Multiple examinations of a sample

1. A sensor apparatus for the examination of a sample, comprising:

at least one sample chamber in which the sample can be provided, said sample chamber comprising a detection surface;

at least one light source for emitting a first input light beam, which is totally internally reflected at the detection surface of the sample chamber into a first output light beam, and for emitting a second input light beam, which is at least partially transmitted through the sample chamber into a second output light beam; and

at least one light detector for detecting the first and the second output light beams,

wherein the sample chamber is elongated and traversed in longitudinal direction by light of the second input light beam.

2. The apparatus according to claim 1 , wherein the sample chamber is comprised in a cartridge, said cartridge further comprising:

first optical elements for directing a first input light beam to a detection surface of the sample chamber under an angle of total internal reflection and for directing the resulting first output light beam out of the cartridge;

second optical elements for directing a second input light beam at least partially through the sample chamber and for directing the resulting second output light beam out of the cartridge.

3. A method for examining a sample, comprising the following acts of:

filling at least one sample chamber with the sample, said sample chamber being elongated and comprising a detection surface;

directing by first optical elements a first input light beam to the detection surface of the sample chamber such that it is totally internally reflected into a first output light beam;

directing by second optical elements a second input light beam at least partially through the sample chamber such that it traverses the sample chamber in a longitudinal direction, yielding a second output light beam;

detecting the first and the second output light beams by at least one light detector.

4. The apparatus according to claim 1 ,

wherein the first output light beam and the second output light beam are detected with the same light detector.

5. The apparatus according to claim 1 ,

wherein the first output light beam and/or the second output light beam are detected with a light detector that comprises an image sensor.

6. The apparatus according to claim 5 ,

wherein said light detector is focused onto the surface of the sample chamber through which the second output light beam leaves the sample chamber.

7. The apparatus according to claim 2 ,

wherein the first and the second input light beams are substantially parallel to each other outside the cartridge.

8. The apparatus according to claim 2 ,

wherein the first optical elements comprise an entrance window through which the first input light beam and/or the second input light beam can enter the cartridge and that is tilted with respect to the detection surface.

9. The apparatus according to claim 1 , wherein light of the second input light beam passes through the sample chamber substantially perpendicular to the direction of the first input light beam.

10. The apparatus according to claim 2 ,

wherein the second optical elements comprise reflection elements for changing the direction of the second input light beam.

11. The apparatus according to claim 1 ,

wherein the second input light beam partially propagates via a reference path comprising no sample, yielding a third output light beam.

12. The apparatus according to claim 1 ,

wherein the second input light beam can be switched between different spectra.

13. The apparatus according to claim 1 ,

wherein a magnetic field generator is provided for generating a magnetic field inside the sample chamber.

14. The apparatus according to claim 1 ,

wherein the sample chamber is elongated with an axial extension perpendicular to a direction of the first input light beam.

15. The method of claim 3 , further comprising acts of:

partially propagating the second input light beam via a reference path comprising no sample, to yield a third output light beam; and

comparing the second and the third output light beams for distinguishing changes which originate from variations of the second input light beam from effects caused by the sample.