Apparatus and method for testing a memory
An apparatus is equipped with a storage device including an error correction circuit. The apparatus performs a test of the storage device according to a predetermined testing procedure, and records a time-point at which error correction of the storage device has been performed by the error correction circuit during performance of the test. The apparatus determines, with predetermined accuracy, a first position within the storage device on which the error correction has been performed, based on a test speed at which the test is performed, a time-period from the time-point to current time, and a second position within the storage device on which the test is being performed at the current time. Then, the apparatus performs the test predetermined times on a range included in the storage device and including the first position, according to a testing procedure that has been used at the time-point.
1. An information processing device, comprising:
a storage device configured to include an error correction circuit; and
a processor configured:
to perform a test of the storage device according to a predetermined testing procedure;
to record a first time-point at which error correction of the storage device has been performed by the error correction circuit during performance of the test;
to determine, with predetermined accuracy, a first position within the storage device on which the error correction has been performed, based on a test speed at which the test is performed, a first time-period from the first time-point to current time, and a second position within the storage device on which the test is being performed at the current time; and
to perform the test predetermined times on a first range included in the storage device and including the first position, according to a testing procedure that has been used at the first time-point.
2. The information processing device of claim 1 , wherein
when the processor performs, in parallel, a plurality of the tests on plural ranges in the storage device, the processor synchronizes starts of the plurality of the tests that are to be performed in parallel on the plural ranges including the first range.
3. The information processing device of claim 1 , wherein
when the processor performs the test plural times under a condition that is changed among a plurality of conditions each time the test is executed, the processor determines a test condition under which the test has been performed at the first time-point, based on the test speed and the first time-period.
4. A testing method executed by a computer, the testing method comprising:
performing a test of a storage device including an error correction circuit, according to a predetermined testing procedure;
recording a first time-point at which error correction of the storage device is performed by the error correction circuit during performance of the test;
determining, with predetermined accuracy, a first position within the storage device on which the error correction has been performed, based on a test speed at which the test is performed, a first time-period from the first time-point to current time, and a second position within the storage device on which the test is being performed at the current time; and
performing the test predetermined times on a first range included in the storage device and including the first position, according to a testing procedure that has been used at the first time-point.
5. The testing method of claim 4 , further comprising:
when performing in parallel a plurality of the tests on plural ranges in the storage device, synchronizing starts of the plurality of the tests that are to be performed in parallel on the plural ranges including the first range.
6. The testing method of claim 4 , further comprising:
when performing the test plural times under a condition that is changed among a plurality of conditions each time the test is performed, determining a test condition under which the test has been performed at the first time-point, based on the test speed and the first time-period.
7. A non-transitory computer readable recording medium having stored therein a program for causing a computer to execute a process comprising:
performing a test of a storage device including an error correction circuit, according to a predetermined testing procedure;
recording a first time-point at which error correction of the storage device has been performed by the error correction circuit during performance of the test;
determining, with predetermined accuracy, a first position within the storage device on which the error correction has been performed, based on a test speed at which the test is performed, a first time-period from the first time-point to current time, and a second position within the storage device on which the test is being performed at the current time; and
performing the test predetermined times on a first range included in the storage device and including the first position, according to a testing procedure that has been used at the first time-point.
8. The non-transitory computer readable recording medium of claim 7 , wherein the procedure further includes
when performing in parallel a plurality of the tests on plural ranges in the storage device, synchronizing starts of the plurality of the tests that are to be performed in parallel on the plural ranges including the first range.
9. The non-transitory computer readable recording medium of claim 7 , wherein the process further includes
when performing the test plural times under a condition that is changed among a plurality of conditions each time the test is performed, determining a test condition under which the test has been performed at the first time-point, based on the test speed and the first time-period.