Extended range imaging

1. An imager, comprising:

a light source;

a light coupler;

an interferometer disposed between the light source and the light coupler, the interferometer comprising:

a first reflective surface and a first modulator configured to provide a first constant phase modulation to the first reflective surface, and

a second reflective surface and a second modulator configured to provide a second constant phase modulation to the second reflective surface, the second reflective surface being separated from the first reflective surface by a distance,

wherein:

the distance between the first reflecting surface and the second reflecting surface corresponds to differing image depths in a sample;

a sample arm coupled to the light coupler that receives light from the light source through the light coupler, directs the light to the sample, and captures light returning from the sample;

a detector system configured to receive the captured light from the sample and the first and second constant phase modulations provided to the first and second reflective surfaces; and

a processor that receives signals from the detector system and separates a plurality of images that overlap corresponding with the differing image depths in the sample.

2. The imager of claim 1 , wherein the light coupler is a splitter/coupler.

3. The imager of claim 1 , wherein the light coupler is a circulator.

4. The imager of claim 1 , wherein the light coupler comprises a splitter/coupler that receives light from the light source, provides the light to the sample arm, combines light received from the sample arm and the interferometer, and provides light to the detector system.

5. The imager of claim 1 , wherein the light coupler provides light to the sample arm from the interferometer and to the detector system from the sample arm.

6. The imager of claim 5 , wherein the light coupler is a circulator.

7. The imager of claim 5 , wherein the light coupler is a splitter/coupler.

8. The imager of claim 1 , wherein the processor executes instructions to:

simultaneously obtain a plurality of overlapping images from the detector system, the plurality of overlapping images corresponding to the differing image depths in the sample;

combine the simultaneously obtained plurality of overlapping images into a combined dataset, the combined dataset having a spatial frequency dimension and a transverse dimension;

perform a transform on the combined dataset along the transverse dimension for each value in the spatial frequency dimension to form a plurality of distributions along a carrier frequency dimension in the transformed dataset;

separate the plurality of distributions into a plurality of spectra based on a carrier frequency of each of the plurality of spectra; and

perform mathematical operations on each of the plurality of separated spectra to form a plurality of full-range images corresponding with the differing image depths in the sample.

9. The imager of claim 8 , wherein the transform is a Fourier transform.

10. The imager of claim 8 , wherein the mathematical operations include:

an inverse Fourier transform to be performed on the separated spectra; and

an inverse Fourier transform to be performed along a frequency dimension on the separated spectra.

11. The imager of claim 1 , wherein the processor provides control signals to the interferometer and the sample arm.

12. The imager of claim 1 , wherein the light source includes a broad band source and the detector system includes a spectrometer.

13. The imager of claim 1 , wherein the light source includes a swept laser source and the detector system includes a photodiode detector system.