IP Library Patent Application 14156848
Patent Application
App. No. 14/156,848

SUBSTRATE CLEANING AND DRYING METHOD AND SUBSTRATE DEVELOPING METHOD

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Quick Facts
Patent No.
US None
App. No.
14/156,848
Abstract

Provided is a substrate cleaning and drying method, including a cleaning step of cleaning a developed substrate by supplying a cleaning liquid to the substrate; a puddle-forming step of forming a puddle of the cleaning liquid on the substrate; a film-thinning step of thinning a film thickness of the cleaning liquid on the substrate; and a drying step of drying the substrate by spinning the substrate and generating outward airflow and inward airflow between the outward airflow and the substrate, the outward airflow covering a portion above the substrate and the inward airflow causing removal of the cleaning liquid on the substrate.

Claims (36)

1 . A substrate cleaning and drying method comprising:

a cleaning step of cleaning a developed substrate by supplying a cleaning liquid to the substrate;

a puddle-forming step of forming a puddle of the cleaning liquid on the substrate;

a film-thinning step of thinning a film thickness of the cleaning liquid on the substrate; and

a drying step of drying the substrate by spinning the substrate and generating outward airflow and inward airflow between the outward airflow and the substrate, the outward airflow covering a portion above the substrate and the inward airflow causing removal of the cleaning liquid on the substrate.

2 . The substrate cleaning and drying method according to claim 1 , wherein

the inward airflow runs to a top face of the substrate, and

the outward airflow runs in the portion above the substrate in a substantially horizontal direction.

3 . The substrate cleaning and drying method according to claim 2 , wherein

the inward airflow impinges on the top face of the substrate to spread circumferentially, and

the outward airflow causes a reduced level of the inward airflow spreading circumferentially.

4 . The substrate cleaning and drying method according to claim 1 , wherein

the outward airflow runs from the center toward a periphery edge of the substrate in plan view, and

the inward airflow impinges on the center of the substrate to spread to the periphery edge of the substrate.

5 . The substrate cleaning and drying method according to claim 4 , wherein

the outward airflow is generated by ejecting gas from a portion above the center of the substrate in a substantially horizontal direction, and

the inward airflow is generated by ejecting gas downwardly from the portion above the center of the substrate in a substantially vertical direction.

6 . The substrate cleaning and drying method according to claim 1 , wherein

the outward airflow and the inward airflow is generated simultaneously through a single gas nozzle.

7 . The substrate cleaning and drying method according to claim 6 , wherein

the outward airflow is generated by ejecting gas circumferentially from a side face of the gas nozzle, and

the inward airflow is generated by ejecting gas downwardly from a lower surface of the gas nozzle.

8 . The substrate cleaning and drying method according to claim 6 , wherein

the gas nozzle is smaller than the substrate in plan view.

9 . The substrate cleaning and drying method according to claim 1 , wherein

in the drying step, the gas nozzle is moved from the portion above the center of the substrate in a substantially horizontal direction while generating the outward airflow and the inward airflow.

10 . The substrate cleaning and drying method according to claim 1 , wherein

no cleaning liquid is supplied to the substrate in the drying step.

11 . The substrate cleaning and drying method according to claim 1 , wherein

a periphery edge of the substrate is not dried prior to an inside of the periphery edge in the drying step with a spinning rate of the substrate being a given upper limit or less.

12 . A substrate developing method comprising:

a developing step of developing a substrate by supplying developer to the substrate:

a cleaning step of cleaning the substrate by supplying a cleaning liquid to the developed substrate;

a puddle-forming step of forming a puddle of the cleaning liquid on the substrate;

a film-thinning step of thinning a film thickness of the cleaning liquid on the substrate; and

a drying step of drying the substrate by spinning the substrate and generating outward airflow and inward airflow between the outward airflow and the substrate, the outward airflow covering a portion above the substrate and the inward airflow causing movement of the cleaning liquid on the substrate.

Assignments (2)
ASSIGNMENT OF ASSIGNOR'S INTEREST Recorded Sep 29, 2014
From: SOKUDO CO., LTD.
To: SCREEN SEMICONDUCTOR SOLUTIONS CO., LTD.
Reel/Frame 033845/0470 →
ASSIGNMENT OF ASSIGNOR'S INTEREST Recorded Jan 16, 2014
From: GOTO, TOMOHIRO; KASHIYAMA, MASAHITO; TAKAHASHI, YASUO; MORITA, AKIHIKO
To: SOKUDO CO., LTD.
Reel/Frame 031985/0533 →