IP Library Granted Patent US 9,213,057
Granted Patent B2
US 9,213,057 · App. 13/962,990 · Granted Dec 15, 2015

Testing system and testing method for touch device

Inventors: Chien-Chuan Chen (Hsinchu Hsien, TW); Kai-Ting Ho (Hsinchu Hsien, TW); Yu-Chien Huang (Hsinchu Hsien, TW)
Assignee: MStar Semiconductor, Inc.
G01R31/28G01R31/2829G06F3/0416G01R31/2848G01R31/312
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Quick Facts
Patent No.
US 9,213,057
App. No.
13/962,990
Granted
Dec 15, 2015
Kind
B2
Abstract

A testing system for a touch device includes a touch simulation module, a control module and a determination module is provided. The touch simulation module includes multiple conductive elements respectively corresponding to multiple touch sensing regions of the touch device. The control module selectively provides a testing signal to one or multiple of the conductive elements. The determination module determines whether the touch device correctly responds a testing that the control module provides to the device under testing through the touch simulation module.

Claims (20)

1. A touch device testing system for testing a touch device, comprising:

a touch simulation module, comprising a plurality of conductive elements respectively corresponding to a plurality of touch sensing regions of the touch device, each conductive element spanning all sensing regions of the touch device along a predetermined axis;

a control module, coupled to the conductive elements, for generating and selectively providing a testing signal to one or a plurality of conductive elements among the conductive elements; and

a determination module, coupled to the touch device, for determining whether the touch device correctly responds to a testing that the control device applies to the touch sensing regions through the touch simulation module,

wherein the plurality of conductive elements cause capacitances changes in the plurality of touch sensing regions in response to the testing signal.

2. The testing system according to claim 1 , wherein the testing signal is at a ground potential.

3. The testing system according to claim 1 , wherein the control module sequentially provides the testing signal to the conductive elements.

4. The testing system according to claim 1 , wherein the conductive elements are a plurality of metal plates.

5. The testing system according to claim 1 , wherein the conductive elements are disposed at a surface of the touch simulation module.

6. The testing system according to claim 1 , wherein the touch device comprises a plurality of sensing electrodes of a self capacitive touch panel, and the touch sensing regions are formed by the sensing electrodes.

7. The testing system according to claim 6 , wherein the determination module determines whether the touch device correctly responds to the testing according to a sensed capacitance or position information generated by the touch device.

8. The testing system according to claim 6 , wherein the sensing electrodes have a planar shape similar to a scalene triangle, and a vertex and a base arranged in a staggered arrangement on a plane, with a shortest side of each of the sensing electrodes being parallel to a predetermined direction; the conductive elements are a plurality of strip-like conductive plates disposed in parallel; and when the touch simulation module is placed closely to the device under test to perform the testing, the strip-like conductive plates are also parallel to the predetermined direction.

9. A testing method for testing a touch device, comprising:

a) applying a touch simulation module closely to the touch device, wherein the touch simulation module comprises a plurality of conductive elements respectively corresponding a plurality of touch sensing regions of the touch device, each conductive element spanning all sensing regions of the touch device along a predetermined axis;

b) performing an auto-testing procedure of selectively generating and providing a testing signal to one or a plurality of conductive elements among the conductive elements; and

c) determining whether the touch device correctly responds to the auto-testing procedure,

wherein the plurality of conductive elements cause capacitances changes in the plurality of touch sensing regions in response to the testing signal.

10. The testing method according to claim 9 , wherein the testing signal is at a ground potential.

11. The testing method according to claim 9 , wherein step (b) sequentially provides the testing signal to the plurality of conductive elements among the conductive elements.

12. The testing method according to claim 9 , wherein step (c) determines whether the touch device correctly responds to the auto-testing procedure according to a sensed capacitance or position information generated by the touch device.

Assignments (2)
ASSIGNMENT OF ASSIGNOR'S INTEREST Recorded Nov 27, 2018
From: MSTAR SEMICONDUCTOR, INC.
To: ILI TECHNOLOGY CORP.
Reel/Frame 047597/0139 →
ASSIGNMENT OF ASSIGNOR'S INTEREST Recorded Aug 9, 2013
From: CHEN, CHIEN-CHUAN; HO, KAI-TING; HUANG, YU-CHIEN
To: MSTAR SEMICONDUCTOR, INC.
Reel/Frame 030974/0996 →
Priority Claims (1)
TW 101128846 A · Aug 9, 2012 · national
Continuity (1)
Related Publication 20140043038A1 · Feb 13, 2014