Optical projector with beam monitor including sensing intensity of beam pattern not projected toward an object
Optical apparatus includes a device package, with a radiation source contained in the package and configured to emit a beam of coherent radiation. A diffractive optical element (DOE) is mounted in the package so as to receive and diffract the radiation from the radiation source into a predefined pattern comprising multiple diffraction orders. An optical detector is positioned in the package so as to receive and sense an intensity of a selected diffraction order of the DOE.
1. Optical apparatus, comprising:
a device package;
a radiation source, contained in the package and configured to emit a beam of coherent radiation;
a diffractive optical element (DOE), mounted in the package so as to receive and diffract the radiation from the radiation source into a predefined pattern comprising multiple diffraction orders that are projected from the package toward an object; and
an optical detector, which is positioned in the package so as to receive and sense an intensity of a portion of the pattern that is produced by the DOE but is not projected toward the object.
2. The apparatus according to claim 1 , wherein the optical detector is configured to output a signal that is responsive to the intensity, and comprising a controller, which is coupled to receive and process the signal so as to monitor a performance of the apparatus.
3. The apparatus according to claim 2 , wherein the controller is configured to inhibit an operation of the apparatus when the signal is outside a predefined range.
4. The apparatus according to claim 3 , wherein the diffraction orders projected toward the object include a zero order, and wherein the signal is indicative of an intensity of the zero order, and the controller is configured to inhibit the operation of the apparatus when the signal indicates that the intensity of the zero order has increased.
5. The apparatus according to claim 1 , wherein the radiation source comprises a laser diode.
6. The apparatus according to claim 1 , wherein the portion of the pattern received by the optical detector comprises a zero order of the DOE.
7. The apparatus according to claim 6 , wherein the optical detector is positioned so as to receive the zero order that is reflected back from the DOE.
8. The apparatus according to claim 7 , wherein the DOE is tilted relative to an axis of the beam emitted by the radiation source so as to direct the back-reflected zero order toward the optical detector.
9. The apparatus according to claim 1 , wherein the portion of the pattern received by the optical detector comprises a high order of the DOE.
10. The apparatus according to claim 9 , wherein the apparatus is configured to project the pattern over a predefined angular range, and wherein the optical detector is positioned to receive the radiation transmitted through the DOE at an angle that is outside the angular range.
11. An optical method, comprising:
transmitting a beam of coherent radiation through a diffractive optical element (DOE), mounted in a package, so as to diffract the radiation into a predefined pattern comprising multiple diffraction orders that are projected from the package toward an object; and
monitoring a performance of the DOE by sensing, using an optical detector positioned in the package, an intensity of a portion of the pattern that is produced by the DOE but is not projected toward the object.
12. The method according to claim 11 , wherein monitoring the performance comprises generating a signal that is responsive to the intensity, and processing the signal so as to monitor the performance.
13. The method according to claim 12 , and comprising inhibiting the beam when the signal is outside a predefined range.
14. The method according to claim 13 , wherein the diffraction orders projected toward the object include a zero order, and wherein the signal is indicative of an intensity of the zero order, and wherein the beam is inhibited when the signal indicates that the intensity of the zero order has increased.
15. The method according to claim 11 , wherein the radiation source comprises a laser diode.
16. The method according to claim 11 , wherein the portion of the pattern received by the optical detector comprises a zero order of the DOE.
17. The method according to claim 16 , wherein monitoring the performance comprises receiving and measuring the zero order that is reflected back from the DOE.
18. The method according to claim 17 , wherein the DOE is tilted relative to an axis of the beam emitted by the radiation source so as to direct the back-reflected zero order toward the optical detector.
19. The method according to claim 11 , wherein the portion of the pattern received by the optical detector comprises a high order of the DOE.
20. The method according to claim 19 , wherein the DOE is configured to project the pattern over a predefined angular range, and wherein monitoring the performance comprises receiving and measuring the radiation transmitted through the DOE at an angle that is outside the angular range.