Mass spectrometer interface
View Patent ↗A mass spectrometer interface, having improved sensitivity and reduced chemical background, is disclosed. The mass spectrometer interface provides improved desolvation, chemical selectivity and ion transport. A flow of partially solvated ions is transported along a tortuous path into a region of disturbance of flow, where ions and neutral molecules collide and mix. Thermal energy is applied to the region of disturbance to promote liberation of at least some of the ionized particles from any attached impurities, thereby increasing the concentration of the ionized particles having the characteristic m/z ratios in the flow. Molecular reactions and low pressure ionization methods can also be performed for selective removal or enhancement of particular ions.
1. A method of providing ionized particles of a sample to a mass spectrometer, comprising:
providing a channel for guiding said sample;
maintaining said channel at a pressure below atmosphere;
introducing a gas from a source of high pressure into an inlet of said channel;
expanding said gas into said channel;
introducing said sample into said channel;
ionizing at least a portion of said sample within said channel;
slowing said gas within said channel to provide a substantially laminar flow proximate an exit of said channel; and
sampling said ionized particles proximate said exit, for analysis in said mass spectrometer.
2. The method of claim 1 , wherein said channel provides a tortuous path for said gas creating a region of disturbance for said gas within said channel maintaining a pressure in said channel between about 1 and 100 Torr.
3. The method of claim 2 , wherein said channel has a generally round cross-section proximate said region of disturbance, and flow of said gas becomes generally laminar within a distance equal to about twice said diameter from said region of disturbance.
4. The method of claim 2 , wherein said tortuous path is guided around a barrier within said channel.
5. The method of claim 3 , wherein said channel guides said gas around a bend having an angle of at least 20 degrees.
6. The method of claim 1 , further comprising colliding said ionized particles and attached impurities with a wall of said channel, so as to promote liberation of at least some of said ionized particles from said impurities.
7. The method of claim 6 , further comprising deflecting said ionized particles into said mass spectrometer using at least one electrode.
8. The method of claim 7 , wherein said deflecting comprises using at least one electrode upstream of said mass spectrometer to pulse said ionized particles, so as to facilitate separation of at least some of said ionized particles.
9. The method of claim 1 , wherein said gas proximate said exit is at a pressure in the range of 1-10 Torr.
10. The method of claim 1 , wherein said gas proximate said exit is in at a pressure in the range of 1-2 Torr.
11. An apparatus for providing ionized particles of a target sample to a mass spectrometer, said ionized particles having characteristic mass to charge (m/z) ratios, said apparatus comprising:
a channel providing a guide path for guiding a flow of gas from an inlet to an outlet;
an expansion orifice to expand a flow of gas into said channel thereby increasing the gas' velocity;
a roughing pump to reduce pressure in said channel to below atmospheric pressure;
an ionizer within said channel for forming ionized particles from analyte;
geometry for slowing said flow of gas, said outlet being provided at proximate a channel section in which flow of said gas has been slowed to be generally laminar to sample ionized particles from said flow.
12. The apparatus of claim 11 , wherein said channel has first, second and third sections with progressively larger diameters, said first section having a cross-sectional diameter of between 4-10 mm, said second section having a cross-section diameter of between 5-15 mm, said third section having a cross-section diameter of between 10-30 mm.
13. The method of claim 1 , wherein said sampling occurs in a region proximate said exit having a pressure in the range of 1-10 Torr.
14. A method of providing ionized particles of a sample to a mass spectrometer, comprising:
introducing a mixture of gas and said sample into a channel;
ionizing within said channel at least some of said sample to form said ionized particles;
wherein said channel provides a tortuous path for said mixture of gas creating a region of disturbance for said gas within said channel to aid in liberating at least some of said ionized particles from impurities in said mixture;
slowing said gas within said channel, downstream of said region of disturbance to provide a substantially laminar flow proximate an exit of said channel;
sampling said ionized particles proximate said exit, for analysis in said mass spectrometer.
15. The method of claim 1 , further comprising introducing at least one of a) a reagent; b) a second mixture of ionized particles and attached impurities; or c) electrons, in said channel.
16. The apparatus of claim 11 , further comprising a source for providing at least one of a) a reagent; b) a second mixture of ionized particles and attached impurities; or c) electrons, into said channel.
17. The apparatus of claim 11 , wherein said ionizer comprises at least one of an discharge source; a photoionization source; an electron source; and a matrix assisted laser desorption ionizer.
18. The method of claim 1 , wherein said ionizing comprises at least one of discharge ionizing; matrix assisted laser desorption ionizing; electron impact ionizing; and photo ionizing.
19. The method of claim 14 , wherein said ionizing comprises at least one of discharge ionizing; matrix assisted laser desorption ionizing; electron impact ionizing; and photo ionizing.
20. The method of claim 19 , wherein said ionizing is performed proximate said region of disturbance.