Thermal processing of interconnects
Various embodiments include methods of fabricating an interconnect for a fuel cell stack. Methods for controlled pre-oxidation of an interconnect include oxidizing in a nitride-inhibiting environment to inhibit the formation of nitrides.
1. A method of oxidizing an interconnect for a fuel cell stack, comprising:
subjecting the interconnect to an initial oxidation treatment at a first temperature in a nitride-inhibiting environment comprising at least 10% oxygen, to form a first oxide layer on at least a surface of the interconnect, the interconnect comprising more than 90% chromium and less than 10% iron; and
subjecting the interconnect to a secondary oxidation treatment, in air, and at a second temperature of between about 850° C. and about 1100° C., to cover surfaces of exposed pores of the interconnect with a second oxide layer, such that the exposed pores are at least 15% filled with oxide material.
2. The method of claim 1 , wherein the initial oxidation treatment is performed in pure oxygen.
3. The method of claim 1 , wherein the first temperature is between about 850° C. and 1100° C.
4. The method of claim 1 , wherein the nitride-inhibiting environment is provided by providing an oxidizing gas that contains no intentionally introduced nitrogen.
5. The method of claim 4 , wherein the oxidizing gas comprises a mixture of oxygen and an inert gas.
6. The method of claim 1 , wherein the nitride-inhibiting environment is provided by providing an oxidizing gas that is less than about 50% nitrogen.
7. The method of claim 6 , wherein the oxidizing gas comprises a mixture of air and one or more of oxygen and an inert gas.
8. The method of claim 1 , wherein the nitride-inhibiting environment is provided by maintaining the interconnect at a first temperature at which nitrides do not form on the interconnect during the initial oxidation treatment.
9. The method of claim 8 , wherein the first temperature is maintained between about 700° C. and 800° C.
10. The method of claim 9 , wherein the first temperature is maintained at about 750° C.
11. The method of claim 1 , wherein the nitride-inhibiting environment inhibits the growth of chromium nitride on a surface of the interconnect.
12. The method of claim 1 , wherein the first oxide layer comprises a chromium oxide material.
13. The method of claim 1 , wherein the interconnect comprises at least 95% chromium and 4-5% iron.
14. A method of oxidizing an interconnect for a fuel cell stack, comprising:
subjecting the interconnect to an oxidation treatment at a first temperature in a nitride-inhibiting environment comprising at least 10% oxygen, to form a first oxide layer on at least a surface of the interconnect, the interconnect comprising more than 90% chromium and less than 10% iron,
wherein the nitride-inhibiting environment is provided by flowing oxidizing gas over the interconnect during the initial oxidation treatment.
15. The method of claim 14 , further comprising subjecting the interconnect to a secondary oxidation treatment, in air, and at a second temperature between about 850° C. and about 1100° C. to cover surfaces of exposed pores of the interconnect with a second oxide layer, such that the exposed pores are at least 15% filled with oxide material.
16. The method of claim 15 , wherein the interconnect is hung within a processing chamber to provide the interconnect with access to the flowing oxidizing gas.
17. The method of claim 15 , wherein the interconnect is provided on or in contact with a porous or grooved support to provide the interconnect with access to moving oxidizing gas.
18. The method of claim 15 , wherein the nitride-inhibiting environment comprises pure oxygen.