Hard press rejection
View Patent ↗Techniques for hard press rejection are described herein. In an example embodiment, a touch area on a sensor array is determined, where the touch area corresponds to a detected object and is associated with multiple signal values. A slope value for the detected object is computed based on a ratio of a signal distribution value in the touch area to a metric indicating a size of the touch area with respect to the sensor array. The slope value is compared to a threshold in order to determine whether to accept or to reject the detected object, and the detected object is rejected based on the comparison.
1. A method for hard press rejection, the method comprising:
accessing, by a processing device, a set of signal values associated with an object that is detected on a sensor array during a scan operation;
determining, by the processing device, a touch area and parameters thereof corresponding to the detected object on the sensor array, wherein the touch area is associated with multiple signal values from the set of signal values;
computing, by the processing device, a slope value for the detected object based at least on the parameters of the touch area; and
rejecting, by the processing device, the detected object based at least on a comparison of the slope value to a threshold, wherein the threshold is set to a value that is greater than slope values caused by hard presses and less than slope values caused by other objects.
2. The method of claim 1 , wherein the threshold is set to the value that is equal to or greater than 110% of the maximum of the slope values caused by the hard presses.
3. The method of claim 1 , wherein the other objects include normal fingers and large conductive objects.
4. The method of claim 1 , wherein the parameters of the touch area include a signal distribution value in the touch area and a size metric indicating a size of the touch area.
5. The method of claim 4 , wherein the slope value is computed based on a ratio of the signal distribution value to the size metric.
6. The method of claim 1 , wherein computing the slope value by the processing device comprises one or more of:
normalizing the slope value; and
scaling the slope value.
7. The method of claim 1 , wherein the multiple signal values represent a contact by the detected object with the sensor array, wherein the contact is not preceded by another contact which corresponds to the detected object and which was detected in a previous scan operation.
8. The method of claim 1 , further comprising:
receiving a plurality of measurements that are measured from the sensor array during the scan operation; and
deriving, by the processing device, the set of signal values from the plurality of measurements.
9. The method of claim 1 , wherein the detected object is one of a non-conductive object, a finger in a leather glove, and a plastic cover being pressed into the sensor array.
10. The method of claim 1 , wherein the sensor array is one of a mutual capacitance sensor array and a self-capacitance sensor array.
11. A non-transitory firmware storing a set of instructions that comprise firmware instructions which, when executed by a computing device, cause the computing device to perform operations comprising:
accessing a set of signal values associated with an object that is detected on a sensor array during a scan operation;
determining a touch area and parameters thereof corresponding to the detected object on the sensor array, wherein the touch area is associated with multiple signal values from the set of signal values;
computing a slope value for the detected object based at least on the parameters of the touch area; and
rejecting the detected object based at least on a comparison of the slope value to a threshold, wherein the threshold is set to a value that is greater than slope values caused by hard presses and less than slope values caused by other objects.
12. The non-transitory firmware of claim 11 , wherein the threshold is set to the value that is equal to or greater than 110% of the maximum of the slope values caused by the hard presses.
13. The non-transitory firmware of claim 11 , wherein the other objects include normal fingers and large conductive objects.
14. The non-transitory firmware of claim 11 , wherein the parameters of the touch area include a signal distribution value in the touch area and a size metric indicating a size of the touch area.
15. The non-transitory firmware of claim 14 , wherein the slope value is computed based on a ratio of the signal distribution value to the size metric.
16. The non-transitory firmware of claim 11 , wherein the firmware instructions that cause computing the slope value comprise instructions which, when executed by the computing device, cause the computing device to perform one or more of:
normalizing the slope value; and
scaling the slope value.
17. The non-transitory firmware of claim 11 , wherein the multiple signal values represent a contact by the detected object with the sensor array, wherein the contact is not preceded by another contact which corresponds to the detected object and which was detected in a previous scan operation.
18. The non-transitory firmware of claim 11 , wherein the firmware instructions further comprise instructions which, when executed by the computing device, cause:
receiving a plurality of measurements that are measured from the sensor array during the scan operation; and
deriving the set of signal values from the plurality of measurements.
19. The non-transitory firmware of claim 11 , wherein the detected object is one of a non-conductive object, a finger in a leather glove, and a plastic cover being pressed into the sensor array.
20. The non-transitory firmware of claim 11 , wherein the sensor array is one of a mutual capacitance sensor array and a self-capacitance sensor array.