develop a low pass filter for the propagation delay.

3. The sampling circuit as claimed in claim 2 , further comprising a switch coupled to the resistive device to reduce resistance of the resistive device in response to a blanking time.

4. The sampling circuit as claimed in claim 1 , further comprising:

a second switch coupled to the first capacitor; and

a second capacitor coupled to the second switch to transform the second signal from the first capacitor to the second capacitor;

wherein a hold signal is generated in response to the sample signal; the hold signal controls the second switch; the second capacitor generates the feedback signal in response to the second signal.

5. The sampling circuit as claimed in claim 1 , wherein the sample signal has a minimum pulse width in response to the falling edge of the switching signal.

6. The sampling circuit as claimed in claim 1 , wherein the propagation delay is longer than a falling edge slew-rate of the first signal.

7. A sampling circuit of the power converter, comprising:

an amplifier circuit generating a first signal in response to a reflected voltage of a transformer of the power converter; and

a sample unit sampling the reflected voltage for generating a second signal in response to a falling edge of a switching signal, in which the switching signal is generated in accordance with a feedback signal for regulating an output of the power converter;

wherein the feedback signal is generated in accordance with the second signal; the sample unit stops sampling the reflected voltage once the first signal is lower than the second signal.

8. The sampling circuit as claimed in claim 7 , further comprising a sample-signal circuit generating a sample signal in response to the falling edge of the switching signal; the sample signal controlling the sample unit to sample the reflected voltage for generating the second signal, in which the sample signal is disabled once the first signal is lower than the second signal.

9. The sampling circuit as claimed in claim 7 , further comprising a hold circuit coupled to the sample unit to receive the second signal for generating the feedback signal in response to the second signal.

10. The sampling circuit as claimed in claim 7 , wherein the sample unit comprises:

a first capacitor generating the second signal in response to the reflected voltage; and

a first switch coupled between the reflected voltage and the first capacitor, and being controlled by a sample signal for sampling the reflected voltage.

11. The sampling circuit as claimed in claim 10 , further comprising a resistive device coupled to the first switch; in which the resistive device and the first capacitor develop a low pass filter for a propagation delay.

12. The sampling circuit as claimed in claim 11 , further comprising a switch coupled to the resistive device to reduce resistance of the resistive device in response to a blanking time.

Assignments (3)
RELEASE OF SECURITY INTEREST IN PATENTS RECORDED AT RECORDED AT REEL 046410, FRAME 0933 Recorded Jun 22, 2023
From: DEUTSCHE BANK AG NEW YORK BRANCH, AS COLLATERAL AGENT
To: SEMICONDUCTOR COMPONENTS INDUSTRIES, LLC; FAIRCHILD SEMICONDUCTOR CORPORATION
Reel/Frame 064072/0001 →
PATENT SECURITY AGREEMENT Recorded Jun 22, 2018
From: SEMICONDUCTOR COMPONENTS INDUSTRIES, LLC
To: DEUTSCHE BANK AG NEW YORK BRANCH, AS COLLATERAL AGENT
Reel/Frame 046410/0933 →
ASSIGNMENT OF ASSIGNOR'S INTEREST Recorded Apr 25, 2017
From: FAIRCHILD (TAIWAN) CORPORATION (FORMERLY SYSTEM GENERAL CORPORATION)
To: SEMICONDUCTOR COMPONENTS INDUSTRIES, LLC
Reel/Frame 042328/0318 →