Measuring system

1. A measuring system comprising:

a magnetic field sensor array that has a first magnetic field sensor integrated into a semiconductor chip for measuring a first component of a magnetic field vector in a first spatial direction, a second magnetic field sensor integrated into a semiconductor chip for measuring a second component of the magnetic field vector in a second spatial direction, and a third magnetic field sensor integrated into a semiconductor chip for measuring a third component of the magnetic field vector in a third spatial direction, wherein the first spatial direction, the second spatial direction and the third spatial direction are orthogonal to one another;

an encoder adapted to change the magnetic field vector in the first spatial direction and in the second spatial direction and in the third spatial direction as a function of a rotatory and/or translational movement, wherein the change of the magnetic field vector in all three spatial directions, caused by the movement of the encoder, traces a closed and non-intersecting path through space; and

an evaluation circuit connected to which the first magnetic field sensor, the second magnetic field sensor and the third magnetic field sensor, the evaluation circuit determining a three-dimensional position of the encoder based on a first measurement signal of the first magnetic field sensor and a second measurement signal of the second magnetic field sensor and a third measurement signal of the third magnetic field sensor.

2. The measuring system according to claim 1 , wherein at least one section of the path traced by the magnetic field vector is helical.

3. The measuring system according to claim 1 , wherein the encoder is adapted to modulate a length of the magnetic field vector as a function of the rotatory and/or translational movement.

4. The measuring system according to claim 1 , wherein the path traced by the magnetic field vector has at least two helical sections lying one inside the other.

5. The measuring system according to claim 1 , wherein the encoder is adapted to modulate a pitch of a helical shape of the path of the magnetic field vector as a function of the rotatory and/or translational movement.

6. The measuring system according to claim 1 , wherein the encoder modulate through the rotatory and/or translational movement, a first oscillation of the first component of the magnetic field vector with a first frequency and a second oscillation of the second component of the magnetic field vector with a second frequency, and wherein the first frequency and the second frequency are different.

7. The measuring system according to claim 1 , wherein the encoder has a plurality of magnets or a plurality of coils to generate the magnetic field vector.

8. The measuring system according to claim 1 , wherein the magnetic field sensor array has a plurality of magnets or a plurality of coils to detect the magnetic field vector.

9. The measuring system according to claim 1 , wherein the path traced by the magnetic field vector is confined to a cylindrical segment centered on the magnetic field sensor array.

10. The measuring system according to claim 1 , wherein the evaluation circuit calculates an intermediate variable for a path direction based on an absolute value of the first component of the magnetic field vector, an absolute value of the third component of the magnetic field vector, and the second component of the magnetic field vector.

11. The measuring system according to claim 1 , wherein the first spatial component measurement, the second spatial component measurement, and the third spatial component measurement are continuously measured by the magnetic field sensor array.

12. The measuring system according to claim 1 , wherein the first spatial component measurement, the second spatial component measurement, and the third spatial component measurement are simultaneously measured.

13. A measuring system comprising:

a magnetic field sensor array that has a first magnetic field sensor integrated into a semiconductor chip for measuring a first component of a magnetic field vector in a first spatial direction, a second magnetic field sensor integrated into a semiconductor chip for measuring a second component of the magnetic field vector in a second spatial direction, and a third magnetic field sensor integrated into a semiconductor chip for measuring a third component of the magnetic field vector in a third spatial direction, wherein the first spatial direction, the second spatial direction and the third spatial direction are orthogonal to one another;

an encoder adapted to change the magnetic field vector in the first spatial direction and in the second spatial direction and in the third spatial direction as a function of a rotatory and/or translational movement, wherein the change of the magnetic field vector in all three spatial directions, caused by the movement of the encoder, traces a closed and non-intersecting path through space; and

an evaluation circuit connected to the first magnetic field sensor and the second magnetic field sensor and the third magnetic field sensor, the evaluation circuit determining a three-dimensional position of the encoder based on a first spatial component measurement from the first magnetic field sensor and a second spatial component measurement from the second magnetic field sensor and a third spatial component measurement from the third magnetic field sensor.