IP Library Granted Patent US 9,568,362
Granted Patent B2
US 9,568,362 · App. 14/012,855 · Granted Feb 14, 2017

Spectroscopic assembly and method

Inventor: Georg J. Ockenfuss (Santa Rosa, CA)
Assignee: Viavi Solutions Inc.
G01J3/0229G01J3/0256G01J3/4406G01N21/645G02B5/285G01J2003/1226
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Quick Facts
Patent No.
US 9,568,362
App. No.
14/012,855
Granted
Feb 14, 2017
Kind
B2
Abstract

A spectrometer assembly is provided having an optical transmission filter including a stack of continuous, non-patterned alternating dielectric and metal layers. Angle-dependent transmission wavelength shift of the optical transmission filter with continuous metal layers is small e.g. in comparison with multilayer dielectric filters, facilitating size reduction of the spectrometer assembly.

Claims (61)

1. A spectrometer assembly comprising:

a holder for holding a sample for emitting signal light when excited with excitation light;

a first signal filter, coupled to the holder, for transmitting a first portion of the signal light at a first signal transmission wavelength, while blocking the excitation light; and

a first photodetector, coupled to the first signal filter, for providing a first electrical signal upon illumination with the first portion of the signal light transmitted through the first signal filter,

wherein the first signal filter includes a first area including continuous, non-micro-structured metal layers and dielectric layers stacked in alternation and a second area consisting of a stack of additional dielectric layers,

wherein the stack of additional dielectric layers increases attenuation of the first signal transmission wavelength,

wherein the non-micro-structured metal layers are continuous films that do not include a pattern of features that are shaped and sized to exhibit a plasmon resonance effect, and

wherein an angular sensitivity of the first signal transmission wavelength is less, for the first signal filter, as compared to a signal filter including micro-structured metal layers.

2. The spectrometer assembly of claim 1 , further comprising:

a second signal filter, coupled to the holder, for transmitting a second portion of the signal light at a second signal transmission wavelength, while blocking the excitation light; and

a second photodetector, coupled to the second signal filter, for providing a second electrical signal when illuminated with the second portion of the signal light transmitted through the second signal filter,

wherein the second signal filter includes continuous, non-micro-structured metal layers and dielectric layers stacked in alternation,

wherein an angular sensitivity of the second signal transmission wavelength is less, for the second signal filter, as compared to a signal filter including micro-structured metal layers.

3. The spectrometer assembly of claim 1 , further comprising:

a scattering filter, coupled to the holder, for transmitting scattered excitation light at a scattering transmission wavelength, while blocking the signal light;

a photodetector, coupled to the scattering filter, for providing an electrical signal when illuminated with the scattered excitation light transmitted through the scattering filter,

wherein the scattering filter includes continuous, non-micro-structured metal layers and dielectric layers stacked in alternation,

wherein an angular sensitivity of the scattering transmission wavelength is less, for the scattering filter, as compared to a scattering filter including micro-structured metal layers.

4. The spectrometer assembly of claim 1 , further comprising:

an excitation light source for emitting the excitation light; and

a first excitation filter, coupled to the excitation light source, for transmitting a first portion of the excitation light at a first excitation transmission wavelength, while blocking the signal light;

wherein the holder is coupled to the first excitation filter for receiving the first portion of the excitation light transmitted through the first excitation filter, and

wherein the first excitation filter includes continuous, non-micro-structured metal layers and dielectric layers stacked in alternation,

wherein an angular sensitivity of the first excitation transmission wavelength is less, for the first excitation filter, as compared to an excitation filter including micro-structured metal layers.

5. The spectrometer assembly of claim 4 , further comprising:

a second excitation filter, coupled to the excitation light source, for transmitting a second portion of the excitation light at a second excitation transmission wavelength, while blocking the signal light;

wherein the holder is coupled to the second excitation filter for receiving the second portion of the excitation light transmitted through the second excitation filter, and

wherein the second excitation filter includes a stack of continuous, non-micro-structured metal layers and dielectric layers,

wherein an angular sensitivity of the second excitation transmission wavelength is less, for the second excitation filter, as compared to an excitation filter including micro-structured metal layers.

6. The spectrometer assembly of claim 4 , wherein the first excitation filter is integral with the excitation light source.

7. The spectrometer assembly of claim 4 , wherein the first signal filter and the first excitation filter are disposed on a same side of the holder.

8. The spectrometer assembly of claim 7 , wherein the first signal filter and the first excitation filter are attached directly to the holder.

9. The spectrometer assembly of claim 1 , wherein a total thickness of the continuous, non-micro-structured metal layers and the dielectric layers of the first signal filter is less than 5 micrometers.

10. The spectrometer assembly of claim 1 , wherein a total thickness of the continuous, non-micro-structured metal layers and the dielectric layers of the first signal filter is less than 1 micrometer.

11. The spectrometer assembly of claim 1 , wherein the non-micro-structured metal layers are absent a pattern of features smaller than 2 micrometers.

12. The spectrometer assembly of claim 1 , wherein the non-micro-structured metal layers comprise silver or aluminum.

13. The spectrometer assembly of claim 12 , wherein the dielectric layers comprise a metal oxide.

14. The spectrometer assembly of claim 13 , wherein the metal oxide comprises one or more of Ta 2 O 5 , Nb 2 O 5 , or TiO 2 .

