Granted Patent B2

US 8,664,995 · App. 13/962,191 · Granted Mar 4, 2014

Abstract

Claims (56)

1. A delay cell for a complementary metal oxide semiconductor (CMOS) integrated circuit (IC), the delay cell comprising:

a delay stage configured to generate a delayed output signal based on a provided input signal, the delayed output signal having a programmable delay through the delay cell, the delay cell having at least one of (i) a selectable delay value from a plurality of delay values and (ii) a selectable skew value of a rise time and fall time of an output signal of the delay cell, wherein the delay cell has a relatively uniform cell size and terminal layout over a range of the plurality of delay values and the range of skew values;

wherein the at least one of the selectable delay value and the selectable skew value are selected by modifying a single layer of a layout of the IC, without modifying the cell size and terminal layout of the delay stage, thereby achieving a delay cell having a substantially uniform cell size and terminal layout over the range of the plurality of delay values and the range of skew values.

2. The delay cell of claim 1 , wherein the single layer of the layout of the IC is a metal-1 layer of the layout of the IC.

3. The delay cell of claim 1 , wherein the selectable skew value is selected by configuring a drive strength for the output signal from the delay stage.

4. The delay cell of claim 3 , wherein the selectable drive strength of the output signal is configured to adjust a rise time and a fall time of the output signal of the delay cell uniformly, thereby providing balanced skew adjustment of the delay cell.

5. The delay cell of claim 3 , wherein the selectable drive strength of the output signal is configured to adjust a rise time and a fall time of the output signal of the delay cell independently, thereby providing unbalanced skew adjustment of the delay cell.

6. The delay cell of claim 1 , wherein the selectable delay value is selected by configuring a number of delay stages of the delay cell that are connected in series.

7. The delay cell of claim 6 , wherein the selectable skew value is adjusted by configuring a number of transistors of one or more of the delay stages of the delay cell.

8. The delay cell of claim 1 , wherein the delay cell is configured to be one of an inverting delay cell and a non-inverting delay cell.

9. The delay cell of claim 1 , wherein the delay cell comprises:

an input inverter stage comprising a PMOS and NMOS transistor pair, the input inverter stage configured to transfer an input signal of the delay cell to the delay stage;

an output inverter stage configured to generate a selectable drive strength for the output signal from the delay stage, thereby to provide an output signal of the delay cell as a delayed version of the input signal of the delay cell;

wherein the delay stage comprises:

M series-coupled inverter stages driven between first and second voltage potentials, M a positive integer, each series-coupled inverter stage comprising N transistor pairs of stacked PMOS transistors and stacked NMOS transistors, N a positive integer, a gate node of each of the stacked PMOS transistors and the stacked NMOS transistors coupled to an input of the inverter stage,

wherein the N transistor pairs comprise configurable source-drain node connections between a drain node and a source node of each transistor in the pair, wherein the selectable delay value corresponds to a configuration of coupled and de-coupled source-drain node connections to adjust a delay value of each of the M inverter stages, wherein:

when the configurable source-drain node connection is placed between the source node and the drain node of each transistor in one of the N transistor pairs of one of the M inverter stages, the delay value of the inverter stage is reduced, and

when the configurable source-drain node connection is removed from between the source node and the drain node of each transistor in one of the N transistor pairs of one of the M inverter stages, the delay value of the inverter stage is increased.

10. The delay cell of claim 9 , wherein:

when the configurable source-drain node connection is modified between the source node and the drain node of corresponding one or more transistors in a corresponding one of (i) stacked PMOS transistors and (ii) stacked NMOS transistors of one or more of the M inverter stages, the output skew value of the delay cell is adjusted.

