IP Library Granted Patent US 8,917,811
Granted Patent B2
US 8,917,811 · App. 13/886,645 · Granted Dec 23, 2014

Apparatus and method for dynamic calibration of spectral CT with rotating X-ray source and stationary energy discriminating detectors

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Quick Facts
Patent No.
US 8,917,811
App. No.
13/886,645
Granted
Dec 23, 2014
Kind
B2
Abstract

An apparatus and method for dynamically calibrating a computed-tomography (CT) scanner that includes a rotating X-ray source and a plurality of stationary energy-discriminating detectors configured to capture incident X-ray photons emitted from the X-ray source. A bowtie filter with a unique geometry and material composition is used to generate reference beams of a desired intensity. The apparatus includes a processor that is configured to remove a scattering background based on data obtained from the reference beams and compute a change in a predetermined calibration function.

Claims (27)

1. A computed-tomography (CT) apparatus, comprising:

a rotating X-ray source;

a plurality of stationary energy-discriminating detectors configured to capture incident X-ray photons emitted from the X-ray source;

a bowtie filter configured to generate reference beams of respective desired intensities outside a scan field of view; and

a processor configured to

obtain reference count rates corresponding to the reference beams incident on a detector outside the scan field of view, and

update a calibration function based on the obtained reference count rates at the detector, wherein the updated calibration function is used to determine X-ray intensities from scan count rates obtained at the detector when the detector is within the scan field of view.

2. The CT apparatus of claim 1 , wherein the X-ray source and the bowtie filter generate

the reference beams including a leading reference beam and a trailing reference beam.

3. The CT apparatus of claim 2 , wherein both the leading reference beam and the trailing

reference beam are used to update the calibration function.

4. The CT apparatus of claim 1 , wherein the processor is configured to update a respective calibration function for each detector of the plurality of energy-discriminating detectors.

5. The CT apparatus of claim 1 , wherein a change in the calibration function is time-dependent.

6. The CT apparatus of claim 1 , wherein the bowtie filter includes an air channel to create

an X-ray of desired intensity.

7. The CT apparatus of claim 1 , wherein the processor is further configured to perform scattering correction based on data collected when the reference beams are incident on the detector.

8. The CT apparatus of claim 1 , wherein the processor is configured to update the calibration function by calculating a change in the calibration function using a first-order approximation.

9. A method for calibrating a computed-tomography (CT) scanner, comprising:

generating reference beams of respective desired intensities outside a scan field of view;

capturing incident X-ray photons at an energy-discriminating detector;

obtaining reference count rates corresponding to the reference beams incident on the detector when the detector is outside the scan field of view;

updating a calibration function based on the obtained reference count rates at the detector, wherein the updated calibration function is used to determine X-ray intensities from scan count rates obtained at the detector when the detector is within the scan field of view.

10. A non-transitory computer readable medium having stored thereon a program that when executed by a computer, causes a computed-tomography apparatus to perform the steps of:

generating reference beams of respective desired intensities outside a scan field of view;

capturing incident X-ray photons at an energy-discriminating detector;

obtaining reference count rates corresponding to the reference beams incident on the detector when the detector is outside the scan field of view;

updating a calibration function based on the obtained reference count rates at the detector, wherein the updated calibration function is used to determine X-ray intensities from scan count rates obtained at the detector when the detector is within the scan field of view.

Assignments (2)
ASSIGNMENT OF ASSIGNOR'S INTEREST Recorded May 31, 2016
From: KABUSHIKI KAISHA TOSHIBA
To: TOSHIBA MEDICAL SYSTEMS CORPORATION
Reel/Frame 038891/0693 →
ASSIGNMENT OF ASSIGNOR'S INTEREST Recorded May 3, 2013
From: ZHANG, YUEXING; WANG, XIAOLAN; ZOU, YU
To: KABUSHIKI KAISHA TOSHIBA; TOSHIBA MEDICAL SYSTEMS CORPORATION
Reel/Frame 030348/0238 →