Endoscope device, and measurement method

1. An endoscope device configured to measure a specimen using a pattern projection image of the specimen on which a light and shade pattern of light is projected, the endoscope device comprising:

an imaging unit configured to acquire an image of the specimen;

an illumination unit having a first light source configured to emit illumination light to illuminate an observation field of vision of the imaging unit;

a pattern projection unit having a second light source configured to emit projection light to project the light and shade pattern on the specimen;

a display unit configured to display the image acquired by the imaging unit; and

a control unit configured to control the imaging unit, the illumination unit, the pattern projection unit, and the display unit,

wherein the control unit:

varies an emission state of the illumination light from the first light source at a predetermined period,

reduces emission of the projection light from the second light source in a state in which the illumination light is emitted from the first light source,

emits the projection light from the second light source in a state in which emission of the illumination light from the first light source is reduced,

controls the imaging unit to acquire the pattern projection image obtained by projecting the light and shade pattern on the specimen in a state in which the projection light is emitted,

controls the imaging unit to acquire a first light field image obtained by illuminating the specimen with the illumination light in a state in which the illumination light is emitted before the acquisition of the pattern projection image,

controls the imaging unit to acquire a second light field image obtained by illuminating the specimen with the illumination light in a state in which the illumination light is emitted after the acquisition of the pattern projection image,

detects a deviation amount between the first light field image and the second light field image,

determines whether or not the deviation amount is less than a predetermined threshold value,

measures a 3-dimensional shape of the specimen using the pattern projection image acquired by the imaging unit only when it is determined that the deviation amount is less than the threshold value, and

displays information obtained by the measurement on the display unit with one of the first light field image and the second light field image.

2. The endoscope device according to claim 1 , wherein the control unit further:

displays a cursor used to determine a region in which the 3-dimensional shape of the specimen is measured in an imaging field of vision of the imaging unit on the display unit,

sets the region on the display unit based on coordinates of the cursor, and

measures the 3-dimensional shape of the corresponding specimen in the region.

3. The endoscope device according to claim 1 , wherein the control unit measures the 3-dimensional shape of the specimen using only one pattern projection image by at least one of a spatial phase shift method, a Fourier transform method, a stripe order analysis and an optical cutting method.

4. The endoscope device according to claim 1 , wherein the one period of the predetermined period is a period of one second or more constituted by a first time width in a state in which the illumination light is emitted and a state in which emission of the projection light is stopped, and a second time width in a state in which emission of the illumination light is stopped and a state in which the projection light is emitted, and

the second time width in the one period is set to a sufficiently shorter time than one second.

5. The endoscope device according to claim 4 , wherein the second time width is set to a length of 1/25 of a second or less.

6. The endoscope device according to claim 4 , wherein the second time width is set to a length of 1/30 of a second or less.

7. An endoscope device configured to measure a specimen using a pattern projection image of the specimen on which a light and shade pattern of light is projected, the endoscope device comprising:

an imaging unit configured to acquire an image of the specimen;

an illumination unit having a first light source configured to emit illumination light to illuminate an observation field of vision of the imaging unit;

a pattern projection unit having a second light source configured to emit projection light to project the light and shade pattern on the specimen;

a display unit configured to display the image acquired by the imaging unit; and

a control unit configured to control the imaging unit, the illumination unit, the pattern projection unit, and the display unit,

wherein the control unit:

varies an emission state of the illumination light from the first light source at a predetermined period,

reduces emission of the projection light from the second light source in a state in which the illumination light is emitted from the first light source,

emits the projection light from the second light source in a state in which emission of the illumination light from the first light source is reduced,

controls the imaging unit to acquire the pattern projection image obtained by projecting the light and shade pattern on the specimen in a state in which the projection light is emitted,

controls the imaging unit to acquire a first light field image obtained by illuminating the specimen with the illumination light in a state in which the illumination light is emitted before the acquisition of the pattern projection image,

controls the imaging unit to acquire a second light field image obtained by illuminating the specimen with the illumination light in a state in which the illumination light is emitted after the acquisition of the pattern projection image,

detects a deviation amount between the first light field image and the second light field image,

determines whether or not the deviation amount is less than a predetermined threshold value, and

when it is determined that the deviation amount is not less than the threshold value, displays information regarding generation of a blur on the display unit without performing a measurement of a 3-dimensional shape of the specimen.

8. The endoscope device according to claim 7 , wherein the control unit further:

displays a cursor used to determine a region in which the 3-dimensional shape of the specimen is measured in an imaging field of vision of the imaging unit on the display unit,

sets the region on the display unit based on coordinates of the cursor, and

measures the 3-dimensional shape of the corresponding specimen in the region.

9. The endoscope device according to claim 7 , wherein the control unit measures the 3-dimensional shape of the specimen using only one pattern projection image by at least one of a spatial phase shift method, a Fourier transform method, a stripe order analysis and an optical cutting method.

10. The endoscope device according to claim 7 , wherein the one period of the predetermined period is a period of one second or more constituted by a first time width in a state in which the illumination light is emitted and a state in which emission of the projection light is stopped, and a second time width in a state in which emission of the illumination light is stopped and a state in which the projection light is emitted, and

the second time width in the one period is set to a sufficiently shorter time than one second.

11. The endoscope device according to claim 10 , wherein the second time width is set to a length of 1/25 of a second or less.

12. The endoscope device according to claim 10 , wherein the second time width is set to a length of 1/30 of a second or less.