Photovoltaic devices and method of making
A photovoltaic device is presented. The photovoltaic device includes a layer stack; and an absorber layer is disposed on the layer stack. The absorber layer comprises selenium, wherein an atomic concentration of selenium varies across a thickness of the absorber layer. The photovoltaic device is substantially free of a cadmium sulfide layer.
1. A photovoltaic device, comprising:
a transparent layer stack;
an absorber layer disposed directly in contact with the layer stack at a front interface of the absorber layer, the absorber layer consisting of a thickness between the front interface of the absorber layer and a back interface of the absorber layer, wherein:
the front interface of the absorber layer is closer to the transparent layer stack than the back interface of the absorber layer,
the absorber layer comprises a compound of cadmium, selenium, and tellurium, an atomic concentration of selenium varies across the thickness of the absorber layer,
the atomic concentration of selenium is greater at the front interface of the absorber layer relative to the back interface of the absorber layer,
a band gap of the absorber layer at the front interface of the absorber layer is lower than the band gap of the absorber layer at the back interface of the absorber layer,
the absorber layer consisting of:
a first region and
a second region, wherein:
the first region extends from the front interface of the absorber layer to the second region,
the second region extends from the first region to the back interface of the absorber layer,
the first region has a continuous uniform thickness between 100 nanometers to 3000 nanometers thick,
the second region has a continuous uniform thickness between 100 nanometers to 3000 nanometers thick, and
a ratio of an average atomic concentration of selenium in the first region to an average atomic concentration of selenium in the second region is greater than 10; and
a p+ type semiconducting layer, wherein:
the absorber layer is between the transparent layer stack and the p+ type semiconducting layer, and
the p+ type semiconducting layer comprises at least one of: zinc telluride, magnesium telluride, manganese telluride, beryllium telluride, mercury telluride, arsenic telluride, antimony telluride, or copper telluride.
2. The photovoltaic device of claim 1 , wherein the absorber layer further comprises sulfur, oxygen, copper, chlorine, or combinations thereof.
3. The photovoltaic device of claim 1 , wherein at least a portion of selenium is present in the absorber layer in the form of a ternary compound, a quaternary compound, or combinations thereof.
4. The photovoltaic device of claim 1 , wherein an average atomic concentration of selenium in the absorber layer is in a range from about 0.001 atomic percent to about 40 atomic percent of the absorber layer.
5. The photovoltaic device of claim 4 , wherein the average atomic concentration of selenium in the absorber layer is in a range from 0.001 atomic percent to 20 atomic percent of the absorber layer.
6. The photovoltaic device of claim 1 , wherein the absorber layer comprises a plurality of grains separated by grain boundaries, and wherein an average atomic concentration of selenium in the grain boundaries is higher than an average atomic concentration of selenium in the grains.
7. The photovoltaic device of claim 1 , wherein the layer stack comprises:
a transparent conductive layer disposed on a support; and
a buffer layer disposed between the transparent conductive layer and the absorber layer.
8. The photovoltaic device of claim 7 , wherein the layer stack further comprises an interlayer disposed between the buffer layer and the absorber layer.
9. The photovoltaic device of claim 8 , wherein the absorber layer is in direct contact with the interlayer.
10. The photovoltaic device of claim 1 , wherein the photovoltaic device has no window layer and is completely free of a cadmium sulfide layer.
11. The photovoltaic device of claim 1 , wherein:
the first region is between 200 nanometers to 1500 nanometers thick,
the second region is between 200 nanometers to 1500 nanometers thick.
12. A photovoltaic device, comprising:
a layer stack; and
an absorber layer disposed directly in contact with the layer stack at a front interface of the absorber layer, the absorber layer consisting of a thickness between the front interface and a back interface of the absorber layer, wherein:
the absorber layer comprises a compound of cadmium, selenium, and tellurium,
an atomic concentration of selenium varies continuously across the thickness of the absorber layer,
the atomic concentration of selenium is greater at the front interface of the absorber layer relative to the back interface of the absorber layer,
the photovoltaic device has no window layer and is substantially free of a cadmium sulfide layer, and
the photovoltaic device includes a layer comprising: cadmium tin oxide, indium tin oxide; fluorine-doped tin oxide; indium-doped cadmium-oxide; doped zinc oxide, indium-zinc oxide, or zinc tin oxide.
13. The photovoltaic device of claim 12 , wherein the absorber layer further comprises oxygen, and wherein the amount of oxygen in the absorber layer is less than 1 atomic percent.
14. The photovoltaic device of claim 12 , wherein an average atomic concentration of selenium in the absorber layer is in a range from 0.001 atomic percent to 20 atomic percent of the absorber layer.
15. The photovoltaic device of claim 12 , wherein the photovoltaic device further comprises a p+ type semiconducting layer, wherein:
the absorber layer is between the transparent layer stack and the p+ type semiconducting layer, and
the p+ type semiconducting layer comprises at least one of: zinc telluride, magnesium telluride, manganese telluride, beryllium telluride, mercury telluride, arsenic telluride, antimony telluride, or copper telluride.
16. A photovoltaic device, comprising:
a transparent layer stack; and
an absorber layer in direct contact with the transparent layer stack at a front interface of the absorber layer, wherein:
the absorber layer consists of a thickness of the absorber layer between the front interface of the absorber layer and a back interface of the absorber layer,
the front interface of the absorber layer is closer to the transparent layer stack than the back interface of the absorber layer,
the absorber layer comprises cadmium, selenium, and tellurium,
an atomic concentration of selenium varies across the thickness of the absorber layer,
the atomic concentration of selenium is greater at the front interface of the absorber layer relative to the back interface of the absorber layer,
the absorber layer is a p-type layer,
the absorber layer consists of a first region and a second region,
the first region extends from the front interface of the absorber layer to the second region,
the second region extends from the first region to the back interface of the absorber layer,
the first region has a continuous uniform thickness between 100 nanometers to 3000 nanometers thick,
the second region has a continuous uniform thickness between 100 nanometers to 3000 nanometers thick,
a ratio of an average atomic concentration of selenium in the first region to an average atomic concentration of selenium in the second region is greater than 10, and
the photovoltaic device has no window layer and is completely free of a cadmium sulfide layer.
17. The photovoltaic device of claim 16 , wherein an average atomic concentration of selenium in the absorber layer is in a range from 0.001 atomic percent to 20 atomic percent of the absorber layer.