IP Library Granted Patent US 8,975,196
Granted Patent B2
US 8,975,196 · App. 14/016,177 · Granted Mar 10, 2015

Manufacturing method of semiconductor device and manufacturing apparatus of semiconductor device

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Quick Facts
Patent No.
US 8,975,196
App. No.
14/016,177
Granted
Mar 10, 2015
Kind
B2
Abstract

According to one embodiment, a method of manufacturing a semiconductor device includes providing a substrate, supplying a first liquid including a terpene to a surface of the substrate, supplying a second liquid including a silicon-containing compound to the surface of the substrate, and converting the silicon-containing compound to a silicon oxide compound.

Claims (34)

1. A method of manufacturing a semiconductor device comprising:

providing a substrate;

supplying a first liquid including a terpene to a surface of the substrate;

supplying a second liquid including a silicon-containing compound to the surface of the substrate after the first liquid has been supplied to the surface of the substrate to displace the first liquid with the second liquid.

2. The method of claim 1 , wherein the terpene is one of α-pinene, β-pinene, p-menthane, d-limonene, dipentene, and 1,8-cineol.

3. The method of claim 1 , wherein the silicon-containing compound is one of polysilazane and polysiloxane.

4. The method of claim 1 , wherein a trench is formed in the surface of the substrate before the step of supplying the first liquid.

5. The method of claim 1 , wherein the first liquid includes two or more terpenes.

6. The method of claim 1 , wherein the second liquid includes a solvent.

7. The method of claim 6 , wherein the solvent is one of xylene and di-n-butyl ether.

8. The method of claim 1 , further comprising spin coating the first liquid on the substrate.

9. The method of claim 1 , further comprising spin coating the second liquid on the substrate.

10. The method of claim 1 , further comprising heating the substrate after supplying the second liquid to evaporate solvent from the second liquid.

11. The method of claim 1 , wherein converting the silicon-containing compound to the silicon oxide compound is performed in an atmosphere containing water vapor.

12. A method of manufacturing a semiconductor device, comprising:

providing a semiconductor substrate having a silicon oxide film and a silicon nitride film disposed thereon;

forming a trench that extends through the silicon oxide film and the silicon nitride film into the semiconductor substrate;

supplying a first liquid including a terpene to a surface of the semiconductor substrate so as to at least partially fill the trench; and

supplying a second liquid including a silicon-containing compound to the surface of the semiconductor substrate to at least partially displace the first liquid with the second liquid.

13. The method of claim 12 , further comprising:

converting the silicon-containing compound to a silicon oxide compound; and

removing the silicon oxide compound that is located above the silicon nitride film by using a chemical mechanical polishing process.

14. The method of claim 13 , wherein the trench is a shallow trench isolation feature.

15. The method of claim 12 , wherein the terpene is one of α-pinene, β-pinene, p-menthane, d-limonene, dipentene, and 1,8-cineol, and

the silicon-containing compound is one of polysilazane and polysiloxane.

16. The method of claim 12 , wherein the semiconductor substrate has a floating gate electrode film and a gate insulating film disposed between the silicon nitride film and the silicon oxide film.

17. A manufacturing apparatus of a semiconductor device, comprising:

a supporting unit supporting a substrate to be treated;

a first liquid supply unit supplying first liquid containing a terpene to a surface of the substrate to be treated supported by the supporting unit;

a second liquid supply unit supplying second liquid containing a silicon-containing compound to the surface of the substrate to be treated to which the first liquid has been supplied; and

a control unit configured to control the first liquid supply unit and the second liquid supply unit such that the first liquid and the second liquid are supplied to the substrate to be treated.

18. The manufacturing apparatus of a semiconductor device according to claim 17 , wherein the control unit is configured to control the first and second liquid supply units such that the second liquid is supplied to the surface of the substrate after the first liquid has been supplied to the surface of the substrate.

19. The manufacturing apparatus of claim 17 , wherein the terpene is one of α-pinene, β-pinene, p-menthane, d-limonene, dipentene, and 1,8-cineol.

20. The manufacturing apparatus of claim 17 , wherein the silicon-containing compound is one of polysilazane and polysiloxane.

Assignments (5)
MERGER Recorded Jan 22, 2021
From: TOSHIBA MEMORY CORPORATION
To: K.K. PANGEA
Reel/Frame 055659/0471 →
CHANGE OF NAME AND ADDRESS Recorded Jan 22, 2021
From: TOSHIBA MEMORY CORPORATION
To: KIOXIA CORPORATION
Reel/Frame 055669/0001 →
CHANGE OF NAME AND ADDRESS Recorded Jan 22, 2021
From: K.K. PANGEA
To: TOSHIBA MEMORY CORPORATION
Reel/Frame 055669/0401 →
ASSIGNMENT OF ASSIGNOR'S INTEREST Recorded Jul 14, 2017
From: KABUSHIKI KAISHA TOSHIBA
To: TOSHIBA MEMORY CORPORATION
Reel/Frame 043194/0647 →
ASSIGNMENT OF ASSIGNOR'S INTEREST Recorded Dec 4, 2013
From: NAKAZAWA, KEISUKE
To: KABUSHIKI KAISHA TOSHIBA
Reel/Frame 031714/0045 →