IP Library Granted Patent US 9,431,569
Granted Patent B2
US 9,431,569 · App. 14/141,408 · Granted Aug 30, 2016

Zinc blende cadmium—manganese—telluride with reduced hole compensation effects and methods for forming the same

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Quick Facts
Patent No.
US 9,431,569
App. No.
14/141,408
Granted
Aug 30, 2016
Kind
B2
Abstract

Embodiments provided herein describe methods for forming cadmium-manganese-telluride (CMT), such as for use in photovoltaic devices. A substrate including a material with a zinc blend crystalline structure is provided. CMT is formed above the substrate. During the formation of the CMT, cation-rich processing conditions are maintained. The resulting CMT may be more readily provided with p-type dopants when compared to conventionally-formed CMT.

Claims (23)

1. A method for forming cadmium-manganese-telluride (CMT), the method comprising:

positioning a substrate in a processing chamber of a physical vapor deposition (PVD) tool, wherein the PVD tool further comprises at least one target in the processing chamber, the at least one target including material comprising cadmium, manganese, tellurium, or a combination thereof;

introducing dimethyl cadmium gas into the processing chamber; and

causing said material to be ejected from the at least one target, the material forming CMT above the substrate.

2. The method of claim 1 , wherein the substrate comprises a zinc blend crystal structure.

3. The method of claim 2 , wherein the substrate comprises cadmium telluride.

4. The method of claim 1 , wherein during the causing of the material to be ejected from the at least one target, a processing temperature within the processing chamber is between about 25° C. and about 600° C.

5. The method of claim 1 , wherein the at least target comprises a first target comprising cadmium telluride and a second target comprising manganese telluride.

6. The method of claim 3 , wherein the substrate further comprises glass.

7. A method for forming cadmium-manganese-telluride (CMT), the method comprising:

positioning a substrate in a processing chamber of a physical vapor deposition (PVD) tool, wherein the PVD tool further comprises a first target, a second target, and a third target in the processing chamber, wherein the first target includes material comprising cadmium telluride, the second target includes material comprising manganese telluride, and the third target includes a cation-rich material comprising cadmium, manganese, or a combination thereof; and

causing said material to be ejected from the first target, the second target, and the third target, the material forming a cation-rich CMT above the substrate.

8. The method of claim 7 , wherein the substrate comprises a zinc blend crystal structure.

9. The method of claim 8 , wherein the substrate comprises cadmium telluride.

10. The method of claim 9 , wherein the third target is made of cadmium or manganese.

11. The method of claim 10 , wherein during the causing of the material to be ejected from the at least one target, a processing temperature within the processing chamber is between about 25° C. and about 600° C.

12. The method of claim 10 , further comprising introducing dimethyl cadmium gas into the processing chamber before the causing of the material to be ejected from the first target, the second target, and the third target.

13. A method for forming cadmium-manganese-telluride (CMT), the method comprising:

forming a first monolayer above a substrate, wherein the first monolayer comprises CMT, and wherein the substrate comprises cadmium telluride in a zinc blend crystal structure;

forming a second monolayer above the first monolayer, wherein the second monolayer comprises a cation-rich material comprising cadmium or manganese; and

forming a third monolayer above the second monolayer, wherein the third monolayer comprises CMT; and

further comprising forming a layer of CMT above the substrate before the forming of the first monolayer, wherein the forming of the layer of CMT above the substrate is performed using physical vapor deposition (PVD).

14. The method of claim 13 , wherein the substrate further comprises glass.

Assignments (7)
RELEASE OF SECURITY INTEREST Recorded Feb 13, 2026
From: JPMORGAN CHASE BANK, N.A.
To: FIRST SOLAR, INC.
Reel/Frame 074858/0364 →
SECURITY INTEREST Recorded Jul 10, 2023
From: FIRST SOLAR, INC.
To: JPMORGAN CHASE BANK, N.A., AS ADMINISTRATIVE AGENT
Reel/Frame 064237/0462 →
TERMINATION AND RELEASE OF SECURITY INTEREST IN PATENT RIGHTS Recorded Nov 15, 2021
From: JPMORGAN CHASE BANK, N.A.
To: FIRST SOLAR, INC.
Reel/Frame 058132/0566 →
PATENT SECURITY AGREEMENT Recorded Jul 12, 2017
From: FIRST SOLAR, INC.
To: JPMORGAN CHASE BANK, N.A., AS ADMINISTRATIVE AGENT
Reel/Frame 043177/0581 →
ASSIGNMENT OF ASSIGNOR'S INTEREST Recorded Mar 10, 2016
From: INTERMOLECULAR, INC.
To: FIRST SOLAR, INC.
Reel/Frame 037943/0581 →
ASSIGNMENT OF ASSIGNOR'S INTEREST Recorded Jun 30, 2014
From: BAYATI, AMIR
To: INTERMOLECULAR, INC.
Reel/Frame 033258/0448 →
ASSIGNMENT OF ASSIGNOR'S INTEREST Recorded May 15, 2014
From: BARABASH, SERGEY; PRAMANIK, DIPANKAR; SUN, ZHI-WEN
To: INTERMOLECULAR, INC.
Reel/Frame 032907/0051 →