High voltage shielding to enable paschen region operation for neutron detection systems

1. An electrical system for an atomic particle detection assembly, the electrical system including:

an electrical component electrically connected to an atomic particle detection unit;

a dielectric insulating material surrounding the electrical component, the dielectric material having an outer surface; and

a conductive shielding material surroundingly engaging the outer surface of the dielectric insulating material, wherein the conductive shielding material and a different, conductive element are at substantially the same electric potential to inhibit voltage breakdown from the outer surface of the dielectric insulating material to the conductive element.

2. The electrical system of claim 1 , wherein the dielectric insulating material is in contact with the electrical component.

3. The electrical system of claim 2 , wherein the dielectric insulating material includes a potting material.

4. The electrical system of claim 1 , wherein the conductive shielding material includes a metalized layer covering the dielectric insulating material.

5. The electrical system of claim 1 , wherein the electrical component includes a conductive wire.

6. The electrical system of claim 1 , wherein the electrical component is disposed within a chamber at an operating pressure that is less than about one atmosphere.

7. An electrical system for an atomic particle detection assembly, the electrical system including:

an electrical component electrically connected to an atomic particle detection unit, the electrical component disposed within a chamber at an operating pressure that is less than about one atmosphere;

a dielectric insulating material surrounding the electrical component, the dielectric material having an outer surface; and

a conductive shielding material surroundingly engaging the outer surface of the dielectric insulator and the electrical component, wherein the conductive shielding material and a different, conductive element have an electric potential within about 300 volts to inhibit voltage breakdown from the outer surface of the dielectric insulating material to the conductive element.

8. The electrical system of claim 7 , wherein the dielectric insulating material is in contact with the electrical component.

9. The electrical system of claim 8 , wherein the dielectric insulating material includes a potting material.

10. The electrical system of claim 7 , wherein the conductive shielding material includes a metalized layer covering the dielectric insulating material.

11. The electrical system of claim 7 , wherein the electrical component includes a conductive wire.

12. An atomic particle detection assembly including:

at least one atomic particle detection unit configured to detect atomic particles;

an electrical component electrically connected to the at least one atomic particle detection unit;

a dielectric insulating material surrounding the electrical component, the dielectric material having an outer surface; and

a conductive shielding material surrounding the electrical component that is surrounded by the dielectric insulating material and surroundingly engaging the outer surface of the dielectric insulating material, wherein the conductive shielding material and a different, conductive element are at substantially the same electric potential to inhibit voltage breakdown from the outer surface of the dielectric insulating material to the conductive element.

13. The atomic particle detection assembly of claim 12 , wherein the dielectric insulating material is in contact with the electrical component.

14. The atomic particle detection assembly of claim 13 , wherein the dielectric insulating material includes a potting material.

15. The atomic particle detection assembly of claim 12 , wherein the conductive shielding material includes a metalized layer covering the dielectric insulating material.

16. The atomic particle detection assembly of claim 12 , wherein the electrical component includes a conductive wire.

17. The atomic particle detection assembly of claim 12 , wherein the electrical component is disposed within a chamber at an operating pressure that is less than about one atmosphere.