Optimizing vision correction procedures

1. An apparatus comprising:

a wavefront sensor configured to measure real time aberration values of a wavefront returned from an eye of a patient during a slit lamp eye examination session when the eye of a patient is examined using a slit lamp eye examination device and with the wavefront sensor combined with the slit lamp eye examination device and configured to provide an output signal indicating the real time aberration values; and

a display, coupled to the wavefront sensor, configured to show a dynamic display indicating the real time aberration values output by the wavefront sensor and with the display configured to be viewed while also viewing the eye of the patient during the examination.

2. The apparatus of claim 1 with the wavefront sensor further comprising:

an offsetting mechanism configured to be controlled by the surgeon during the vision correction procedure to offset selected wavefront aberration components in order to highlight or amplify clinically important features of other non-offset aberration components of the wavefront returned from the eye of the patient.

3. The apparatus of claim 1 further comprising:

a detection mechanism that outputs aberration values resulting from the tilt of different sub-portions of the wavefront where the dynamic display is formed by displaying the aberration values.

4. The apparatus of claim 3 where the detection mechanism comprises:

a single position sensing device that measures the tilt of different sub-portions of the wavefront that are sequentially directed onto the single position sensing device.

5. The apparatus of claim 4 further comprising:

a beam scanning mechanism for directing different sub-portions of the wavefront onto the single position sensing device.

6. The apparatus of claim 5 where the beam scanning mechanism directs sub-portions included in an annular ring portion of the wavefront onto the single position sensing device.