Non-volatile memory validity
An embodiment provides a method, including: determining current validity timing of a non-volatile memory device having changing validity timing via: writing information to a non-volatile memory device; waiting a time after the writing; and reading the information written to the non-volatile memory device following the time. Other aspects are described and claimed.
1. A method, comprising:
determining current validity timing of a non-volatile memory device having changing validity timing via:
writing test information to a non-volatile memory device;
waiting a predetermined time after the writing; and
reading the test information written to the non-volatile memory device following the predetermined time.
2. The method of claim 1 , wherein the test information written to the non-volatile memory device includes timing information.
3. The method of claim 2 , wherein the determining comprises comparing the timing information to a current time.
4. The method of claim 3 , further comprising:
determining that an elapsed time since a last refresh of the non-volatile memory device exceeds a predetermined time using the timing information and the current time; and
performing a refresh of the non-volatile memory device.
5. The method of claim 2 , wherein the determining is performed by a memory controller.
6. The method of claim 1 , further comprising:
determining the current validity time has been exceeded; and
providing an indication that the current validity timing has been exceeded.
7. The method of claim 1 , wherein the test information written to the non-volatile memory device includes a test bit.
8. The method of claim 7 , wherein the determining comprises comparing the test bit to an expected value.
9. The method of claim 8 , further comprising:
determining that the test bit does not match the expected value; and
updating a life expectancy estimate for the non-volatile memory device.
10. The method of claim 1 , wherein the non-volatile memory is a memory device selected from the group of memory devices consisting of non-volatile random access memory (NVRAM), magneto-resistive random access memory (MRAM), spin transfer torque random access memory (STT-RAM), and resistive random access memory (ReRAM).
11. An information handling device, comprising:
a non-volatile memory device;
a processor; and
a memory device storing instructions executable by the processor to:
determine current validity timing of the non-volatile memory device, the non-volatile memory device having changing validity timing via:
write test information to the non-volatile memory device;
wait a predetermined time after the writing; and
read the test information written to the non-volatile memory device following the predetermined time.
12. The information handling device of claim 11 , wherein the predetermined information written to the non-volatile memory device includes timing information.
13. The information handling device of claim 12 , wherein to determine comprises comparing the timing information to a current time.
14. The information handling device of claim 13 , wherein the instructions are further executable by the processor to:
determine that an elapsed time since a last refresh of the non-volatile memory device exceeds a predetermined time using the timing information and the current time; and
perform a refresh of the non-volatile memory device.
15. The information handling device of claim 12 , wherein the current validity timing is determined by a memory controller.
16. The information handling device of claim 11 , wherein the instructions are further executable by the processor to:
determine the current validity time has been exceeded; and
provide an indication that the current validity timing has been exceeded.
17. The information handling device of claim 11 , wherein the test information written to the non-volatile memory device includes a test bit.
18. The information handling device of claim 17 , wherein to determine comprises comparing the test bit to an expected value.
19. The information handling device of claim 18 , wherein the instructions are further executable by the processor to:
determine that the test bit does not match the expected value; and
update a life expectancy estimate for the non-volatile memory device.
20. A program product, comprising:
a storage medium comprising computer readable program code, the computer readable program code comprising:
computer readable program code configured to determine current validity timing of a non-volatile memory device having changing validity timing via:
writing test information to a non-volatile memory device;
waiting a predetermined time after the writing; and
reading the test information written to the non-volatile memory device following the predetermined time.