Method and apparatus for processing image

1. A method of processing an image, the method comprising:

offsetting aliasing by analyzing frequency characteristics of at least one color channel and a near-infrared (NIR) channel, of a multi-spectral filter array (MSFA) pattern image;

generating a high resolution base image by amplifying resolutions of the at least one color channel and the NIR channel, from which the aliasing is removed, up to a resolution of a base image using a windowed-sinc function; and

offsetting an artifact from the high resolution base image by weighting and combining the high resolution base image and a blur image obtained by blurring the high resolution base image, based on a pixel difference value between the blur image and the high resolution base image,

wherein a cutoff frequency w c of the windowed-sinc function is set based on a tanh function using a local variance of the MSFA pattern image as a variable.

2. The method of claim 1 , wherein the offsetting of the aliasing comprises combining the at least one color channel and the NIR channel of the MSFA pattern image, while considering different phase characteristics of the at least one color channel and the NIR channel.

3. The method of claim 1 , wherein the cutoff frequency w c is equal to or greater than 0.5Π.

4. The method of claim 1 , wherein the cutoff frequency w c of the windowed-sinc function is adaptively set according to statistical characteristics of a location region obtained from the MSFA pattern image, and

when the local variance is high, the cutoff frequency w c is set to increase a pass-band of the windowed-sinc function, and

when the local variance is low, the cutoff frequency w c is set to decrease the pass-band of the windowed-sinc function.

5. The method of claim 1 , wherein Base(i,j)=(Gs(i,j)+Ns(i,j)+Rs(i,j)+Bs(i,j))*Sinc(i,j),

wherein Rs(i,j), Gs(i,j), and Bs(i,j) denote the at least one color channel of the MSFA pattern image, Ns(i,j) denotes the NIR channel of the MSFA pattern image,

the aliasing is removed via a sum of the at least one color channel and the NIR channel, and the resolutions of the at least one color channel and the NIR channel are amplified up to the resolution of the base image via the windowed-sinc function.

6. The method of claim 1 , wherein the cutoff frequency w c of the windowed-sinc function is adaptively set according to:

ω

c

adap

=

ω

c

high

-

ω

c

low

max

⁡

(

σ

local

2

)

-

min

⁡

(

σ

local

2

)

×

(

x

)

+

ω

c

low

,

wherein x is set according to:

x

=

max

⁡

(

σ

local

2

)

2

×

tanh

⁡

(

p

max

⁡

(

σ

local

2

)

⁢

σ

local

2

-

k

)

,

wherein x is an input for obtaining the cutoff frequency w c , and denotes a variance of the local region adjusted according to an s-curve (tan h) weight, and p and k are factors for adjusting the local region variance.

7. The method of claim 1 , wherein the offsetting of the artifact comprises offsetting the artifact by weighting and combining the blur image and the high resolution base image,

wherein,

when many artifacts are observed, weighting the blur image more,

when few artifacts are observed, weighting the high resolution base image more, and

a sum of weights of the blur image and the high resolution base image is 1.

8. A method of processing an image, the method comprising:

offsetting aliasing by analyzing frequency characteristics of at least one color channel and a near-infrared (NIR) channel, of a multi-spectral filter array (MSFA) pattern image, and combining the at least one color channel and the NIR channel such that phase characteristics of the at least one color channel and the NIR channel offset each other;

generating a high resolution base image by amplifying resolutions of the at least one color channel and the NIR channel, from which the aliasing is removed, up to a resolution of a base image using a windowed-sinc function, wherein a cutoff frequency w c of the windowed-sinc function is adaptively set according to statistical characteristics of a local region obtained from the MSFA pattern image and is set based on a tan h function using a local variance of the MSFA pattern image as a variable; and

offsetting an artifact of the high resolution base image by weighting and combining the high resolution base image and a blur image obtained by blurring the high resolution base image, based on a pixel difference value between the blur image and the high resolution base image.

9. The method of claim 8 , wherein Base(i,j)=(Gs(i,j)+Ns(i,j)+Rs(i,j)+Bs(i,j))*Sinc(i,j),

wherein Rs(i,j), Gs(i,j), and Bs(i,j) denote the at least one color channel of the MSFA pattern image, Ns(i,j) denotes the NIR channel of the MSFA pattern image, the aliasing is removed via a sum of the at least one color channel and the NIR channel, and the resolutions of the at least one color channel and the NIR channel are amplified up to the resolution of the base image via the windowed-sinc function.

