IP Library Patent Application 13913721
Patent Application
App. No. 13/913,721

COMPOSITION AND METHOD FOR POLISHING MOLYBDENUM

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Patent No.
US None
App. No.
13/913,721
Abstract

The present invention provides compositions and methods for polishing a molybdenum metal-containing surface. A polishing composition (slurry) described herein comprises an abrasive concentration of an inorganic particulate abrasive material (e.g., alumina or silica) suspended in an acidic aqueous medium containing a water soluble surface active material and an oxidizing agent. The surface active material is selected based on the zeta potential of the particulate abrasive, such that when the abrasive has a positive zeta potential, the surface active material comprises a cationic material, and when the particulate abrasive has a negative zeta potential, the surface active material comprises an anionic material, a nonionic material, or a combination thereof.

Claims (32)

1 . An aqueous chemical-mechanical polishing (CMP) composition for polishing a molybdenum-containing substrate, the composition comprising an aqueous carrier having a pH in the range of about 3 to about 6 and containing, at point of use:

(a) a particulate abrasive selected from the group consisting of a silica abrasive and an alumina abrasive;

(b) a water soluble surface active material; and

(c) an oxidizing agent;

wherein the surface active material is selected based on the zeta potential of the particulate abrasive, such that when the abrasive has a positive zeta potential, the surface active material comprises a cationic material, and when the particulate abrasive has a negative zeta potential, the surface active material comprises an anionic material, a nonionic material, or a combination thereof.

2 . The CMP composition of claim 1 wherein the particulate abrasive comprises alpha-alumina and the surface active agent is a cationic material.

3 . The CMP composition of claim 2 wherein the cationic material is a cationic polymer.

4 . The CMP composition of claim 3 wherein the cationic polymer comprises a poly(methacryloxyethyltrimethylammonium) halide.

5 . The CMP composition of claim 3 wherein oxidizing agent comprises hydrogen peroxide.

6 . The CMP composition of claim 1 wherein the particulate abrasive comprises silica and the surface active material is an anionic material, a nonionic material or a combination thereof.

7 . The CMP composition of claim 6 wherein the surface active material comprises a poly(acrylic acid), a polyacrylamide, or a combination thereof.

8 . The CMP composition of claim 6 wherein oxidizing agent comprises hydrogen peroxide.

9 . The CMP composition of claim 1 wherein the particulate abrasive comprises an aminosilane surface-treated silica having a positive zeta potential, and the surface active material comprises cationic material.

10 . The CMP composition of claim 9 wherein the cationic material is a cationic polymer.

11 . The CMP composition of claim 10 wherein the cationic polymer comprises a poly(methacryloxyethyl trimethylammonium) halide.

12 . The CMP composition of claim 9 wherein oxidizing agent comprises hydrogen peroxide.

13 . The CMP composition of claim 1 wherein oxidizing agent comprises hydrogen peroxide.

14 . An aqueous chemical-mechanical polishing (CMP) composition for polishing molybdenum, the composition comprising an aqueous carrier having a pH in the range of about 3 to about 6 and containing, at point of use:

(a) about 0.5 to about 6 wt % of a particulate abrasive selected from the group consisting of a silica abrasive and an alumina abrasive;

(b) about 25 to about 5,000 ppm of a water soluble surface active material; and

(c) about 0.1 to about 1.5 wt % of an oxidizing agent.

wherein the surface active material is selected based on the zeta potential of the particulate abrasive, such that when the abrasive has a positive zeta potential, the surface active material comprises a cationic material, and when the particulate abrasive has a negative zeta potential, the surface active material comprises an anionic material, a nonionic material, or a combination thereof.

15 . The CMP composition of claim 14 wherein the particulate abrasive comprises alpha-alumina or an aminosilane surface-treated silica, and has a positive zeta potential, and the water soluble surface active material comprises a poly(methacryloyloxyethyl trimethylammonium) halide.

16 . The CMP composition of claim 15 wherein oxidizing agent comprises hydrogen peroxide.

17 . The CMP composition of claim 14 wherein the particulate abrasive comprises a silica having a negative zeta potential, and the water soluble surface active material comprises a poly(acrylic acid), a polyacrylamide, or a combination thereof.

18 . The CMP composition of claim 17 wherein oxidizing agent comprises hydrogen peroxide.

19 . A chemical-mechanical polishing (CMP) method for polishing a molybdenum-containing substrate, the method comprising the steps of:

(a) contacting a surface of the substrate with a polishing pad and an aqueous CMP composition of claim 1 ; and

(b) causing relative motion between the polishing pad and the substrate while maintaining a portion of the CMP composition in contact with the surface between the pad and the substrate for a time period sufficient to abrade at least a portion of the molybdenum from the substrate.

20 . A chemical-mechanical polishing (CMP) method for polishing a molybdenum-containing substrate, the method comprising the steps of:

(a) contacting a surface of the substrate with a polishing pad and an aqueous CMP composition of claim 14 ; and

(b) causing relative motion between the polishing pad and the substrate while maintaining a portion of the CMP composition in contact with the surface between the pad and the substrate for a time period sufficient to abrade at least a portion of the molybdenum from the substrate.

Assignments (1)
ASSIGNMENT OF ASSIGNOR'S INTEREST Recorded Jun 23, 2014
From: SINGH, PANKAJ; JONES, LAMON
To: CABOT MICROELECTRONICS CORPORATION
Reel/Frame 033160/0444 →