IP Library Granted Patent US 9,135,844
Granted Patent B2
US 9,135,844 · App. 13/909,210 · Granted Sep 15, 2015

Optical projection system capable of detecting projection image deformation and associated detection method

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Quick Facts
Patent No.
US 9,135,844
App. No.
13/909,210
Granted
Sep 15, 2015
Kind
B2
Abstract

An optical projection system capable of detecting projection image deformation is provided. The optical projection system includes a laser source system, a scan unit, a detection unit and a signal control processing unit. The laser source system generates a visible laser having a visible wavelength and a detection laser. The scan unit projects the visible laser and the detection laser onto a projection plane, and drives the visible laser and the detection laser to scan along multiple scan lines to form a projection image. The detection unit detects the detection laser reflected by the projection plane, and outputs a voltage signal. The signal control processing unit determines whether the projection image is deformed according to the voltage signal, and accordingly determines whether to perform a correction operation.

Claims (28)

1. An optical projection system capable of detecting projection image deformation, comprising:

a laser source system, for generating at least one visible laser beam having a visible wavelength and a detection laser beam;

a scan unit, for projecting the visible laser beam and the detection laser beam onto a projection plane, and driving the visible laser beam and the detection laser beam to scan along a plurality of scan lines to form a projection image;

a detection unit, for detecting the detection laser beam reflected by the projection plane, and outputting a voltage signal; and

a signal control processing unit, for determining whether the projection image is deformed according to the voltage signal and accordingly determining whether to perform a correction operation,

wherein the detection unit outputs a first voltage signal corresponding to a first scan line among the scan lines, and the signal control processing unit determines whether the projection image is deformed according to a starting voltage level and an ending voltage level of the first voltage signal.

2. The optical projection system according to claim 1 , wherein the signal control processing unit determines that the projection image is deformed when a difference between the starting voltage level and the ending voltage level of the voltage signal exceeds a predetermined value.

3. An optical projection system capable of detecting projection image deformation, comprising:

a laser source system, for generating at least one visible laser beam having a visible wavelength and a detection laser beam;

a scan unit, for projecting the visible laser beam and the detection laser beam onto a projection plane, and driving the visible laser beam and the detection laser beam to scan along a plurality of scan lines to form a projection image;

a detection unit, for detecting the detection laser beam reflected by the projection plane, and outputting a voltage signal; and

a signal control processing unit, for determining whether the projection image is deformed according to the voltage signal and accordingly determining whether to perform a correction operation,

wherein the detection unit outputs a first voltage signal and a second voltage signal corresponding to a first scan line and a second scan line among the scan lines and the signal control processing unit determines whether the projection image is deformed according to voltage levels of the first voltage signal and the second voltage signal.

4. The optical projection system according to claim 3 , wherein the signal control processing unit determines that the projection image is deformed when a difference between the voltage levels of the first voltage signal and the second voltage signal exceeds a predetermined value.

5. The optical projection system according to claim 3 , wherein the voltage level is a starting voltage level, an ending voltage level or an average voltage level.

6. The optical projection system according to claim 1 , wherein the detection laser beam has an invisible wavelength.

7. A method for detecting projection image deformation, applied to an optical projection system, comprising:

projecting a detection laser beam onto a projection plane, and driving the detection laser beam to scan along a plurality of scan lines to form a projection image;

detecting the detection laser beam corresponding to a first scan line among the scan lines reflected by the projection plane, and outputting a first voltage signal; and

determining whether the projection image is deformed according to a starting voltage level and an ending voltage level of the first voltage signal and further accordingly determining whether to perform a correction operation.

8. The method according to claim 7 , wherein the detection laser beam has an invisible wavelength.

9. The method according to claim 7 , further comprising determining that the projection image is deformed when a difference between the starting voltage level and the ending voltage level exceeds a predetermined value.

10. A method for detecting projection image deformation, applied to an optical projection system, comprising:

projecting a detection laser beam onto a projection plane, and driving the detection laser beam to scan along a plurality of scan lines to form a projection image;

detecting the detection laser beam corresponding to a first scan line and a second scan line among the scan lines reflected by the projection plane, and outputting a first voltage signal and a second voltage signal; and

determining whether the projection image is deformed according to voltage levels of the first voltage signal and the second voltage signal and further accordingly determining whether to perform a correction operation.

11. The method according to claim 10 , wherein said determining includes determining that the projection image is deformed when a difference between the voltage levels of the first voltage signal and the second voltage signal exceeds a predetermined value.

12. The method according to claim 10 , wherein the voltage level is a starting voltage level, an ending voltage level or an average voltage level.

Assignments (2)
ASSIGNMENT OF ASSIGNOR'S INTEREST Recorded May 14, 2014
From: LITE-ON IT CORP.
To: LITE-ON TECHNOLOGY CORPORATION
Reel/Frame 032892/0554 →
ASSIGNMENT OF ASSIGNOR'S INTEREST Recorded Jun 4, 2013
From: LIN, WEN-LUNG; LEI, HUA-DE
To: LITE-ON IT CORPORATION
Reel/Frame 030539/0555 →