Via layout techniques for improved low current measurements
View Patent ↗System and methods for use and fabrication of a printed circuit board (PCB). The PCB may include a node and a plurality of rows of vias that may be configured to establish a plurality of current pathways away from the node. The node may be a sensitive node and the plurality of current pathways may reduce leakage current at the node responsive to a signal applied to the node. Each row of the plurality of rows of vias may be offset with respect to adjacent rows of vias in a horizontal plane of the PCB. The PCB may have multiple layers and the node may be on an exterior surface layer or an interior layer. The vias may be mirco-vias, buried-vias, or through-vias.
1. A printed circuit board (PCB), comprising:
first and second measurement nodes, wherein the first and second measurement nodes are configured to measure current responsive to an applied signal; and
a plurality of rows of vias configured to establish a plurality of current pathways away from the first measurement node, wherein the plurality of current pathways reduce leakage current resulting from dielectric absorption at the first measurement node responsive to the applied signal.
2. The PCB of claim 1 , wherein each row of vias of the plurality of rows of vias is offset with respect to adjacent rows of vias in a horizontal plane of the PCB.
3. The PCB of claim 1 , wherein the PCB comprises a plurality of layers, wherein the first measurement node and the plurality of rows of vias are comprised in a first layer of the plurality of layers.
4. The PCB of claim 3 , wherein the first layer is an exterior surface layer of the PCB.
5. The PCB of claim 4 , wherein the plurality of rows of vias comprise at least one of:
a plurality of rows of micro-vias; and
a plurality of rows of through-vias.
6. The PCB of claim 4 , wherein a second layer of the plurality of layers comprises a guard plane, wherein the guard plane is configured to prevent stray currents from entering the first measurement node, and wherein the second layer is vertically adjacent to the first layer.
7. The PCB claim 3 , wherein the first layer is an interior layer of the PCB.
8. The PCB of claim 7 , wherein the plurality of rows of vias comprise at least one of:
a plurality of rows of buried-vias; and
a plurality of rows of through-vias.
9. The layer of claim 7 , wherein a second layer of the plurality of layers and a third layer of the plurality of layers each comprise a guard plane, wherein each guard plane is configured to prevent stray currents from entering the first measurement node, and wherein the second layer and the third layer are each vertically adjacent to the first layer.
10. The PCB of claim 7 , wherein the PCB further comprises:
a cavity, wherein the first measurement node is accessible via the cavity.
11. The PCB of claim 10 , wherein the cavity comprises a via.
12. The PCB of claim 10 , wherein a second layer of the plurality of layers and a third layer of the plurality of layers each comprise a guard plane, wherein each guard plane is configured to prevent stray currents from entering the first measurement node, and wherein the second layer and the third layer are each vertically adjacent to the first layer.
13. A method for measuring current at a node, comprising:
applying a signal across first and second measurement nodes, wherein the first and second measurement nodes are configured to measure current responsive to said applied signal; and
establishing a plurality of current pathways away from the node, wherein the plurality of current pathways reduce leakage current resulting from dielectric absorption at the first measurement node responsive to said applying the signal; and
measuring the current at the first measurement node.
14. The PCB of claim 1 ,
wherein the first measurement node is a sensitive node; and
wherein the second measurement node is an aggressor node.
15. The PCB of claim 1 ,
wherein the value of the measured current is in a range of pico-amperes and lower.
16. The PCB of claim 1 ,
wherein the value of the measured current is in a range of femto-amperes and lower.