Semiconductor physical quantity detecting sensor

1. A semiconductor physical quantity detection sensor, comprising:

a first electrostatic capacitance that is formed by a movable electrode displaced by application of a physical quantity, and a first fixed electrode formed in a first conductive layer shared with the movable electrode;

a second electrostatic capacitance that is formed by the movable electrode, and a second fixed electrode formed in a second conductive layer different from the first conductive layer and different in a height from a substrate surface from the movable electrode; and

an arithmetic circuit, connected to the first and second electrostatic capacitances, that calculates the physical quantity based on a change in the first and second electrostatic capacitances generated when the physical quantity is applied,

wherein the change is determined based on an electric signal from the first electrostatic capacitance and an electric signal from the second electrostatic capacitance that are input to the arithmetic circuit.

2. The semiconductor physical quantity detection sensor according to claim 1 ,

wherein the arithmetic circuit calculates an absolute value of a displacement of the movable portion according to a change in the first electrostatic capacitance, and

wherein the arithmetic circuit calculates an orientation of the displacement of the movable portion according to a change in the second electrostatic capacitance.

3. The semiconductor physical quantity detection sensor according to claim 1 ,

wherein the electric signal from the first electrostatic capacitance and the electric signal from the second electrostatic capacitance are input to a capacitance change detector of the arithmetic circuit.

4. The semiconductor physical quantity detection sensor according to claim 1 , comprising:

a laminated substrate in which a silicon active layer is formed on a support substrate through an insulating oxide layer,

wherein the movable electrode and the first fixed electrode are formed in the silicon active layer, and

wherein the second fixed electrode is formed in the second conductive layer dielectrically isolated from the movable electrode.

5. The semiconductor physical quantity detection sensor according to claim 4 ,

wherein the second conductive layer is the support substrate.

6. The semiconductor physical quantity detection sensor according to claim 4 ,

wherein the first conductive layer is an electrically conductive layer formed on a surface of the silicon active layer to be dielectrically isolated from the movable electrode.

7. The semiconductor physical quantity detection sensor according to claim 4 ,

wherein the first conductive layer is an electrically conductive layer formed on a surface of a cap member arranged on a surface of the silicon active layer to be dielectrically isolated from the movable electrode.

8. A semiconductor physical quantity detection sensor, comprising:

a first electrostatic capacitance that is formed by a movable electrode displaced by application of a physical quantity, and a first fixed electrode formed in a first conductive layer shared with the movable electrode;

a second electrostatic capacitance that is formed by the movable electrode, and a second fixed electrode formed in a second conductive layer different from the first conductive layer and different in a height from a substrate surface from the movable electrode; and

an arithmetic circuit, connected to the first and second electrostatic capacitances, that calculates the physical quantity based on a change in the first and second electrostatic capacitances generated when the physical quantity is applied,

wherein the change is determined based on an electric signal from the first electrostatic capacitance and an electric signal from the second electrostatic capacitance are input to the arithmetic circuit, and

wherein a same center voltage is applied to the movable electrode and the second fixed electrode.