ESD protection scheme for designs with positive, negative, and ground rails
View Patent ↗Apparatuses and systems for dissipating ESD events are provided. In an embodiment, an integrated circuit (IC) device, includes a ground rail, a positive supply rail, a negative supply rail, a circuit block, a plurality of contact pads, the circuit block being configured to output an output voltage via a first contact pad of the plurality of contact pads and a range of the output voltage being is between a voltage of the positive supply rail and a voltage of the negative supply rail, and a coupling system that couples the first contact pad to a second contact pad of the plurality of contact pads so as to dissipate an electrostatic discharge (ESD) event between the first and second contact pads.
1. An integrated circuit (IC) device, comprising:
a ground rail;
a positive supply rail;
a negative supply rail;
a circuit block;
a plurality of contact pads, wherein the circuit block is configured to output an output voltage via a first contact pad of the plurality of contact pads and wherein a range of the output voltage is between a voltage of the positive supply rail and a voltage of the negative supply rail; and
a coupling system that couples the first contact pad to a second contact pad of the plurality of contact pads so as to dissipate an electrostatic discharge (ESD) event between the first and second contact pads.
2. The IC device of claim 1 , wherein the coupling system comprises at least one of a diode or a clamp.
3. The IC device of claim 2 , wherein the clamp is a stacked clamp.
4. The IC device of claim 2 , wherein the clamp comprises a nmos transistor.
5. The IC device of claim 4 , wherein the nmos transistor is formed in an isolated p-well.
6. The IC device of claim 5 , wherein the clamp further comprises an inverter, and herein a gate of the nmos transistor is coupled to an output of the inverter.
7. The IC device of claim 1 , wherein the ground rail, the positive supply rail, the negative supply rail, and the circuit block are part of a first segment of the IC device, and wherein the IC device further comprises a second segment, the second segment comprising:
a second ground rail;
a second positive supply rail; and
a second circuit block;
wherein each of the second ground rail, second positive supply rail, and the second circuit block are coupled to a respective contact pad of the plurality of contact pads.
8. The IC device of claim 7 , further comprising: a third ground rail, wherein the third ground rail couples the first ground rail to the second ground rail.
9. The IC device of claim 1 , wherein the coupling system comprises:
a first cell that couples the positive supply rail and the ground rail;
a second cell that couples the negative supply rail and the ground rail;
a third cell that couples the negative supply rail and the positive supply rail; and
a fourth cell that couples the positive supply rail, the ground rail, and the negative supply rail.
10. The IC device of claim 9 , wherein at least one of the first, second, third, and fourth cells includes at least one of a diode or a clamp.
11. The IC device of claim 1 , wherein the circuit block is an input/output circuit block.
12. The IC device of claim 1 , wherein each of the ground rail, the positive supply rail, and the negative supply rail is coupled to a respective contact pad of the plurality of contact pads.
13. The IC device of claim 1 , wherein the coupling system is configured to electrically couple each contact pad of the plurality of contact pads to all other contact pads of the plurality of contact pads.
14. An integrated circuit (IC) device, comprising:
a ground rail;
a positive supply rail;
a negative supply rail;
a circuit block;
a plurality of contact pads, wherein the circuit block is configured to output an output voltage via a first contact pad of the plurality of contact pads and wherein a range of the output voltage is between a voltage of the positive supply rail and a voltage of the negative supply rail; and
means for coupling the first contact pad to a second contact pad of the plurality of contact pads to dissipate an electrostatic discharge (ESD) event between the first and second contact pads.
15. The IC device of claim 14 , wherein the ground rail, the positive supply rail, the negative supply rail, and the circuit block are part of a first segment of the IC device, and wherein the IC device further comprises a second segment, the second segment comprising:
a second ground rail;
a second positive supply rail; and
a second circuit block;
wherein each of the second ground rail, second positive supply rail, and the second circuit block are coupled to a. respective contact pad of the plurality of contact pads.
16. The IC device of claim 15 , further comprising: a third ground rail, wherein the third ground rail couples the first ground rail to the second ground rail.
17. The IC device of claim 14 , wherein each of the ground rail, the positive supply rail, and the negative supply rail is coupled to a respective contact pad of the plurality of contact pads.
18. The IC device of claim 14 , wherein the means for coupling electrically couples each contact pad of the plurality of contact pads to all other contact pads of the plurality of contact pads.
19. The IC device of claim 14 , wherein the means for coupling provides multiple conduction paths between the first and second contact pads.
20. An integrated circuit (IC) device, comprising:
a ground rail;
a positive supply rail;
a negative supply rail;
a circuit block;
a plurality of contact pads, wherein the circuit block is configured to output an output voltage via a first contact pad of the plurality of contact pads; and
a coupling system that couples the first contact pad to a second contact pad of the plurality of contact pads to dissipate an electrostatic discharge (ESD) event between the first and second contact pads, the coupling system including:
a first cell that couples the positive supply rail and the ground rail;
a second cell that couples the negative supply rail and the ground rail; and
a third cell that couples the negative supply rail and the positive supply rail.