IP Library Granted Patent US 8,743,379
Granted Patent B2
US 8,743,379 · App. 13/877,135 · Granted Jun 3, 2014

Device for monitoring thickness reduction of inner surface in heat transfer tube or inner surface in evaporation tube

Inventors: Tetsuya Ikeda (Tokyo, JP); Seiji Kagawa (Tokyo, JP); Susumu Okino (Tokyo, JP); Takuya Okamoto (Tokyo, JP)
Assignee: Mitsubishi Heavy Industries, Ltd.
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Quick Facts
Patent No.
US 8,743,379
App. No.
13/877,135
Granted
Jun 3, 2014
Kind
B2
Abstract

There is provided a device for monitoring a thickness reduction of an inner surface in a heat transfer tube or an inner surface in an evaporation tube, the device including: a movement unit which moves along a fin tube; a laser measurement unit which is provided in the movement unit and measures the thickness reduction of the inner surface by a laser; a cable which includes a light guiding path for introducing a laser into the laser measurement unit and a light deriving path for transmitting reflected light; and a thickness reduction determining unit which compares the laser measurement data with past data or standard data and determines the current thickness reduction.

Claims (13)

1. A device for monitoring a thickness reduction of an inner surface in a heat transfer tube or an inner surface in an evaporation tube comprising:

a movement unit adapted to move along the inner surface in the heat transfer tube or the inner surface in the evaporation tube;

a laser measurement unit provided in the movement unit for measuring the thickness reduction of the inner surface in the heat transfer tube or the inner surface in the evaporation tube by a laser;

a cable including a light guiding path for introducing a laser into the laser measurement unit and a light deriving path for transmitting reflected light; and

a thickness reduction determining unit for comparing data of the laser measurement unit with past data or standard data so as to determine the current thickness reduction, wherein

the laser measurement unit includes:

a sensor head having a laser displacement sensor; and

a prism or mirror for shortening a focal distance of the laser,

the laser measurement unit is configured to guide the laser emitted from the laser displacement sensor, emit the laser in a direction perpendicular to the inner surface, move a reflection surface of the laser by 360° in a peripheral wall surface and continuously read a position of the reflection surface through the laser displacement sensor, so as to measure the thickness reduction.

2. The device according to claim 1 , further comprising:

a stopping unit for temporarily stopping the movement unit.

3. The device according to claim 1 ,

wherein the laser measurement unit is configured to measure the thickness reduction while sequentially moving along an inner surface of a fin tube by the movement of the movement unit.

Assignments (1)
ASSIGNMENT OF ASSIGNOR'S INTEREST Recorded Apr 1, 2013
From: IKEDA, TETSUYA; KAGAWA, SEIJI; OKINO, SUSUMU; OKAMOTO, TAKUYA
To: MITSUBISHI HEAVY INDUSTRIES, LTD.
Reel/Frame 030123/0099 →
Priority Claims (1)
JP 2010-225272 · Oct 4, 2010 · national
Continuity (1)
Related Publication 20130182265A1 · Jul 18, 2013