IP Library Granted Patent US 8,749,764
Granted Patent B2
US 8,749,764 · App. 13/939,197 · Granted Jun 10, 2014

Distance-measuring device of measuring distance according to variation of imaging location and calibrating method thereof

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Quick Facts
Patent No.
US 8,749,764
App. No.
13/939,197
Granted
Jun 10, 2014
Kind
B2
Abstract

A distance-measuring device is utilized for measuring a measured distance between a measured object and the distance-measuring device. The distance-measuring device reduces the effect of a background light and a flicking light by removing the part corresponding to the background light and the flicking light from light-sensed signals generated by an image sensor of the distance-measuring device. In addition, the distance-measuring device calculates a calibrating parameter for calibrating an assemble-error angle of the distance-measuring device, according to an imaging location of a reflective light obtained by measuring a calibrating object with a predetermined distance. In this way, the distance-measuring device can correctly calculate out the measured distance.

Claims (27)

1. A calibrating method for calibrating a distance-measuring device of measuring distance according to variation of imaging location, a lighting component of the distance-measuring device emitting a detecting light to a measured object, the measured object reflecting the detecting light to an image sensor of the distance-measuring device for imaging at a first imaging location, the distance-measuring device calculating a measured distance between the measured object and the distance-measuring device according to the first imaging location, a focus length of a first lens of the distance-measuring device, and a predetermined distance between the lighting component and the image sensor, the calibrating method comprising:

the lighting component of the distance-measuring device emitting the detecting light to a calibrating object, and the calibrating object reflecting the detecting light to the image sensor of the distance-measuring device for imaging at a second imaging location;

wherein a distance between the distance-measuring device and the calibrating object is a known distance;

calculating a calibrating parameter for calibrating an assembling-error angle according to the known distance and the second imaging location; and

the distance-measuring device calculating the calculated measured distance according to the calibrating parameter.

2. The calibrating method of claim 1 , wherein calculating the calibrating parameter for calibrating the assembling-error angle according to the known distance, the second imaging location comprises:

calculating the calibrating parameter for calibrating a lighting-error angle rotated by the detecting light of the lighting-component of the distance-measuring device according to the known distance and the second imaging location.

3. The calibrating method of claim 2 , wherein the calibrating parameter, which is utilized for calibrating the lighting-error angle rotated by the detecting light of the lighting-component of the distance-measuring device according to the known distance and the second imaging location, is calculated according to a following formula:

D C1 =1/[1/( D F ×L )× D CSI +B];

wherein D C1 represents the known distance; D CSI represents the second imaging location; B represents the calibrating parameter; D F represent the focus length of the first lens; L represent the predetermined distance between the lighting component and the image sensor.

4. The calibrating method of claim 2 , wherein relation between the calibrating parameter and the lighting-error angle is represented as a following formula:

B =tan θ LD /L;

Wherein θ LD represents the lighting-error angle.

5. The calibrating method of claim 3 , wherein when the measured distance is calculated according to a following formula:

D M =1/[1/( D F ×L )× D CS +B]

wherein D M represents the measured distance; D CS represents the first imaging location of the reflecting light when the measured object is measured.

6. The calibrating method of claim 1 , wherein calculating the calibrating parameter for calibrating the assembling-error angle according to the known distance, the second imaging location comprises:

calculating the calibrating parameter for calibrating a first sensing-error angle and a second sensing-error angle of the image sensor of the distance-measuring device according to the known distance and the second imaging location.

7. The calibrating method of claim 6 , wherein the calibrating parameter, which is utilized for calibrating the first sensing-error angle and the second sensing-error angle of the image sensor of the distance-measuring device according to the known distance and the second imaging location, is calculated according to a following formula:

D C2 =1/( A×D CSJ );

wherein D C2 represents the known distance; D CSJ represents the second imaging location; A represents the calibrating parameter.

8. The calibrating method of claim 7 , wherein relation among the calibrating parameter, the first sensing-error angle, and the second sensing-error angle is represented as a following formula:

A =(cos θ CS2 ×cos θ CS1 )/( D F ×L );

wherein θ CS1 represents the first sensing-error angle; θ CS2 represents the second sensing-error angle; D F represent the focus length of the first lens; L represent the predetermined distance between the lighting component and the image sensor.

9. The calibrating method of claim 7 , wherein the measured distance is calculated according to a following formula:

D M =1/( A×D CS );

wherein D M represents the measured distance; D CS represents the first imaging location of the reflecting light when the measured object is measured.

Assignments (2)
ASSIGNMENT OF ASSIGNOR'S INTEREST Recorded Sep 11, 2018
From: PIXART IMAGING INC.
To: SAMSUNG ELECTRONICS CO., LTD.
Reel/Frame 046838/0798 →
ASSIGNMENT OF ASSIGNOR'S INTEREST Recorded Jul 11, 2013
From: HSU, EN-FENG; LIAO, CHI-CHIEH; LU, CHIH-HUNG; SU, TSUNG-YI
To: PIXART IMAGING INC.
Reel/Frame 030772/0966 →