15. The spectrometer assembly of claim 1 , wherein

each of the non-micro-structured metal layers has a tapered edge at a periphery of the first signal filter, and

each tapered edge is protectively covered by one or more of the dielectric layers.

16. The spectrometer assembly of claim 1 , wherein the first signal filter is integral with the first photodetector.

17. The spectrometer assembly of claim 1 , wherein the sample includes a marker fluorophore that changes fluorescence properties upon binding to a target molecule, thereby indicating presence of the target molecule in the sample.

18. The spectrometer assembly of claim 1 , wherein the signal light comprises a single-photon fluorescence, multiphoton fluorescence, or an optical harmonic scattering of the excitation light.

19. A method comprising:

illuminating a sample with excitation light;

transmitting, using a signal filter, a portion of signal light, emitted from the sample, at a signal transmission wavelength,

wherein the signal filter includes a first area including continuous, non-micro-structured metal layers and dielectric layers stacked in alternation and a second area consisting of a stack of additional dielectric layers,

wherein the stack of additional dielectric layers increases attenuation of the signal transmission wavelength,

wherein the non-micro-structured metal layers are continuous films that do not include a pattern of features that are shaped and sized to exhibit a plasmon resonance effect, and

wherein an angular sensitivity of the signal transmission wavelength is less, for the signal filter, as compared to a signal filter including micro-structured metal layers;

collecting the portion of the signal light at a collection angle of at least 60 degrees; and

detecting an electrical signal, based on the portion of the signal light, provided by a photodetector.

20. The method of claim 19 , wherein the collection angle is at least 150 degrees.

21. An optical spectrometer comprising:

a transmission optical filter including a first area including continuous, non-micro-structured metal layers and dielectric layers stacked in alternation and a second area consisting of a stack of additional dielectric layers,

wherein the stack of additional dielectric layers increases wavelength attenuation,

wherein the transmission optical filter discriminates between an excitation wavelength and a signal wavelength,

wherein the non-micro-structured metal layers are continuous films that do not include a pattern of features that are shaped and sized to exhibit a plasmon resonance effect, and

wherein an angular dependence of a transmission wavelength of the transmission optical filter is less than an angular dependence of a transmission wavelength of a transmission optical filter including micro-structured metal layers, thereby lessening a size of the optical spectrometer.

22. The optical spectrometer of claim 21 , wherein the dielectric layers comprise one or more of Ta 2 O 5 , Nb 2 O 5 , or TiO 2 .

Assignments (7)
RELEASE OF SECURITY INTEREST AT REEL/FRAME 73189/0873 Recorded May 28, 2026
From: WELLS FARGO BANK, NATIONAL ASSOCIATION, AS ADMINISTRATIVE AGENT
To: INERTIAL LABS, INC.; VIAVI SOLUTIONS INC.; VIAVI SOLUTIONS LICENSING LLC
Reel/Frame 075642/0381 →
SECURITY INTEREST Recorded Nov 14, 2025
From: VIAVI SOLUTIONS INC.; VIAVI SOLUTIONS LICENSING LLC; INERTIAL LABS, INC.
To: WELLS FARGO BANK, NATIONAL ASSOCIATION, AS AGENT
Reel/Frame 073571/0137 →
SECURITY AGREEMENT Recorded Oct 21, 2025
From: INERTIAL LABS, INC.; VIAVI SOLUTIONS INC.; VIAVI SOLUTIONS LICENSING LLC
To: WELLS FARGO BANK, NATIONAL ASSOCIATION, AS ADMINISTRATIVE AGENT
Reel/Frame 073189/0873 →
TERMINATIONS OF SECURITY INTEREST AT REEL 052729, FRAME 0321 Recorded Jan 5, 2022
From: WELLS FARGO BANK, NATIONAL ASSOCIATION, AS ADMINISTRATIVE AGENT
To: VIAVI SOLUTIONS INC.; RPC PHOTONICS, INC.
Reel/Frame 058666/0639 →
SECURITY INTEREST Recorded May 21, 2020
From: VIAVI SOLUTIONS INC.; 3Z TELECOM, INC.; ACTERNA LLC; ACTERNA WG INTERNATIONAL HOLDINGS LLC; VIAVI SOLUTIONS LLC; JDSU ACTERNA HOLDINGS LLC; OPTICAL COATING LABORATORY, LLC; RPC PHOTONICS, INC.; TTC INTERNATIONAL HOLDINGS, LLC
To: WELLS FARGO BANK, NATIONAL ASSOCIATION, AS ADMINISTRATIVE AGENT
Reel/Frame 052729/0321 →
CHANGE OF NAME Recorded Sep 14, 2015
From: JDS UNIPHASE CORPORATION
To: VIAVI SOLUTIONS INC.
Reel/Frame 036605/0591 →
ASSIGNMENT OF ASSIGNOR'S INTEREST Recorded Aug 28, 2013
From: OCKENFUSS, GEORG J.
To: JDS UNIPHASE CORPORATION
Reel/Frame 031104/0518 →
Continuity (2)
Continuation In Part 13720728 · Dec 19, 2012
Related Publication 20140170765A1 · Jun 19, 2014