10. The method of claim 8 , wherein the cutoff frequency w c of the windowed-sinc function is adaptively set according to statistical characteristics of a location region obtained from the MSFA pattern image, and

when the local variance is high, the cutoff frequency w c is set to increase a pass-band of the windowed-sinc function, and

when the local variance is low, the cutoff frequency w c is set to decrease the pass-band of the windowed-sinc function.

11. The method of claim 8 , wherein the cutoff frequency we of the windowed-sinc function is adaptively set according to:

ω

c

adap

=

ω

c

high

-

ω

c

low

max

⁡

(

σ

local

2

)

-

min

⁡

(

σ

local

2

)

×

(

x

)

+

ω

c

low

,

wherein x is set according to:

x

=

max

⁡

(

σ

local

2

)

2

×

tanh

⁡

(

p

max

⁡

(

σ

local

2

)

⁢

σ

local

2

-

k

)

,

wherein x is an input for obtaining the cutoff frequency w c and denotes a variance of the local region adjusted according to an s-curve (tan h) weight, and p and k are factors for adjusting the local region variance.

12. The method of claim 8 , wherein the offsetting of the artifact comprises offsetting the artifact by weighting and combining the blur image and the high resolution base image,

wherein,

when many artifacts are observed, weighting the blur image more,

when few artifacts are observed, weighting the high resolution base image more, and

a sum of weights of the blur image and the high resolution base image is 1.

13. An apparatus for processing an image, the apparatus comprising:

an aliasing offset unit configured to offset aliasing by analyzing frequency characteristics of at least one color channel and a near-infrared (NIR) channel, of a multi-spectral filter array (MSFA) pattern image;

a high resolution base image generator configured to generate a high resolution base image by amplifying resolutions of the at least one color channel and the NIR channel from which the aliasing is removed, up to a resolution of a base image using a windowed-sinc function; and

an artifact offset unit configured to offset an artifact from the high resolution base image by weighting and combining the high resolution base image and a blur image obtained by blurring the high resolution base image, based on a pixel difference value between the blur image and the high resolution base image,

wherein a cutoff frequency w c of the windowed-sinc function is set based on a tan h function using a local variance of the MSFA pattern image as a variable,

wherein the apparatus comprises at least one processor configured to implement the aliasing offset unit and the artifact offset unit.

14. The apparatus of claim 13 , wherein the aliasing offset unit combines the at least one color channel and the NIR channel of the MSFA pattern image, while considering different phase characteristics of the at least one color channel and the NIR channel.

15. The apparatus of claim 13 , wherein the cutoff frequency w c of the windowed-sinc function is adaptively set according to statistical characteristics of a location region obtained from the MSFA pattern image, and

when the local variance is high, the cutoff frequency w c is set to increase a pass-band of the windowed-sinc function, and

when the local variance is low, the cutoff frequency w c is set to decrease the pass-band of the wind owed-sinc function.

16. The apparatus of claim 13 , wherein the artifact offset unit offsets the artifact by weighting and combining the blur image and the high resolution base image,

wherein,

when many artifacts are observed, weighting the blur image more,

when few artifacts are observed, weighting the high resolution base image more, and

a sum of weights of the blur image and the high resolution base image is 1.

17. An apparatus for processing an image, the apparatus comprising:

an aliasing offset unit configured to offset aliasing by analyzing frequency characteristics of at least one color channel and a near-infrared (NIR) channel, of a multi-spectral filter array (MSFA) pattern image, and combining the at least one color channel and the NIR channel such that phase characteristics of the at least one color channel and the NIR channel offset each other;

a high resolution base image generator configured to generate a high resolution base image by amplifying resolutions of the at least one color channel and the NIR channel, from which the aliasing is removed, up to a resolution of a base image using a windowed-sinc function, wherein a cutoff frequency w c of the windowed-sinc function is adaptively set according to statistical characteristics of a local region obtained from the MSFA pattern image and is set based on a tan h function using a local variance of the MSFA pattern image as a variable; and

an artifact offset unit configured to offset an artifact of the high resolution base image by weighting and combining the high resolution base image and a blur image obtained by blurring the high resolution base image, based on a pixel difference value between the blur image and the high resolution base image.