Semiconductor device and operating method thereof
View Patent ↗A semiconductor device may test a semiconductor memory device by storing a data sample that is sampled from among data requested to be written into a semiconductor memory device and by comparing the data sample with data read from the semiconductor memory device which corresponds to the data sample.
1. A semiconductor device for testing a semiconductor memory device by storing a data sample that is sampled from among data requested to be written into the semiconductor memory device, and by comparing the data sample with data read from the semiconductor memory device which corresponds to the data sample.
2. A semiconductor device comprising:
a first data storage for storing a data sample that is sampled among data requested to be written into a semiconductor memory device;
an address storage for storing a sampled address corresponding to the data sample; and
a comparator for comparing the data sample stored in the first data storage with data read from the sampled address of the semiconductor memory device.
3. The semiconductor device of claim 2 , further comprising a second data storage to store data read from the sampled address of the semiconductor memory device.
4. The semiconductor device of claim 3 , wherein the data stored in the first data storage and in the second data storage are compressed, encoded, or compressed and encoded.
5. The semiconductor device of claim 2 , further comprising a controller for controlling the first data storage to store the data sample.
6. The semiconductor device of claim 5 , wherein the controller generates a read request to read data from the sampled address of the semiconductor memory device during a test operation.
7. The semiconductor device of claim 6 , further comprising:
an arbitration block for determining a processing order of requests to the semiconductor memory device;
a selection block to select a request from the arbitration block or from the controller depending on whether a test operation is being performed; and
a command generator for generating a command corresponding to the request selected at the selection block.
8. The semiconductor device of claim 7 , wherein the sampled address stored in the address storage is provided to the command generator during the test operation.
9. A system comprising:
a semiconductor memory device; and
a memory controller for controlling the semiconductor memory device, wherein the memory controller tests the semiconductor memory device by storing a data sample that is sampled from among data requested to be written into a semiconductor memory device and by comparing the data sample with data read from the semiconductor memory device which corresponds to the data sample.
10. The system of claim 9 , wherein the memory controller comprises:
a first data storage for storing sampled data among data requested to be written into the semiconductor memory device;
an address storage for storing a sampled address corresponding to the sampled data; and
a comparator for comparing the sampled data stored in the first data storage with data read from the sampled address of the semiconductor memory device.
11. The system of claim 10 , wherein the memory controller further comprises a controller for controlling the first data storage to store the sampled data.
12. The system of claim 11 , wherein the controller generates a read request to read data from the sampled address of the semiconductor memory device during a test operation.
13. The system of claim 10 , wherein the memory controller further comprises a second data storage to store data read from the sampled address of the semiconductor memory device.
14. The system of claim 13 , wherein the data stored in the first data storage and in the second data storage are compressed, encoded, or compressed and encoded.
15. The system of claim 14 , wherein the memory controller further comprises:
an arbitration block for determining a processing order of requests to the semiconductor memory device;
a selection block to select a request from the arbitration block or from the controller depending on whether a test operation is being performed; and
a command generator for generating a command corresponding to the request selected at the selection block.
16. The system of claim 15 , wherein the sampled address stored in the address storage is provided to the command generator during the test operation.
17. An operating method of a semiconductor device comprising:
storing a data sample that is sampled from among data requested to be written into a semiconductor memory device;
storing a sampled address corresponding to the data sample;
reading data from the sampled address of the semiconductor memory device; and
comparing the data sample with the data read from the sampled address of the semiconductor memory device.
18. The operating method of claim 17 , the reading and the comparing are performed while the semiconductor memory device is in idle state.
19. The operating method of claim 17 further comprising:
compressing, encoding, or compressing and encoding the sampled data; and
compressing, encoding, or compressing and encoding the data read from the semiconductor memory device.
20. A medium storing steps executed by a processor, the steps comprising:
storing a data sample that is sampled from among data requested to be written into a semiconductor memory device;
storing a sampled address corresponding to the data sample;
reading data from the sampled address of the semiconductor memory device; and
comparing the data sample with the data read from the sampled address of the semiconductor memory device.