Particle manipulation system with out-of-plane channel and focusing element
View Patent ↗A particle manipulation system uses a MEMS-based, microfabricated particle manipulation device which has an inlet channel, output channels, and a movable member formed on a substrate. The movable member moves parallel to the fabrication plane, as does fluid flowing in the inlet channel. The movable member separates a target particle from the rest of the particles, diverting it into an output channel. However, at least one output channel is not parallel to the fabrication plane. The device may be used to separate a target particle from non-target material in a sample stream. The target particle may be, for example, a stem cell, zygote, a cancer cell, a T-cell, a component of blood, bacteria or DNA sample, for example. The particle manipulation system may also include a microfluidic structure which focuses the target particles in a particular portion of the inlet channel.
1. A micromechanical particle manipulation device, formed on a surface of a substrate, comprising:
a microfabricated, movable member formed on a surface of the substrate in a first plane, and having a first diverting surface, wherein the movable member moves from a first position to a second position in response to a force applied to the movable member, wherein the motion is substantially in the first plane parallel to the surface of the substrate;
a sample inlet channel formed in the substrate and through which a fluid flows, the fluid including target particles and non-target material, wherein the flow in the sample inlet channel is substantially in the first plane parallel to the surface of the substrate;
a sort output channel into which the microfabricated member diverts the target particles and a waste output channel into which the non-target material flows, and wherein the waste output channel is in a second, different plane than the movable member and the sample inlet channel, and wherein the waste output channel is located directly below at least a portion of the microfabricated member over at least a portion of its motion; and
a sheath fluid inlet in fluid communication with the sample channel; and
a focusing element coupled to the sheath fluid inlet, which is configured to urge the target particles into a particular portion of the sample channel.
2. The micromechanical particle manipulation device of claim 1 , wherein focusing element comprises a z-focus channel, wherein the z-focus channel curves in an arc of about 180 degree from the sheath fluid inlet, and urges the target particles into substantially a single plane.
3. The micromechanical particle manipulation device of claim 2 , wherein the z-focus channel has a radius of curvature of at least about 100 microns and less than about 500 microns.
4. The micromechanical particle manipulation device of claim 1 , wherein the focusing element is disposed in the same plane as the movable member, and formed in the same substrate.
5. The micromechanical particle manipulation device of claim 2 , wherein the inlet channel and z-focus channel both have characteristic dimensions of about 50 microns.
6. The micromechanical particle manipulation device of claim 2 , further comprising a y-intersection point at which the target particles are compressed from the plane to a stream line near the center of the z-focus channel.
7. The micromechanical particle manipulation device of claim 6 , wherein the y-intersection point occurs where two flows join the z-focus channel from substantially antiparallel directions, and each substantially orthogonal to the z-focus channel at the y-intersection point.
8. The micromechanical particle manipulation device of claim 1 , wherein the target particles are at least one of a stem cell, a cancer cell, a zygote, a protein, a T-cell, a bacteria, a component of blood, and a DNA fragment.
9. The micromechanical particle manipulation device of claim 1 , wherein the first diverting surface has a shape which is substantially tangent to the direction of flow in the input channel at one point on the shape and substantially tangent to the direction of flow of the first output channel at a second point on the shape, and wherein the first diverting surface diverts flow from the input channel into a first output channel when the movable member is in the first position, and allows the flow into the second output channel in the second position.
10. The micromechanical particle manipulation device of claim 1 , wherein the plurality of output channels comprises a sort channel and a waste channel, wherein flow in the sort channel is substantially antiparallel to flow in the input channel, and wherein flow in the waste channel is substantially orthogonal to flow in the input channel and the sort channel.
11. The micromechanical particle manipulation device of claim 1 , further comprising: a first permeable magnetic material inlaid in the movable member;
a first stationary permeable magnetic feature disposed on the substrate; and
a first source of magnetic flux external to the movable member and substrate on which the movable member is formed.
12. The micromechanical particle manipulation device of claim 11 , wherein the movable member moves from the first position to the second position when the source of magnetic flux is activated.
13. The micromechanical particle manipulation device of claim 1 , wherein the force is at least one of magnetic, electrostatic, and piezoelectric.
14. A particle manipulation system, comprising:
the micromechanical particle sorting device of claim 1 ;
at least one laser directed to a laser interrogation region disposed in the input channel; and
at least one set of detection optics that detects a fluorescent signal from a fluorescent tag affixed to the target particle in the fluid.
15. The particle manipulation system of claim 14 , further comprising:
an electromagnet; and
a circuit that provides a control waveform to the electromagnet.
16. The particle manipulation system of claim 14 , further comprising:
at least one additional laser directed at a region in at least one of the output channels and configured to confirm results of a particle manipulation.
17. The particle manipulation system of claim 15 , wherein the control waveform includes a higher amplitude acceleration phase which sets the movable member in motion, a constant amplitude phase which opens the movable member, and a braking phase which slows the movable member at closure.