IP Library Granted Patent US 8,916,772
Granted Patent B2
US 8,916,772 · App. 13/962,291 · Granted Dec 23, 2014

Three-dimensional thin-film semiconductor substrate with through-holes and methods of manufacturing

Inventors: Mehrdad M. Moslehi (Los Altos, CA); David Xuan-Qi Wang (Fremont, CA)
Assignee: Solexel, Inc.
H01L31/03529H01L31/1804H01L31/035281H01L27/1427H01L31/0522Y02E10/547
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Quick Facts
Patent No.
US 8,916,772
App. No.
13/962,291
Granted
Dec 23, 2014
Kind
B2
Abstract

A three-dimensional thin-film semiconductor substrate with selective through-holes is provided. The substrate having an inverted pyramidal structure comprising selectively formed through-holes positioned between the front and back lateral surface planes of the semiconductor substrate to form a partially transparent three-dimensional thin-film semiconductor substrate.

Claims (16)

1. A three-dimensional thin-film semiconductor substrate for fabricating a partially transparent three-dimensional thin-film solar cell, comprising:

a plurality of top surface areas substantially aligned along a (100) crystallographic plane of the semiconductor substrate and defining a base opening of an inverted pyramidal surface cavity on said top surface of the semiconductor substrate;

a plurality of walls each substantially aligned along a (111) crystallographic orientation plane of the semiconductor substrate wherein said walls form a plurality of at least two differently sized three-dimensional inverted pyramidal cavities comprising a larger set of three-dimensional inverted pyramidal cavities and a smaller set of three-dimensional inverted pyramidal cavities wherein said larger set of inverted pyramidal cavities and said smaller set of inverted pyramidal cavities are arranged in a staggered pattern on said semiconductor substrate;

a plurality of selectively formed through-holes in said semiconductor substrate with openings having diagonals in the range of 50 to 300 microns and positioned between the front and back lateral surface planes of said semiconductor substrate which form a partially transparent three-dimensional thin-film semiconductor substrate,

wherein said semiconductor substrate has an inverted pyramidal structure with a layer thickness in the range of 1 to 60 microns and a substrate peak to peak thickness in the range of approximately 100 to 500 microns.

2. The three-dimensional thin-film semiconductor substrate of claim 1 , wherein said plurality of selectively formed through-holes in said semiconductor substrate are positioned in said smaller set of three-dimensional inverted pyramidal cavities on said semiconductor substrate.

3. The three-dimensional thin-film semiconductor substrate of claim 1 , wherein said plurality of selectively formed through-holes in said semiconductor substrate are positioned in said larger set of three-dimensional inverted pyramidal cavities on said semiconductor substrate.

4. The three-dimensional thin-film semiconductor substrate of claim 1 , wherein said plurality of selectively formed through-holes in said semiconductor substrate are positioned on the top surface areas on said semiconductor substrate.

5. A three-dimensional thin-film solar cell, comprising:

a plurality of at least two differently sized three-dimensional inverted pyramidal cavities comprising a larger set of three-dimensional inverted pyramidal cavities and a smaller set of three-dimensional inverted pyramidal cavities wherein said larger set of inverted pyramidal cavities and said smaller set of inverted pyramidal cavities are arranged in a staggered pattern on a semiconductor substrate;

a plurality of selectively formed through-holes in said semiconductor substrate with openings between the front and back lateral surface planes of said semiconductor substrate which form a partially transparent three-dimensional thin-film semiconductor substrate,

wherein said semiconductor substrate has an inverted pyramidal structure with a layer thickness in the range of 1 to 60 microns and a substrate peak to peak thickness in the range of approximately 100 to 500 microns;

a sunny side n-type doped emitter region positioned on the top surface of said semiconductor substrate and a front side surface passivation layer and an anti-reflection layer positioned on said emitter region;

a back surface field p-type doped base region positioned on the bottom surface of said semiconductor substrate and a back side surface passivation layer positioned on said base region;

a plurality of emitter metal contacts positioned on base openings of said inverted pyramidal cavities on said semiconductor substrate; and

a plurality of base metal contacts positioned on the bottom surface of said semiconductor substrate at the apex of said inverted pyramidal cavities on said semiconductor substrate.

Assignments (5)
ASSIGNMENT OF LOAN DOCUMENTS Recorded Sep 29, 2017
From: OPUS BANK
To: OB REALTY, LLC
Reel/Frame 044062/0383 →
CHANGE OF NAME Recorded Jul 28, 2017
From: SOLEXEL, INC.
To: BEAMREACH SOLAR, INC.
Reel/Frame 043367/0649 →
RECORDATION OF FORECLOSURE OF PATENT PROPERTIES Recorded Jul 27, 2017
From: OB REALTY, LLC
To: OB REALTY, LLC
Reel/Frame 043350/0822 →
CHANGE OF NAME Recorded Jul 26, 2017
From: SOLEXEL, INC.
To: BEAMREACH SOLAR, INC.
Reel/Frame 043342/0439 →
SECURITY INTEREST Recorded Jan 7, 2015
From: SOLEXEL, INC.
To: OPUS BANK
Reel/Frame 034731/0001 →
Continuity (4)
Continuation 12791842 · Jun 1, 2010
Provisional Application 61182635 · May 29, 2009
Provisional Application 61228068 · Jul 23, 2009
Related Publication 20130319520A1 · Dec 5, 2013