Nondestructive Inspection Techniques for Rotorcraft Composites

1 . An apparatus, comprising:

an infrared camera configured to capture an infrared image of a composite component; and

a processing system coupled to the camera, wherein the processing system is configured to process the captured infrared image and determine whether a defect exists within the composite component.

2 . The apparatus of claim 1 , further comprising a user interface coupled to the processing system and configured to process the captured infrared image on a pixel-by-pixel basis and produce a processed image, wherein the processed image shows the defect better than the captured infrared image.

3 . The apparatus of claim 2 , wherein the processing system is configured to enhance the contrast of the captured infrared image using at least one of a first order derivative algorithm and a second order derivative algorithm.

4 . The apparatus of claim 2 , further comprising input and output devices coupled to the processing system and configured to communicate with an external device to transfer the captured infrared image, the processed image, or both.

5 . The apparatus of claim 2 , further comprising an environmental sensor coupled to the processing system and configured to detect an environmental factor and associate the environmental factor with the captured infrared image.

6 . The apparatus of claim 2 , further comprising location position sensing devices coupled to the processing system and configured to provide location based data.

7 . The apparatus of claim 1 , further comprising an emitter configured to emit infrared radiation onto the composite component at a first wavelength range, wherein the infrared camera captures images at a second wavelength range, and wherein the first wavelength range is different from the second wavelength range.

8 . The apparatus of claim 7 , wherein the first wavelength range comprises a wavelength from about 800 nanometers to about 2,500 nanometers.

9 . The apparatus of claim 8 , wherein the emitter is configured to emit infrared radiation comprising an intensity of at least about 200 watts per meter squared (W/m 2 ).

10 . The apparatus of claim 8 , wherein the emitter is physically integrated into the apparatus with the infrared camera and the processing system.

11 . The apparatus of claim 8 , wherein the second wavelength range comprises a wavelength from about 1,000 nanometers to about 2,000 nanometers.

12 . The apparatus of claim 8 , wherein the second wavelength range comprises a wavelength from about 3,000 nanometers to about 5,000 nanometers.

13 . The apparatus of claim 8 , wherein the second wavelength range comprises a wavelength from about 8,000 nanometers to about 12,000 nanometers.

14 . The apparatus of claim 1 , wherein the composite component is located on an aircraft.

15 . An apparatus, comprising:

an infrared camera configured to capture an infrared image of a composite component at a wavelength of at least one of: a range of about 1,000 to about 2,000 nanometers; a range of about 3,000 to about 5,000 nanometers; and a range of about 8,000 to about 12,000 nanometers;

a processing system coupled to the camera, wherein the processing system is configured to process the captured infrared image on a pixel-by-pixel basis and determine whether a defect exists within the composite component; and

a user interface coupled to the processing system and configured to process the captured infrared image on a pixel-by-pixel basis and produce a processed image, wherein the processed image shows the defect better than the captured infrared image.

16 . The apparatus of claim 15 , wherein the processing system is configured to enhance the contrast of the captured infrared image using a second order derivative algorithm.

17 . The apparatus of claim 15 , further comprising an emitter configured to emit infrared radiation at a wavelength between about 800 nanometers and about 2,500 nanometers onto the composite component.

18 . The apparatus of claim 16 , wherein the emitter is configured to emit infrared radiation comprising an intensity of at least about 200 watts per meter squared (W/m 2 ).

19 . The apparatus of claim 15 , wherein the composite component is located on an aircraft.

20 . A method comprising:

subjecting a composite component to infrared radiation;

capturing a thermal image of the composite component;

inspecting the captured thermal image for defects in the composite component; and

post-processing the thermal image using a second order derivative algorithm wherein the post-processed thermal image shows the defect better than the captured infrared image.

21 . The method of claim 20 , wherein the infrared radiation comprises a first wavelength between about 800 nanometers and about 2,500 nanometers and an intensity of at least about 200 watts per meter squared (W/m 2 ), and wherein the capturing the thermal image comprises capturing the thermal image at a first wavelength of at least one of: a range of about 1,000 to about 2,000 nanometers; a range of about 3,000 to about 5,000 nanometers; and a range of about 8,000 to about 12,000 nanometers.

22 . The method of claim 20 , further comprising: applying a high emissive black coating to the composite component prior to subjecting the composite component to infrared radiation.

23 . The method of claim 20 , wherein the capturing a thermal image of the composite component occurs at an offset angle of at least about 10 degrees from the infrared radiation.

24 . The method of claim 20 , wherein the composite component is located on an aircraft.