IP Library Granted Patent US 9,170,235
Granted Patent B2
US 9,170,235 · App. 14/079,915 · Granted Oct 27, 2015

Eddy current testing apparatus, eddy current testing probe, and eddy current testing method

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Quick Facts
Patent No.
US 9,170,235
App. No.
14/079,915
Granted
Oct 27, 2015
Kind
B2
Abstract

An eddy current testing apparatus includes: an eddy current testing probe having an eddy current testing coil arranged on a bottom portion of a casing; a pressing mechanism configured to press the eddy current testing probe so that the bottom portion of the eddy current testing probe is placed in contact with a part of an inner wall surface of a slot formed in an object to be inspected; a carriage configured to mount the pressing mechanism and the eddy current testing probe, the carriage traveling in a depth direction of the slot; and an eddy current testing control device configured to control defect detection for the inner wall surface of the slot by acquiring a detected eddy current signal from the eddy current testing coil.

Claims (46)

1. An eddy current testing apparatus comprising:

an eddy current testing probe having an eddy current testing coil arranged on a bottom portion of a casing;

a pressing mechanism configured to press the eddy current testing probe so that the bottom portion of the eddy current testing probe is placed in contact with a part of an inner wall surface of a slot formed in an object to be inspected;

a carriage configured to mount the pressing mechanism and the eddy current testing probe, the carriage traveling in a depth direction of the slot; and

an eddy current testing control device configured to control defect detection for the inner wall surface of the slot by acquiring a detected eddy current signal from the eddy current testing coil;

wherein the carriage travels along the slot on an outer upper surface of the object to be inspected while being held by the outer upper surface of the object having the slot formed therein,

the pressing mechanism mounted on the carriage includes

a first spring member,

a second spring member,

a holding plate member attached to the carriage through the first spring member, and

two eddy current testing probe holding members suspended by the holding plate member and downwardly extended from the holding plate member to the inside of the slot, the two holding member being coupled to each other by the second spring member and each configured to hold the eddy current testing probes,

the first spring member upwardly presses the holding plate member and the two eddy current testing probe holding members suspended by the holding plate member by a compression repulsive force of the first spring member, and

the second spring member presses the two eddy current testing probe holding members by a compression repulsive force of the second spring member against the inner wall surfaces included in the slot, the inner wall surfaces being substantially opposed to each other.

2. An eddy current testing apparatus comprising:

an eddy current testing probe having an eddy current testing coil arranged on a bottom portion of a casing;

a pressing mechanism configured to press the eddy current testing probe so that the bottom portion of the eddy current testing probe is placed in contact with a part of an inner wall surface of a slot formed in an object to be inspected;

a carriage configured to mount the pressing mechanism and the eddy current testing probe, the carriage traveling in a depth direction of the slot; and

an eddy current testing control device configured to control defect detection for the inner wall surface of the slot by acquiring a detected eddy current signal from the eddy current testing coil;

wherein the carriage includes a wheel and a rotation pulse generator that generates a pulse on the basis of a rotational amount of the wheel.

3. An eddy current testing probe comprising:

a first coil holding member having a plurality of eddy current testing coils arranged on a bottom portion of a casing; and

a second coil holding member having one or more eddy current testing coils arranged on bottom portions of both edges of the casing, the second coil holding member being attached to contact with a side surface of the casing and the second coil holding member being detachable, wherein:

the second coil holding member has a length adjusting member for adjusting a distance between both end portions of the second coil holding member.

4. The eddy current testing probe according to claim 3 , wherein:

the second coil holding member has rotary shafts perpendicular to the side surface of the casing arranged at the end portions thereof, the rotary shafts including corner positioning members with flat bottoms configured to freely rotate around the rotary shafts.

5. The eddy current testing probe according to claim 3 , wherein:

the plurality of eddy current testing coils held by the first coil holding member are array coils arranged in substantially parallel to the side surface of the casing.

6. The eddy current testing probe according to claim 3 , further comprising:

an electronic switching circuit configured to switch each of the plurality of eddy current testing coils held by the first coil holding member between an exciting coil and a detecting coil.

7. The eddy current testing probe according to claim 3 , wherein:

the plurality of eddy current testing coils held by the first coil holding member are at least one exciting coil and at least one detecting coil.

8. The eddy current testing probe according to claim 7 , wherein:

the exciting coil is a coil wound around a magnetic body having a gap on the side of the bottom surface of the casing, and the detecting coil is arranged at the gap.

9. An eddy current testing method comprising the steps of:

acquiring, by an eddy current testing apparatus, a detected eddy current signal from an inner wall surface through an eddy current testing probe while a carriage traveling along a slot in a depth direction of the slot; and

outputting, by an eddy current testing apparatus, an alarm sound upon a detection of an abnormality of the acquired detected eddy current signal,

wherein the eddy current apparatus comprises:

an eddy current testing probe includes an eddy current testing coil arranged on a bottom portion of a casing,

a pressing mechanism configured to press the eddy current testing probe so that the bottom portion of the eddy current testing probe is placed in contact with a part of an inner wall surface of a slot formed in an object to be inspected;

a carriage configured to mount the pressing mechanism and the eddy current testing probe to travel in a depth direction of the slot; and

an eddy current testing control device configured to control defect detection for the inner wall surface of the slot by acquiring a detected eddy current signal from the eddy current testing coil,

wherein the carriage has a wheel and a rotation pulse generator that generates a pulse based on a rotational amount of the wheel; and

upon a detection of an abnormality of the detected eddy current signal, the eddy current testing apparatus configured to:

calculate a travel distance of the carriage until the time of the detection of the abnormality on the basis of a rotational amount, angle, and diameter of a wheel, each acquired from the rotation pulse generator,

store the travel distance as positional information of a defect, and

cause a display device to display the positional information of the defect on a map.

Assignments (6)
NUNC PRO TUNC ASSIGNMENT Recorded Nov 25, 2024
From: MITSUBISHI HEAVY INDUSTRIES, LTD.
To: MITSUBISHI GENERATOR CO., LTD.
Reel/Frame 069438/0941 →
NUNC PRO TUNC ASSIGNMENT Recorded Sep 11, 2023
From: MITSUBISHI POWER, LTD.
To: MITSUBISHI HEAVY INDUSTRIES, LTD.
Reel/Frame 064854/0880 →
CORRECTIVE ASSIGNMENT TO CORRECT THE REMOVING PATENT APPLICATION NUMBER 11921683 PREVIOUSLY RECORDED AT REEL: 054975 FRAME: 0438. ASSIGNOR(S) HEREBY CONFIRMS THE ASSIGNMENT. Recorded May 26, 2023
From: MITSUBISHI HITACHI POWER SYSTEMS, LTD.
To: MITSUBISHI POWER, LTD.
Reel/Frame 063787/0867 →
CHANGE OF NAME Recorded Jan 13, 2021
From: MITSUBISHI HITACHI POWER SYSTEMS, LTD.
To: MITSUBISHI POWER, LTD.
Reel/Frame 054975/0438 →
ASSIGNMENT OF ASSIGNOR'S INTEREST Recorded Sep 2, 2014
From: HITACHI, LTD.
To: MITSUBISHI HITACHI POWER SYSTEMS, LTD.
Reel/Frame 033652/0382 →
ASSIGNMENT OF ASSIGNOR'S INTEREST Recorded Feb 21, 2014
From: NISHIMIZU, AKIRA; ISHIHARA, ATSUSHI; MATSUMOTO, JUN; KAWANAKA, TAKAYUKI
To: HITACHI, LTD.
Reel/Frame 032271/0741 →