Method of making photovoltaic device having high quantum efficiency
View Patent ↗A method of fabricating a photovoltaic device includes forming an absorber layer comprising an absorber material above a substrate, forming a buffer layer over the absorber layer, forming a front transparent layer over the buffer layer, and exposing the photovoltaic device to heat or radiation at a temperature from about 80° C. to about 500° C. for a period of time, subsequent to the step of forming a buffer layer over the absorber layer.
1. A method of fabricating a photovoltaic device, comprising forming an absorber layer comprising an absorber material above a substrate;
forming a buffer layer over the absorber layer;
forming a front transparent layer over the buffer layer; and
exposing the photovoltaic device to heat or radiation at a temperature from about 100° C. to about 500° C. for multiple cycles in a total period of time in the range of from about 10 minutes to about 30 minutes, subsequent to the step of forming a buffer layer over the absorber layer.
2. The method of claim 1 , further comprising:
forming a back contact layer above the substrate before the step of forming the absorber layer above the substrate.
3. The method of claim 1 , wherein
the photovoltaic device is exposed to the heat or radiation after the step of forming the front transparent layer over the buffer layer.
4. The method of claim 1 , further comprising:
forming an anti-reflection layer over the front transparent layer.
5. The method of claim 4 , wherein
the photovoltaic device is exposed to the heat or radiation after the step of forming the anti-reflection layer over the front transparent layer.
6. The method of claim 1 , wherein
the radiation is selected from the group consisting of microwave, infrared (IR) and ultraviolet (UV) light.
7. The method of claim 1 , wherein
the photovoltaic device is exposed to the heat at a temperature in the range of from 100° C. to 300° C.
8. The method of claim 1 , wherein
the photovoltaic device is exposed to microwave as the radiation at a temperature in the range of from about 200° C. to about 300° C.
9. The method of claim 1 , wherein
the photovoltaic device is exposed to infrared light as the radiation at a temperature in the range of from about 200° C. to about 400° C.
10. The method of claim 1 , wherein
the absorber material in the absorber layer is selected from the group consisting of copper indium gallium selenide (CIGS) and cadmium telluride (CdTe); and
the buffer layer comprises a buffer material selected from the group consisting of ZnS, CdS and CdSe.
11. A method of fabricating a photovoltaic device, comprising
forming a back contact layer above a substrate;
forming an absorber layer comprising an absorber material above the substrate;
forming a buffer layer over the absorber layer;
forming a front transparent layer over the buffer layer; and
exposing the photovoltaic device to heat or radiation at a temperature from about 100° C. to about 500° C. for multiple cycles in a total period of time in the range of from about 10 minutes to about 30 minutes, subsequent to the step of forming the front transparent layer over the buffer layer.
12. The method of claim 11 , further comprising:
forming an anti-reflection layer over the front transparent layer.
13. The method of claim 11 , wherein
the photovoltaic device is exposed to heat or radiation after the step of forming the anti-reflection layer over the front transparent layer.
14. The method of claim 11 , wherein
the photovoltaic device is exposed to the heat at a temperature in the range of from about 100° C. to about 300° C.
15. The method of claim 14 , wherein
the photovoltaic device is simultaneously exposed to a type of radiation in addition to the heat, the radiation being selected from the group consisting of microwave, infrared (IR) and ultraviolet (UV) light.