Manufacturing method of solid-state imaging device and solid-state imaging device
View Patent ↗A manufacturing method of a solid-state imaging device includes: preparing a photoelectric conversion device; forming an insulating layer on a surface of the photoelectric conversion device; forming a wire-grid polarizer on a support base; bonding a forming surface of the wire-grid polarizer on the support base to the insulating layer on the surface of the photoelectric conversion device and removing the support base from the wire-grid polarizer.
1. A solid-state imaging device comprising:
a passivation layer on a sidewall of a wire-grid polarizer, said passivation layer extending from a first surface of the wire-grid polarizer to a second surface of the wire-grid polarizer;
a micro-lens between a base device and a first insulating layer, said first insulating layer being between said first surface of the wire-grid polarizer and said micro-lens.
2. The solid-state imaging device according to claim 1 , wherein said passivation layer is between said first insulating layer and said first surface of the wire-grid polarizer.
3. The solid-state imaging device according to claim 1 , wherein said first of the wire-grid polarizer is opposite to said second surface of the wire-grid polarizer.
4. The solid-state imaging device according to claim 1 , wherein said passivation layer touches said first insulating layer and said first of the wire-grid polarizer.
5. The solid-state imaging device according to claim 1 , wherein said base device includes a wiring layer and at least one transistor.
6. The solid-state imaging device according to claim 1 , wherein a concave portion is hole in the first insulating layer, said hole extending partially into said first insulating layer from a surface of the first insulating layer.
7. The solid-state imaging device according to claim 6 , wherein said wire-grid polarizer is in said concave portion.
8. The solid-state imaging device according to claim 1 , further comprising:
a color filter between said base device and said micro-lens.
9. The solid-state imaging device according to claim 8 , wherein said micro-lens touches said color filter.
10. The solid-state imaging device according to claim 8 , further comprising:
a device planarization layer between said base device and said color filter.
11. The solid-state imaging device according to claim 10 , wherein said device planarization layer touches said base device and said color filter.
12. The solid-state imaging device according to claim 1 , further comprising:
a micro-lens planarization layer between said first insulating layer and said micro-lens.
13. The solid-state imaging device according to claim 12 , wherein said micro-lens planarization layer touches said first insulating layer and said micro-lens.
14. The solid-state imaging device according to claim 12 , wherein said micro-lens and said planarization layer are transparent to a wavelength band of light.
15. The solid-state imaging device according to claim 14 , wherein said base device and said micro-lens are in a photoelectric conversion device, said photoelectric conversion device being configured to photo-electrically convert a wavelength of the light.
16. The solid-state imaging device according to claim 15 , wherein a reflection layer of the wire-grid polarizer is in a one-dimensional grid, a pitch of the grid being smaller than said wavelength of the light.
17. The solid-state imaging device according to claim 16 , wherein a second insulating layer is between an absorption layer of the wire-grid polarizer and said reflection layer, said reflection layer being between said passivation layer and said second insulating layer.