IP Library Granted Patent US 9,006,734
Granted Patent B2
US 9,006,734 · App. 14/154,966 · Granted Apr 14, 2015

Thin film transistor, method of manufacturing the same, and display unit

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Quick Facts
Patent No.
US 9,006,734
App. No.
14/154,966
Granted
Apr 14, 2015
Kind
B2
Abstract

A thin film transistor is provided. The thin film transistor includes a gate electrode, a gate insulating film, and an oxide semiconductor film, wherein at least a portion of the gate electrode includes a metal oxide. An electric device and a display device that include the thin film transistor are also provided in addition to a manufacture method.

Claims (37)

1. A thin film transistor comprising:

a gate electrode including a metal layer and an interface layer;

a gate insulating film; and

an oxide semiconductor film,

wherein the interface layer includes a metal oxide and is positioned between the gate insulating film and the metal layer.

2. The thin film transistor of claim 1 , wherein the metal layer includes a metal substance or alloy thereof selected from the group consisting of platinum, titanium, ruthenium, molybdenum, copper, tungsten, and nickel.

3. The thin film transistor of claim 1 , wherein the metal oxide contains at least one metal component selected from the group consisting of platinum, titanium, ruthenium, molybdenum, copper, tungsten, and nickel.

4. The thin film transistor of claim 1 , wherein the gate insulating film includes a low reducing material.

5. The thin film transistor of claim 4 , wherein the low reducing material is selected from the group consisting of a silicon oxide film, a silicon nitride film, an aluminum oxide film, an aluminum nitride film, and combinations thereof.

6. The thin film transistor of claim 1 , wherein the thin film transistor is configured as a top gate structure or a bottom gate structure.

7. A light emitting device comprising:

a thin film transistor including

a gate electrode including a metal layer and an interface layer,

a gate insulating film, and

an oxide semiconductor film, and

an electroluminescence device,

wherein the interface layer includes a metal oxide and is positioned between the gate insulating film and the metal layer.

8. The light emitting device of claim 7 , wherein the metal layer includes a metal substance or alloy thereof selected from the group consisting of platinum, titanium, ruthenium, molybdenum, copper, tungsten, and nickel.

9. The light emitting device of claim 7 , wherein the metal oxide contains at least one metal component selected from the group consisting of platinum, titanium, ruthenium, molybdenum, copper, tungsten, and nickel.

10. The light emitting device of claim 7 , wherein the gate insulating film includes a low reducing material.

11. The light emitting device of claim 10 , wherein the low reducing material is selected from the group consisting of a silicon oxide film, a silicon nitride film, an aluminum oxide film, an aluminum nitride film, and combinations thereof.

12. The light emitting device of claim 7 , wherein the thin film transistor is configured as a top gate structure or a bottom gate structure.

13. The light emitting device of claim 7 , wherein the electro-luminescence device is selected from the group consisting of an inorganic electroluminescence device, an organic electroluminescence device, and a liquid crystal device.

14. A display device comprising:

a thin film transistor including

a gate electrode including a metal layer and an interface layer,

a gate insulating film, and

an oxide semiconductor film; and

an electroluminescence device,

wherein the interface layer includes a metal oxide and is positioned between the gate insulating film and the metal layer.

15. The display device of claim 14 , wherein the metal layer includes a metal substance or alloy thereof selected from the group consisting of platinum, titanium, ruthenium, molybdenum, copper, tungsten, and nickel.

16. The display device of claim 14 , wherein the metal oxide contains at least one metal component selected from the group consisting of platinum, titanium, ruthenium, molybdenum, copper, tungsten, and nickel.

17. The display device of claim 14 , wherein the gate insulating film includes a low reducing material.

18. The display device of claim 17 , wherein the low reducing material is a silicon oxide film.

19. The display device of claim 14 , wherein the thin film transistor is configured as a top gate structure or a bottom gate structure.

20. The display device of claim 14 , wherein the electro-luminescence device is selected from the group consisting of an inorganic electroluminescence device, an organic electroluminescence device, and a liquid crystal device.

21. The display device of claim 14 , wherein the electro-luminescence device includes a plurality of pixels.

Assignments (7)
ASSIGNMENT OF ASSIGNOR'S INTEREST Recorded Jul 18, 2025
From: JDI DESIGN AND DEVELOPMENT G.K.
To: MAGNOLIA BLUE CORPORATION
Reel/Frame 072039/0656 →
ASSIGNMENT OF ASSIGNOR'S INTEREST Recorded Jan 31, 2024
From: JOLED, INC.
To: JDI DESIGN AND DEVELOPMENT G.K.
Reel/Frame 066382/0619 →
CORRECTION BY AFFIDAVIT FILED AGAINST REEL/FRAME 063396/0671 Recorded Jun 12, 2023
From: JOLED, INC.
To: JOLED, INC.
Reel/Frame 064067/0723 →
SECURITY INTEREST Recorded Apr 20, 2023
From: JOLED, INC.
To: INCJ, LTD.
Reel/Frame 063396/0671 →
CORRECTIVE ASSIGNMENT TO CORRECT THE RECEIVING PARTY DATA PREVIOUSLY RECORDED AT REEL: 035616 FRAME: 0124. ASSIGNOR(S) HEREBY CONFIRMS THE ASSIGNMENT. Recorded May 26, 2015
From: SONY CORPORATION
To: JOLED INC.
Reel/Frame 035771/0551 →
ASSIGNMENT OF ASSIGNOR'S INTEREST Recorded May 12, 2015
From: SONY CORPORATION
To: JOLED INC
Reel/Frame 035616/0124 →
ASSIGNMENT OF ASSIGNOR'S INTEREST Recorded Feb 5, 2014
From: TERAI, YASUHIRO; FUKUMOTO, ERI; ARAI, TOSHIAKI; MOROSAWA, NARIHIRO
To: SONY CORPORATION
Reel/Frame 032147/0156 →