IP Library Granted Patent US 8,908,164
Granted Patent B2
US 8,908,164 · App. 13/887,090 · Granted Dec 9, 2014

Method for the detection of defects in gas-barrier films using quantum dots

Inventors: Nigel Pickett (Manchester, GB); Nathalie Gresty (Chester, GB)
Assignee: Nanoco Technologies, Ltd.
G01N21/64G01N21/59G01N21/91G01N21/6489G01N2021/8427G01N2015/0813
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Quick Facts
Patent No.
US 8,908,164
App. No.
13/887,090
Granted
Dec 9, 2014
Kind
B2
Abstract

By forming nanoparticles from gas-phase precursors within cracks or defects in a gas-barrier film, crack-width may be determined from the diameter of the nanoparticles formed within. The optical absorption and emission wavelengths of a quantum dot are governed by the particle size. For a particular material, the absorption and/or emission wavelengths may therefore be correlated to the particle size (as determined from techniques such as transmission electron microscopy, TEM). Thus, fluorescence measurement techniques and/or confocal microscopy may be used to determine the size of quantum dots formed within a gas-barrier film, allowing both the size and nature of a defect to be determined. The method may be used to assess the potential effects of defects on the integrity of the gas-barrier film.

Claims (23)

1. A method for characterizing defects in a gas-barrier film comprising:

synthesizing quantum dots within defects in the film using gaseous precursors;

detecting light emission or light absorbance by the quantum dots.

2. A method as recited in claim 1 wherein the defects comprise channel cracks in the film.

3. A method as recited in claim 1 wherein the defects comprise open pores in the film.

4. A method as recited in claim 1 wherein the fluorescence is detected using confocal microscopy.

5. A method as recited in claim 1 wherein the quantum dots comprise Group II-VI nanoparticles.

6. A method as recited in claim 1 wherein the quantum dots comprise Group III-V nanoparticles.

7. A method as recited in claim 1 wherein the quantum dots comprise Group II-V nanoparticles.

8. A method as recited in claim 1 wherein the quantum dots comprise Group III-VI nanoparticles.

9. A method as recited in claim 1 wherein the gaseous precursors are supplied via a carrier gas selected from the group consisting of helium (He), nitrogen (N 2 ), argon (Ar) and hydrogen (H 2 ).

10. A method as recited in claim 1 wherein the quantum dots are synthesized in the presence of a Lewis base.

11. A method as recited in claim 10 wherein the Lewis base is pyridine gas.

12. A method as recited in claim 1 wherein the gaseous precursors comprise two streams flowing in opposite directions.

13. A method as recited in claim 1 wherein the gaseous precursors comprise two streams flowing in parallel.

14. A method as recited in claim 13 wherein the two streams flow in tandem.

15. A method as recited in claim 13 wherein the two streams flow sequentially.

16. A method as recited in claim 1 wherein the quantum dots comprise nanoparticles selected from the group consisting of CdS, CdSe, ZnS, ZnSe and InP.

17. A method as recited in claim 1 wherein the fluorescence is detected by stimulated emission depletion microscopy.

18. A method as recited in claim 1 further comprising correlating the photoluminescence wavelength of the quantum dots with their particle size.

19. A method as recited in claim 1 further comprising determining the size of pores in the film using confocal microscopy.

20. A method as recited in claim 1 further comprising correlating the absorption wavelengths of the quantum dots to particle size determined by transmission electron microscopy.

21. A method as recited in claim 1 further comprising correlating the emission wavelengths of the quantum dots to particle size determined by transmission electron microscopy.

Assignments (3)
CORRECTIVE ASSIGNMENT TO CORRECT THE ASSIGNEE PREVIOUSLY RECORDED ON REEL 062977 FRAME 0157. ASSIGNOR(S) HEREBY CONFIRMS THE ASSIGNMENT OF ASSIGNORS INTEREST. Recorded Jul 13, 2023
From: NANOCO TECHNOLOGIES LTD
To: SAMSUNG ELECTRONICS CO., LTD.
Reel/Frame 064273/0340 →
ASSIGNMENT OF ASSIGNOR'S INTEREST Recorded Mar 7, 2023
From: NANOCO TECHNOLOGIES LTD
To: SAMSUNG ELECTRONICS CO. LTD
Reel/Frame 062977/0157 →
ASSIGNMENT OF ASSIGNOR'S INTEREST Recorded Aug 2, 2013
From: PICKETT, NIGEL; GRESTY, NATHALIE
To: NANOCO TECHNOLOGIES LTD.
Reel/Frame 030954/0065 →
Continuity (2)
Provisional Application 61642934 · May 4, 2012
Related Publication 20130314698A1 · Nov 28, 2013