IP Library Granted Patent US 9,058,981
Granted Patent B2
US 9,058,981 · App. 14/142,035 · Granted Jun 16, 2015

Dielectric composition for thin-film transistors

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Quick Facts
Patent No.
US 9,058,981
App. No.
14/142,035
Granted
Jun 16, 2015
Kind
B2
Abstract

An electronic device, such as a thin-film transistor, includes a substrate and a dielectric layer formed from a dielectric composition. The dielectric composition includes a dielectric material, a crosslinking agent, and a thermal acid generator. In particular embodiments, the dielectric material comprises a lower-k dielectric material and a higher-k dielectric material. When deposited, the lower-k dielectric material and the higher-k dielectric material form separate phases. The thermal acid generator allows the dielectric layer to be cured at relatively lower temperatures and/or shorter time periods, permitting the selection of lower-cost substrate materials that would otherwise be deformed by the curing of the dielectric layer.

Claims (20)

1. A dielectric composition comprising a dielectric material, a thermal acid generator, an optional crosslinking agent, and an optional solvent;

wherein the dielectric material comprises a lower-k dielectric material and a higher-k dielectric material;

wherein both the lower-k dielectric material and the higher-k dielectric material are miscible in the solvent; and

wherein the lower-k dielectric material is a polyacrylate comprising a silane group, a polyvinyl comprising a silane group, a polyimide comprising a silane group, a polyester comprising a silane group, a polyether comprising a silane group, a polyketone comprising a silane group, or a polysulfone comprising a silane group.

2. The dielectric composition of claim 1 , wherein the dielectric material is an acid-sensitive dielectric material.

3. The dielectric composition of claim 1 , wherein the dielectric composition has a shelf-life greater than 1 month at room temperature.

4. The dielectric composition of claim 1 , wherein the lower-k dielectric material has a dielectric constant of less than 4.0.

5. The dielectric composition of claim 1 , wherein the higher-k dielectric material has a dielectric constant of 4.0 or higher.

6. The dielectric composition of claim 1 ,

wherein the higher-k dielectric material is selected from the group consisting of a polyimide, a polyester, a polyether, a polyacrylate, a polyvinyl, a polyketone, a polysulfone, a molecular glass compound, and combinations thereof.

7. The dielectric composition of claim 1 , wherein the thermal acid generator is a hydrocarbylsulfonic acid blocked or neutralized with amine.

8. The dielectric composition of 1 , wherein the thermal acid generator is a polymeric blocked sulfonic acid ester, an amine neutralized substituted naphthalenesulfonic acid, an amine neutralized substituted benzenesulfonic acid, or an amine neutralized acid phosphate.

9. The dielectric composition of claim 1 , wherein the thermal acid generator is present in the amount of from about 0.001 to about 3 wt % of the dielectric composition.

10. A dielectric composition comprising an acid-sensitive dielectric material, a thermal acid generator, and an optional solvent;

wherein the dielectric material comprises a lower-k dielectric material and a higher-k dielectric material;

wherein both the lower-k dielectric material and the higher-k dielectric material are miscible in the solvent; and

wherein the lower-k dielectric material is a polyacrylate comprising a silane group, a polyvinyl comprising a silane group, a polyimide comprising a silane group, a polyester comprising a silane group, a polyether comprising a silane group, a polyketone comprising a silane group, or a polysulfone comprising a silane group.

11. An electronic device comprising a dielectric layer; wherein the dielectric layer is generated from a composition comprising the dielectric composition of claim 1 .

12. The dielectric composition of claim 1 , wherein the lower-k dielectric material is selected from the group consisting of

wherein x and y are molar fractions.

Assignments (9)
ASSIGNMENT OF ASSIGNOR'S INTEREST Recorded Nov 6, 2025
From: XEROX CORPORATION
To: GENESEE VALLEY INNOVATIONS, LLC
Reel/Frame 073842/0479 →
SECOND LIEN NOTES PATENT SECURITY AGREEMENT Recorded Jul 2, 2025
From: XEROX CORPORATION
To: U.S. BANK TRUST COMPANY, NATIONAL ASSOCIATION, AS COLLATERAL AGENT
Reel/Frame 071785/0550 →
FIRST LIEN NOTES PATENT SECURITY AGREEMENT Recorded Apr 11, 2025
From: XEROX CORPORATION
To: U.S. BANK TRUST COMPANY, NATIONAL ASSOCIATION, AS COLLATERAL AGENT
Reel/Frame 070824/0001 →
SECURITY INTEREST Recorded Feb 13, 2024
From: XEROX CORPORATION
To: CITIBANK, N.A., AS COLLATERAL AGENT
Reel/Frame 066741/0001 →
TERMINATION AND RELEASE OF SECURITY INTEREST IN PATENTS RECORDED AT RF 064760/0389 Recorded Feb 13, 2024
From: CITIBANK, N.A., AS COLLATERAL AGENT
To: XEROX CORPORATION
Reel/Frame 068261/0001 →
SECURITY INTEREST Recorded Nov 20, 2023
From: XEROX CORPORATION
To: JEFFERIES FINANCE LLC, AS COLLATERAL AGENT
Reel/Frame 065628/0019 →
SECURITY INTEREST Recorded Jun 22, 2023
From: XEROX CORPORATION
To: CITIBANK, N.A., AS COLLATERAL AGENT
Reel/Frame 064760/0389 →
RELEASE OF SECURITY INTEREST IN PATENTS AT R/F 062740/0214 Recorded May 18, 2023
From: CITIBANK, N.A., AS AGENT
To: XEROX CORPORATION
Reel/Frame 063694/0122 →
SECURITY INTEREST Recorded Nov 10, 2022
From: XEROX CORPORATION
To: CITIBANK, N.A., AS AGENT
Reel/Frame 062740/0214 →