IP Library Granted Patent US 8,766,220
Granted Patent B2
US 8,766,220 · App. 14/063,764 · Granted Jul 1, 2014

Charged particle beam irradiation apparatus

Inventors: Toshiki Tachikawa (Ehime, JP); Tsuyoshi Ogasawara (Ehime, JP)
Assignee: Sumitomo Heavy Industries, Ltd.
G21K5/04
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Quick Facts
Patent No.
US 8,766,220
App. No.
14/063,764
Granted
Jul 1, 2014
Kind
B2
Abstract

A charged particle beam irradiation apparatus includes: an irradiation section configured to irradiate an irradiated body with a charged particle beam; a multi-leaf collimator configured to set an irradiation range of the charged particle beam which is irradiated from the irradiation section; an imaging section that is provided so as to be able to advance and retreat with respect to an irradiation axis of the charged particle beam which is irradiated from the irradiation section, between the irradiation section and the multi-leaf collimator, and directly images an opening portion of the multi-leaf collimator; and a drive section configured to move the imaging section between an imaging position corresponding to an irradiation area which includes the irradiation axis of the charged particle beam and a retreated position away from the irradiation area.

Claims (10)

1. A charged particle beam irradiation apparatus comprising:

an irradiation section configured to irradiate an irradiated body with a charged particle beam;

a multi-leaf collimator configured to set an irradiation range of the charged particle beam which is irradiated from the irradiation section;

an imaging section that is provided so as to be able to advance and retreat with respect to an irradiation axis of the charged particle beam which is irradiated from the irradiation section, between the irradiation section and the multi-leaf collimator, and directly images an opening portion of the multi-leaf collimator; and

a drive section configured to move the imaging section between an imaging position corresponding to an irradiation area which includes the irradiation axis of the charged particle beam and a retreated position away from the irradiation area.

2. The charged particle beam irradiation apparatus according to claim 1 , wherein the imaging section is mounted on amounting bracket that can advance and retreat with respect to the irradiation axis of the charged particle beam,

the drive section moves the mounting bracket between the imaging position and the retreated position, and

a shield wall for protecting the imaging section from the charged particle beam is provided closer to the side of the irradiation axis of the charged particle beam than the imaging section in the mounting bracket when the mounting bracket is at the retreated position.

3. The charged particle beam irradiation apparatus according to claim 2 , wherein a light source section configured to irradiate light to the opening portion of the multi-leaf collimator is further mounted on the mounting bracket.

4. The charged particle beam irradiation apparatus according to claim 3 , wherein the light source section is mounted on the mounting bracket so as to be located on the irradiation axis of the charged particle beam when the mounting bracket is at the imaging position.

Assignments (1)
ASSIGNMENT OF ASSIGNOR'S INTEREST Recorded Oct 29, 2013
From: TACHIKAWA, TOSHIKI; OGASAWARA, TSUYOSHI
To: SUMITOMO HEAVY INDUSTRIES, LTD.
Reel/Frame 031501/0299 →
Priority Claims (1)
JP 2011-099461 · Apr 27, 2011 · national
Continuity (2)
Continuation PCTJP2012058231 · Mar 28, 2012
Related Publication 20140077098A1 · Mar 20, 2014