IP Library Granted Patent US 9,171,500
Granted Patent B2
US 9,171,500 · App. 14/076,336 · Granted Oct 27, 2015

System and methods for extraction of parasitic parameters in AMOLED displays

Inventors: Gholamreza Chaji (Waterloo, CA); Yaser Azizi (Waterloo, CA)
Assignee: Ignis Innovation Inc.
G09G3/3225G09G3/3233G09G2230/00G09G2300/0426G09G2300/0819G09G2300/0842G09G2300/0861G09G2310/0248G09G2310/0289G09G2310/0291G09G2310/061G09G2320/029G09G2320/043
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Quick Facts
Patent No.
US 9,171,500
App. No.
14/076,336
Granted
Oct 27, 2015
Kind
B2
Abstract

A system reads a desired circuit parameter from a pixel circuit that includes a light emitting device, a drive device to provide a programmable drive current to the light emitting device, a programming input, and a storage device to store a programming signal. One embodiment of the extraction system extracts a parasitic capacitance value from a pixel circuit by measuring at least one parameter of the pixel circuit when in a first state having a first set of operating voltages and currents, measuring at least one parameter of the pixel circuit when in a second state having a second set of operating voltages and currents different from the first set, and extracting the value of a selected parasitic capacitance from the measurements.

Claims (13)

1. A method of extracting a parasitic capacitance value from a pixel circuit including a light emitting device, a drive device to provide a programmable drive current to the light emitting device, a programming input, and a storage device to store a programming signal, the method comprising:

measuring at least one parameter of the pixel circuit when in a first state having a first set of operating voltages and currents,

measuring at least one parameter of the pixel circuit when in a second state having a second set of operating voltages and currents different from said first set,

modeling the effect of parasitic capacitance on measured parameters at different sets of operating conditions, said modeling being done before or after said measuring of said parameters of the pixel circuit when in said first and second states, and

extracting the value of a selected parasitic capacitance from said measurements and said modeling.

2. The method of claim 1 in which said measured parameter is a current in said pixel circuit.

3. The method of claim 1 in which said measured parameter is a charge in said pixel circuit.

4. A method of extracting a parasitic capacitance value from a pixel circuit including a light emitting device, a drive device to provide a programmable drive current to the light emitting device, a programming input, and a storage device to store a programming signal, the method comprising:

measuring at least one parameter of the pixel circuit when in a first state having a first set of operating voltages and currents,

measuring at least one parameter of the pixel circuit when in a second state having a second set of operating voltages and currents different from said first set,

determining the difference between the two measurements, and

measuring at least one parameter of the pixel circuit when in a third state having a known set of operating voltages and currents, and modifying this measurement by a gain based on said determined difference.

5. The method of claim 4 in which said pixel circuit is part of a display having a prescribed specification, and said gain is adjusted to make said pixel circuit match said prescribed specification.

Assignments (2)
ASSIGNMENT OF ASSIGNOR'S INTEREST Recorded May 19, 2023
From: IGNIS INNOVATION INC.
To: IGNIS INNOVATION INC.
Reel/Frame 063706/0406 →
ASSIGNMENT OF ASSIGNOR'S INTEREST Recorded Nov 11, 2013
From: CHAJI, GHOLAMREZA; AZIZI, YASER
To: IGNIS INNOVATION INC.
Reel/Frame 031574/0443 →
Continuity (3)
Continuation In Part 13835124 · Mar 15, 2013
Continuation In Part 13112468 · May 20, 2011
Related Publication 20140062993A1 · Mar 6, 2014