IP Library Granted Patent US 9,082,854
Granted Patent B2
US 9,082,854 · App. 14/154,776 · Granted Jul 14, 2015

Electrooptic device substrate for shielding light from switching element, electrooptic device, and electronic apparatus

Inventors: Satoshi Ito (Eniwa, JP); Hiroyuki Oikawa (Chitose, JP)
Assignee: Seiko Epson Corporation
H01L29/78633H01L27/124H01L27/1218G02F1/136
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Quick Facts
Patent No.
US 9,082,854
App. No.
14/154,776
Granted
Jul 14, 2015
Kind
B2
Abstract

An electrooptic device substrate includes a scan line that is provided on an element substrate, a foundation insulating layer, a semiconductor layer provided on the foundation insulating layer, a gate insulating layer, recesses that are provided at both sides of the semiconductor layer so as to penetrate through the foundation insulating layer and the gate insulating layer, a gate electrode that is provided on the gate insulating layer and is electrically connected to the scan line in the recesses, an insulating interlayer that covers the gate insulating layer, the gate electrode, and the recesses, and a data line that is provided on the insulating interlayer so as to overlap with the scan line, the semiconductor layer, the gate electrode, and the recesses. The recesses include first recesses that overlap with the scan line and second recesses that extend to outer sides of the scan line.

Claims (27)

1. An electrooptic device substrate comprising:

a substrate;

a switching element having a semiconductor layer and a gate electrode;

a scan line that extends in a first direction, the scan line shielding a light;

a first insulating layer that covers the substrate and the scan line, the semiconductor layer covering the first insulating layer and the scan line in a plan view;

a second insulating layer that covers the first insulating layer and the semiconductor layer;

a first recess that is disposed at one side of the semiconductor layer in the plan view;

a second recess that is disposed at another side of the semiconductor layer in the plan view, the first recess and the second recess penetrating through the first insulating layer, the second insulating layer, and a portion of the substrate, the first recess, the semiconductor layer, and the second recess being arranged in a second direction intersecting with the first direction in the plan view, the gate electrode covering the second insulating layer, the scan line, and a channel region of the semiconductor layer in the plan view, the gate electrode being electrically connected to the scan line via the first recess and the second recess;

a third insulating layer that covers the second insulating layer, the gate electrode, the first recess, and the second recess; and

a data line that covers the third insulating layer so as to extend in the second direction, the data line overlapping with the scan line, the semiconductor layer, the gate electrode, the first recess and the second recess in the plan view, the data line shielding a light,

wherein the first recess includes a first part that overlaps with the scan line in the plan view and a second part that is disposed at a first side of the first part, the first side being an opposite side of a semiconductor layer side of the first part, and

wherein the second recess includes a third part that overlaps with the scan line in the plan view and a fourth part that is disposed at a second side of the third part, the second side being an opposite side of a semiconductor layer side of the third part.

2. The electrooptic device substrate according to claim 1 , wherein

the second part and the fourth part extend along to the second direction in the plan view.

3. The electrooptic device substrate according to claim 2 , wherein

the second part and the fourth part penetrate to the substrate, and

the gate electrode covers the scan line in the first part and the third part, and the gate electrode covers a side surface of the scan line in the second part and the fourth part.

4. The electrooptic device substrate according to claim 3 , wherein

the data line covers the side surface of the scan line in the second part and the fourth part.

5. An electrooptic device comprising: the electrooptic device substrate according to claim 1 .

6. An electrooptic device comprising: the electrooptic device substrate according to claim 2 .

7. An electrooptic device comprising: the electrooptic device substrate according to claim 3 .

8. An electrooptic device comprising: the electrooptic device substrate according to claim 4 .

9. An electronic apparatus comprising a projector, a head up display, or a head mount display that includes the electrooptic device according to claim 5 .

10. An electronic apparatus comprising a projector, a head up display, or a head mount display that includes the electrooptic device according to claim 6 .

11. An electronic apparatus comprising a projector, a head up display, or a head mount display that includes the electrooptic device according to claim 7 .

12. An electronic apparatus comprising a projector, a head up display, or a head mount display that includes the electrooptic device according to claim 8 .

Assignments (2)
ASSIGNMENT OF ASSIGNOR'S INTEREST Recorded Aug 28, 2019
From: SEIKO EPSON CORPORATION
To: 138 EAST LCD ADVANCEMENTS LIMITED
Reel/Frame 050197/0212 →
ASSIGNMENT OF ASSIGNOR'S INTEREST Recorded Jan 14, 2014
From: ITO, SATOSHI; OIKAWA, HIROYUKI
To: SEIKO EPSON CORPORATION
Reel/Frame 031964/0765 →
Priority Claims (1)
JP 2013-006992 · Jan 18, 2013 · national
Continuity (1)
Related Publication 20140203285A1 · Jul 24, 2014