11. The delay cell of claim 10 , wherein:

to increase an output rise time of the delay cell:

the configurable source-drain node connection is removed from one or more of (i) stacked PMOS transistors and (ii) stacked NMOS transistors of one or more of the M inverter stages correspond to a rising-edge output of the delay cell; and

the configurable source-drain node connection is placed for one or more of (i) stacked PMOS transistors and (ii) stacked NMOS transistors of one or more of the M inverter stages correspond to a falling-edge output of the delay cell;

to increase an output fall time of the delay cell:

the configurable source-drain node connection is placed for one or more of (i) stacked PMOS transistors and (ii) stacked NMOS transistors of one or more of the M inverter stages correspond to a rising-edge output of the delay cell; and

the configurable source-drain node connection is removed from one or more of (i) stacked PMOS transistors and (ii) stacked NMOS transistors of one or more of the M inverter stages correspond to a falling-edge output of the delay cell.

12. A method of configuring a programmable delay cell in a complementary metal oxide semiconductor (CMOS) integrated circuit (IC), the method comprising:

determining, in a timing tolerance analysis of the IC, whether one or more programmable delay cells require a modification to at least one of (i) a delay value of the programmable delay cell and (ii) an output skew value of the programmable delay cell;

if one or more programmable delay cells require a modified output skew value:

changing a drive strength for the output signal from the delay cell;

if one or more programmable delay cells require a modified delay value:

changing a number of delay stages of the delay cell that are connected in series,

wherein the at least one of the selectable delay value and the selectable skew value are selected by modifying a single layer of a layout of the IC, without modifying the cell size and terminal layout of the delay stage, thereby achieving a delay cell having a substantially uniform cell size and terminal layout over the range of the plurality of delay values and the range of skew values.

13. The method of claim 12 , wherein the single layer of the layout of the IC is a metal-1 layer of the layout of the IC.

14. The method of claim 12 , wherein changing the selectable drive strength of the output signal comprises adjusting a rise time and a fall time of the output signal of the delay cell uniformly, thereby providing balanced skew adjustment of the delay cell.

15. The method of claim 12 , wherein changing the selectable drive strength of the output signal comprises adjusting a rise time and a fall time of the output signal of the delay cell independently, thereby providing unbalanced skew adjustment of the delay cell.

16. The method of claim 12 , wherein selecting the selectable skew value further comprises configuring a number of transistors of one or more of the delay stages of the delay cell.

17. The method of claim 12 , further comprising:

generating an IC design layout comprising cell placement and signal routing;

performing a polysilicon gate critical dimension variation on the IC design layout; and

performing a timing analysis of the IC design layout.

18. The method of claim 17 , further comprising:

if one or more programmable delay cells require an increased delay value:

removing a configurable connection of one or more transistor pairs of one or more inverter stages of the programmable delay cell, wherein the configurable connection is a connection between a drain node and a source node of each transistor in the one or more transistor pairs, wherein the removing the configurable connections comprises modifying a metal-1 layer of the IC design layout;

if one or more programmable delay cells require a decreased delay value:

adding a configurable connection of one or more transistor pairs of one or more inverter stages of the programmable delay cell, wherein the configurable connection is a connection between a drain node and a source node of each transistor in the one or more transistor pairs, wherein the adding the configurable connections comprises modifying a metal-1 layer of the IC design layout; and

maintaining a relatively uniform cell size and a relatively uniform terminal layout for all delay values of the programmable delay cell.

19. The method of claim 17 , further comprising:

if one or more programmable delay cells require a modified output skew value:

determining whether one or more of a rise time and a fall time of an output signal of the delay cell should be modified;

if the rise time of the output signal should be modified:

changing one or more configurable connections in a metal-1 layout of the IC for each of the one or more programmable delay cells, so as to modify a rise time of each of the one or more programmable delay cells;

if the fall time of the output signal should be modified:

changing one or more configurable connections in a metal-1 layout of the IC for each of the one or more programmable delay cells, so as to modify a fall time of each of the one or more programmable delay cells; and

maintaining, by each programmable delay cell, a relatively uniform cell size and a relatively uniform terminal layout for all output skew values.

Assignments (7)