Double exposure technique for high resolution disk imaging
View Patent ↗Innovative techniques are disclosed for fabricating microelectronic devices using an alternating phase shift mask. Some embodiments of the invention encompass a double exposure technique that utilize high resolution line patterning such that two opaque lines intersect at an angle. After development, substantially circular images may be formed. In certain embodiments, high resolution disk imaging as small as 60 nm is possible.
1. A method of forming a pattern of images on a substrate, the method comprising:
providing a photoresist on the substrate;
providing a mask having a first line segment oriented in a first position and a second line segment oriented in a second position substantially perpendicular to the first position, wherein each line segment comprises an opaque material that blocks light from penetrating the photoresist;
performing a first exposure of the photoresist through the mask, wherein a first region of the photoresist is unexposed after exposure;
performing a second exposure of the photoresist through the mask, wherein a second region of the photoresist is unexposed after exposure, and wherein said mask comprises an alternating phase shift mask.
2. The method of claim 1 , wherein the line segments have a line width of approximately 50-150 nm.
3. The method of claim 1 , wherein the mask is shifted between the first exposure and the second exposure.
4. The method of claim 1 , further comprising developing the photoresist to form a plurality of substantially circular disks, wherein each substantially circular disk corresponds to an unexposed region.
5. The method of claim 4 , wherein each substantially circular disk has a resolution of 60 nm or less.
6. The method of claim 1 , wherein the pattern has a pitch of at least 0.5 microns.
7. The method of claim 1 , wherein the pattern has a pitch of approximately 25 to approximately 100 microns.
8. The method of claim 1 , wherein the opaque material of said first phase shift mask comprises chromium.
9. The method of claim 1 , wherein the mask comprises a first transparent area that has a phase shift of 0 degrees and a second transparent area that has a phase shift of 180 degrees, wherein light is transmitted through each transparent area.
10. A method of forming a fine pattern on a substrate comprising:
providing a photoresist on a substrate;
providing a first mask having first and second transparent areas with phase shifts of 0 degrees and 180 degrees respectively, and a first opaque area;
exposing the photoresist through the first mask, wherein the first opaque area blocks light from entering the photoresist, resulting in a first unexposed region;
providing a second mask having first and second transparent areas with phase shifts of 0 degrees and 180 degrees respectively, and a second opaque area;
placing the second opaque area of the second mask in a direction substantially perpendicular to the first opaque area of the first mask resulting in a second unexposed region;
exposing the photoresist through the second mask to form a latent image at the intersection of the first and second unexposed regions, wherein said first mask and said second mask comprise an alternating phase shift mask; and
developing the photoresist to form a fine pattern of images, each image having rounded corners and a pitch of at least 0.5 microns.
11. The method of claim 10 , wherein each opaque area comprises a line segment having a width of approximately 50-150 nm.
12. The method of claim 10 , wherein the fine pattern obtained after development has a resolution of 60 nm or less.
13. The method of claim 10 , wherein the first and second opaque areas comprise chromium.
14. A method of forming a high resolution image on a substrate, the method comprising:
providing a photoresist on the substrate to form a coating;
providing a first mask having an opaque area in a first position to block a first region of the photoresist from being exposed;
performing a first exposure of the coating through the first mask;
providing a second mask having an opaque area in a second position to block a second region of the photoresist from being exposed, wherein the second region is oriented at an angle α, relative to the first region of the first mask, wherein α is ≧30 degrees and ≦90 degrees;
performing a second exposure through the second mask, wherein said first mask and said second mask comprise an alternating phase shift mask and wherein the same dosage is used for the first and second exposure and
developing the photoresist to form a pattern of images, each image having rounded corners and a pitch of at least 0.5 microns.
15. The method of claim 14 , wherein developing the photoresist forms a substantially elliptical image at the intersection of the first and second unexposed regions when α is 45 degrees.
16. The method of claim 14 , wherein developing the photoresist forms substantially circular disks at the intersection of the first and second unexposed regions when α is 90 degrees.
17. The method of claim 14 , wherein the opaque area of the first mask has a width dimension that is substantially equal to a width dimension of the opaque area of the second mask.
18. The method of claim 14 , wherein the opaque area of the first mask has a length dimension that is substantially equal to a length dimension of the opaque area of the second mask.
19. The method of claim 14 , wherein the fine pattern has a pitch of approximately 25-100 microns.
20. The method of claim 14 , wherein the fine pattern has a pitch of approximately 100-300 microns.